受託分析｜ユーロフィンEAG
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受託分析｜ユーロフィンEAG Company Profile
Expert in material analysis | WE KNOW HOW to solve your scientific problems!
If you are having trouble with material analysis, please feel free to consult EAG! ● High-quality analysis ● Short delivery time ● Quick response Eurofins EAG (abbreviated as EAG) has been providing material analysis services for over 40 years in the semiconductor industry, high-purity metals, and advanced/nano materials fields. We respond to customer needs with our long-standing technical expertise and quick delivery in SIMS analysis (Secondary Ion Mass Spectrometry), which is essential for process development, research and development, and quality assurance of semiconductor devices and manufacturing equipment, as well as TEM/STEM analysis (Transmission Electron Microscopy) and GDMS analysis (Glow Discharge Mass Spectrometry) used for impurity analysis of high-purity materials.
Business Activities
■EAG Material Analysis Services Morphological Analysis ● Electron Microscopy Analysis: TEM/STEM, AC-STEM, EDS, EELS, Cryo-TEM, Cryo-FIB, FIB-SEM, Plasma-FIB, SEM-CL ● Identification of Emission Failure Locations: OBIRCH, Emission (EL), IR ● Non-destructive Analysis: XCT, C-SAM SIMS Analysis: SIMS, PCOR-SIMS Crystal Structure Analysis: TEM, XRD, Raman, PED, EBSD Surface Analysis: XPS/ESCA, AES, TOF-SIMS ● Thin Film Analysis: RBS/HFS, XRR, Ellipsometer ● Wafer Surface Contamination Analysis: TXRF, VPD-ICP-MS Impurity Analysis: GDMS, GD-OES, IGA, XRF, ICP-MS, ICP-MS/MS, ICP-OES, SIMS Organic Analysis: Nano-IR, TOF-SIMS, Raman, FT-IR Others: ● Sealing Package Analysis: IVA/HR-IVA (Analysis of Internal Moisture Content and Gas Components), Kr85 Leak Test Semiconductor ATE Testing, Electrical Characteristic Evaluation, Reliability Evaluation
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Detailed information
| Company name | 受託分析｜ユーロフィンEAG |
|---|---|
| Contact address | postalcode 101-0065 Tokyo/ Chiyoda-ku/ 3-8-1 Nishikanda, Chiyoda First Building East Wing, 12th FloorView on map TEL：03-4330-3709 |
| Industry | Testing, Analysis and Measurement |
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