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Atomic Force Microscope Product List and Ranking from 11 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

Atomic Force Microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. 日本カンタム・デザイン Tokyo//Testing, Analysis and Measurement
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. 日本レーザー Tokyo//Electronic Components and Semiconductors
  4. 4 パーク・システムズ・ジャパン Tokyo//Testing, Analysis and Measurement
  5. 4 オックスフォード・インストゥルメンツ Tokyo//Testing, Analysis and Measurement
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Atomic Force Microscope Product ranking

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. [Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist 日本カンタム・デザイン
  2. Atomic Force Microscope 'LiteScope 2.0' 東陽テクニカ 慶應義塾大学理工学部中央試験所・ 東陽テクニカ産学連携室 ナノイメージングセンター
  3. 200mm Large Sample Compatible AFM/SPM Jupiter XR オックスフォード・インストゥルメンツ
  4. Atomic force microscope 日本レーザー
  5. 4 Atomic Force Microscope "Park NX-Wafer" パーク・システムズ・ジャパン

Atomic Force Microscope Product List

31～38 item / All 38 items

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Atomic Force Microscope (AFM) "Park NX20"

Atomic Force Microscope (AFM) "Park NX20"

Fault analysis and nano-shape measurement tools for research and development in large samples.

The "Park NX20" is a large sample atomic force microscope (AFM) that artistically combines power, versatility, and ease of operation. This product is equipped with unique features to clarify the underlying causes of device failures and develop more creative solutions. Additionally, true non-contact (TM) mode scanning allows chips to be maintained sharper and longer, preventing unnecessary time and cost expenditures. [Solutions using large sample AFM in research and FA labs] ■ Surface roughness measurement for media and substrates ■ Defect inspection imaging and analysis ■ High-resolution electrical property measurement mode ■ Sidewall measurement in 3D structural analysis ■ Accurate AFM shape imaging with a low-noise Z detector *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX-Hivac"

Atomic Force Microscope (AFM) "Park NX-Hivac"

Vacuum environment scanning suitable for fault analysis applications.

The "Park NX-Hivac" is a high vacuum atomic force microscope (AFM) designed for failure analysis and materials that are susceptible to environmental influences. It enables precise failure analysis of highly doped semiconductors. Additionally, by utilizing our already recognized technology, it has achieved low noise measurements with high resolution, high reproducibility, and operability. 【High Vacuum Measurement for Failure Analysis】 - Advanced StepScan automatic mechanism and laser alignment mechanism for high-speed scanning - Multi-sample chuck - Park's unique easy chip exchange function - Large vacuum chamber (300mm×420mm×320mm) - Direct optical microscope that enables ultra-long distance observation - Enhanced sensitivity high vacuum SSRM mode *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX12-Bio"

Atomic Force Microscope (AFM) "Park NX12-Bio"

Powerful scanning probe microscope for life sciences

The "Park NX12-Bio" is an atomic force microscope (AFM) equipped with three types of high-performance nanoscale microscopes on a single innovative platform. It enables both innovative liquid imaging with scanning ion conductance microscopy (SICM) and the highly regarded atomic force microscopy (AFM) technology. 【Comprehensive Solution for Nanoscale Biological Research】 ■ Equipped with a fracture-type fully independent Z-axis scanner/XY scanner, featuring high-precision Park NX AFM with complete non-contact technology (TM) ■ Ultra-high-resolution optical imaging using inverted optical microscopy technology ■ Enhanced biological cell imaging through the integration of scanning ion conductance microscopy *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope "Park NX-HDM"

Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
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[New Release!] Atomic Force Microscope 'Park NX7'

[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

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Investigate the structures and dynamics of biomolecules that are difficult to measure experimentally through simulation.

Investigate the structures and dynamics of biomolecules that are difficult to measure experimentally through simulation.

Keywords: Molecular simulation, biomolecules, integrated modeling, free energy calculation.

Many life phenomena, including various diseases, are caused by biomolecules such as proteins, and observing molecular structures and dynamics in the microscopic realm is crucial for understanding these phenomena and for fundamental treatments of diseases. Molecular dynamics simulation is a technique that allows for the "direct" observation of microscopic behavior by reconstructing biomolecular models with atomic resolution in a computer and moving the molecules according to physical laws. Coupled with the computational power of computers, this technique has developed to the point where it is referred to as a computational microscope and is actively used as a method to complement experiments. However, there are two challenges to contributing to drug discovery and materials development: "too much computation time" and "limitations in model accuracy." To address the first challenge, we are working on introducing efficient algorithms to predict loop structures of next-generation antibodies in a shorter time. For the second challenge, we are developing methods that integrate experimental data and simulations using statistical mathematics and machine learning to achieve more accurate observations.

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[Research Material] Global Market for Surface Measurement Equipment & Tools

[Research Material] Global Market for Surface Measurement Equipment & Tools

World Market for Surface Measurement Instruments & Tools: Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, Light ...

This research report (Global Surface Measurement Equipment and Tools Market) investigates and analyzes the current state and outlook for the global market of surface measurement equipment and tools over the next five years. It includes information on the overview of the global surface measurement equipment and tools market, trends of major companies (sales, selling prices, market share), market size by segment, market size by major regions, and distribution channel analysis. The market segments by type include Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, and Optical Coordinate Measuring Machines, while the segments by application cover Optical, Automotive, Electrical & Electronics, and Others. The regional segments are divided into North America, the United States, Europe, Asia-Pacific, Japan, China, India, South Korea, Southeast Asia, South America, the Middle East, and Africa, to calculate the market size of surface measurement equipment and tools. The report also includes the market share of major companies in surface measurement equipment and tools, product and business overviews, and sales performance.

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