Electron microscope Product List and Ranking from 16 Manufacturers, Suppliers and Companies

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

ロンビック Mie//Resin/Plastic
一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
関西電力送配電技術試験センター Hyogo//Electricity, Gas and Water Industry
4 アイテス Shiga//Electronic Components and Semiconductors
5 アズサイエンス松本本社 Nagano//Trading company/Wholesale

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Electron microscope Product ranking

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Examples of observing plastics and resin materials using TEM and SEM. ロンビック
[Analysis Case] Morphological Observation and Component Analysis of Solid Polymer Fuel Cell Catalyst Materials 一般財団法人材料科学技術振興財団　MST
Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
4 [Introduction of Testing Equipment] Multi-Angle Lens VHX-D510 関西電力送配電技術試験センター
5 Crack observation using a tabletop SEM (scanning electron microscope). アイテス

Electron microscope Product List

16～30 item / All 45 items

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[Analysis Case] Evaluation of Ion Implantation Damage Layer in Gallium Oxide Ga2O3

Confirming the differences due to variations in annealing conditions after ion implantation.

Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a focus of attention as a material for power devices that can be expected to be high-efficiency and low-cost. Controlling impurity concentration and crystallinity, which influence the characteristics of the devices, is crucial for their development. This document presents the results of observations of the damage layer and changes in surface roughness caused by disturbances in the crystal structure due to ion implantation, under various annealing conditions. Measurement methods: TEM, AFM Product fields: Oxide semiconductors, power devices Analysis objectives: Shape evaluation, structural evaluation For more details, please download the document or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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Identification of resistance anomalies due to absorption current

You can identify high resistance and open areas in the wiring from the absorption current image.

- Possible to identify high resistance abnormal areas - The current flowing through the wiring is weak (pA) - Measurement is possible even with a surface protective film present - Measurement is possible even with multilayered wiring - Measurement is possible under conditions almost identical to SEM observation

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

High-resolution HAADF-STEM images reflect the atomic arrangement of crystals, and by simulating STEM images corresponding to various crystal orientations, they help in accurately understanding the relative orientations between crystal grains and the observed images in polycrystalline materials. This document presents a case where STEM images were simulated from the crystal orientation information obtained by the EBSD method for the crystal grains in a polycrystalline neodymium magnet, and compares them with actual high-resolution HAADF-STEM images.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD

We will introduce many examples of cross-sectional observation and structural analysis using TEM, FE-SEM, EBSD, etc., for metal microstructure observation and phase analysis!

This case study collection introduces examples related to "cross-sectional observation and structural analysis." It includes numerous analytical cases covering the objectives, methods, and results of "metallic structure observation of wire (spring material)," "phase analysis of duplex stainless steel," and "evaluation of semiconductor insulating films using STEM-EDS." Additionally, it presents observations, phase analyses, insulating film analyses, and measurements, among other topics. We encourage you to read it. [Contents] ■ Metallic structure observation of wire (spring material) ■ Phase analysis of duplex stainless steel ■ Evaluation of semiconductor insulating films using STEM-EDS ■ EBSD measurement of samarium cobalt magnets ■ Analysis of connector terminal contact defects using STEM ■ Cross-sectional observation of biological samples (Morpho butterfly scales) *For more details, please refer to the PDF document or feel free to contact us.

Company：セイコーフューチャークリエーション
Price：Other

Other analyses
Contract Analysis
Contract Analysis

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Examples of observing plastics and resin materials using TEM and SEM.

Introducing observations of CNF in PE and the higher-order structure of cell walls in PE foams, along with photos!

On our company website, we introduce examples of resin material observation using transmission electron microscopy (TEM) and scanning electron microscopy (SEM). In the TEM observation examples, we include observations of CNF in PE, the higher-order structure of cell walls in PE foams, and the lamellar structure near the surface of HDPE. Additionally, in the SEM observation examples, we present comparisons before and after weather resistance tests of ABS resin, as well as cross-sectional structural analysis of automotive bumper materials. Please take a look. [Content Included (Partial)] ■ TEM Observation Examples - Observation of CNF in PE - Higher-order structure of cell walls in PE foams - Observation of lamellar structure near the surface of HDPE - Morphology observation examples of HIPS/ABS systems - Morphology observation in PC/ABS system materials *For more details, please refer to the related links or feel free to contact us.

Company：ロンビック
Price：Other

Contract Analysis

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[Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins

Quantitative evaluation of fillers blended into resin is possible! Here is an example of understanding the dispersion state per volume of filler.

In the fields of automobiles and aircraft, lightweight organic/inorganic composite materials with strength and rigidity are widely used. The size and dispersion state of inorganic fillers contained in organic/inorganic composite materials significantly affect mechanical properties, making it necessary to understand the distribution and orientation of inorganic fillers. This document presents a case study where fillers within a resin were evaluated in three dimensions using FIB-SEM. [Case Summary] ■ Analysis Sample - Automotive resin containing inorganic fillers ■ Analysis Results - It was found that the resin contains approximately 10Vol% of fillers. *For more details, please refer to the PDF document or feel free to contact us.

Company：カネカテクノリサーチ本社、東京営業所、名古屋営業所、大阪分析センター、高砂分析センター
Price：Other

Contract Analysis

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Introduction to the Equipment of the Technology Development Office

We own microscopes and electron microscopes! We provide consistently stable quality plating using various analytical devices.

In our Technology Development Department, we analyze and manage the plating solutions from three factories using various analytical devices. By understanding the consumption of chemicals due to plating operations and controlling the supply amounts, we strive to consistently provide stable quality plating. Additionally, in 2015, we introduced a scanning electron microscope to conduct surface analysis and evaluation of plating films. By observing at the micron level, we clarify issues that are not noticeable to the naked eye, and we research plating conditions that match the surface state to our customers' needs. 【Equipment Owned (Partial)】 ■ Microscope ■ Electron Microscope, manufactured by JEOL: "SM-6010PLUS/LA" ■ Polishing Machine, manufactured by Sankeikaku: Automatic Polishing Machine "HA-FSA-83" ■ Cutting Machine, manufactured by Sankeikaku: Cutting Machine Alt Cut "CK260-90" ■ Manufactured by Shimadzu: Spectrophotometer "UVmini-1240" ■ Manufactured by Matsuzawa: Digital Microhardness Tester "SMT-3" *For more details, please refer to the PDF document or feel free to contact us.

Company：Ohmori Chrome CO., LTD
Price：Other

Plating Equipment
Contract manufacturing

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Technical Data: Electrode Deposits (Contacts)

Introducing a case study that investigated contact surfaces with poor conductivity through electron microscope observation!

Our company is engaged in the analysis solution business. This document presents cases where non-contact, non-destructive observation of contact surfaces that experienced poor conductivity was conducted using an electron microscope at magnifications of 40 to 250 times, allowing for the observation of contaminants on the contact surfaces. By identifying the contaminants through qualitative elemental analysis using fluorescent X-ray analysis and qualitative compound analysis using micro-infrared spectroscopy, we can clarify the adhesion mechanism of the identified contaminants to the contacts, enabling an investigation into the causes of poor conductivity. [Contents] ■ Overview ■ Features ■ Analysis Cases - Electron Microscope Observation - Fluorescent X-ray Analysis, Micro-infrared Spectroscopy *For more details, please refer to the PDF document or feel free to contact us.

Company：日鉄環境分析ソリューション事業部・営業部
Price：Other

Analytical Equipment and Devices
Other services

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Learning from Japan Electron Optics Laboratory, a long-established manufacturer of electron microscopes, about after-sales service reform.

Centralized management of basic information and related information for 40,000 parts using PIM/DAM, and renewal of the after-sales service system that serves as the front for customer service.

Revamping the after-sales service system, which serves as the front for customer service. We will introduce the case of Japan Electronics, which built a new system utilizing Contentserv's PIM (Product Information Management) / DAM (Digital Asset Management) and integrated it with existing ERP and e-commerce sites, thereby solving traditional challenges all at once. [Contents] - Revamping the after-sales service system, which serves as the front for customer service - Seeking PIM/DAM tools that are more user-friendly and accessible - Solving technical challenges together with EXA, who joined the project from the construction phase - Contributing to groundbreaking operational efficiency and improved customer satisfaction *For more details on the research report, please refer to "PDF Download."

Company：Contentserv
Price：Other

others

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In various fields such as the semiconductor industry, polymer material development and research, and quality control!

Introduction of recommended electron microscopes, photoelectron spectrometers, and internal oblique compound microscopes by Azusa Science.

We would like to introduce three recommended products from Azusa Science. ◆ JEOL Ltd. JEM-1400Flash Electron Microscope This transmission electron microscope features a high-sensitivity sCMOS camera, an ultra-wide field montage system, and an enhanced linking function between optical microscope images and electron microscope images. It is utilized across a wide range of fields, including biology, nanotechnology, polymers, and advanced materials. ◆ JEOL Ltd. JPS-9030 X-ray Photoelectron Spectroscopy (XPS) System Equipped with a Kaufman-type etching ion source and twin anodes as standard, this versatile XPS system also offers extensive expandability with high-temperature heating systems and gas cluster ion sources. It is widely used from universities to factories as a highly versatile analytical method in material research and development, as well as in quality control. ◆ Nikon Solutions Co., Ltd. Internal Oblique Stereo Microscope SMZ445/460 This stereo zoom microscope series from Nikon boasts excellent optical performance similar to that of their cutting-edge models. It is suitable for inspecting and observing resin molded products and metal processed parts. It meets the needs for component inspection and quality control.

Company：アズサイエンス松本本社
Price：Other

others

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Information on morphological observation and component analysis using an electron microscope.

It is capable of various analyses such as point analysis, line analysis, and mapping in the sample area, as well as multifunctional component analysis.

The Tokai Technical Center, a general incorporated foundation, offers "morphological observation and component analysis using an electron microscope." Observations can be made without the time-consuming and labor-intensive pre-treatment, resulting in reduced time until observation and easier evaluation of component analysis after observation. Additionally, simultaneous composition observation allows for understanding the distribution of different compositions while performing morphological observation. Distance measurement between two points of interest within the sample is also possible. 【Features】 - Observations can be made without the time-consuming and labor-intensive pre-treatment. - Simultaneous composition observation allows for understanding the distribution of different compositions. - Distance measurement between two points of interest within the sample is possible. - Point analysis, line analysis, and mapping within the sample area are also possible. *For more details, please refer to the PDF document or feel free to contact us.

Company：一般財団法人東海技術センター
Price：Other

Contract Analysis

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[Analysis/Test] Introducing a case of 50% reduction in outsourcing costs from existing manufacturers!

Specialized in contract analysis/testing! Introducing examples of electron microscope observation/component analysis and solution analysis (ICP-MC)! Leave the comparison and consideration of contract analysis/testing to us!

We would like to introduce a case where we proposed an evaluation and analysis manufacturer for outsourcing contracts. In the field of battery-related electron microscope observation/component analysis, our proposal resulted in a 40% reduction in outsourcing costs compared to existing manufacturers. Additionally, in the area of material-related solution analysis (ICP-MC), our proposal led to a 50% reduction in outsourcing costs compared to existing manufacturers. [Case Summary] ■ Battery-related electron microscope observation/component analysis: 40% reduction in outsourcing costs ■ Material-related solution analysis (ICP-MC): 50% reduction in outsourcing costs We are also capable of handling a wide range of analyses/tests beyond the above. For more details, please refer to the PDF document or feel free to contact us.

Company：LIBERO
Price：Other

Public Testing/Laboratory

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[Data] Case Study of Material System Analysis

It is possible to prepare sections ranging from 30nm to 5μm! This document introduces several case studies of material analysis!

This document is a collection of case studies summarizing material analysis conducted by Hanai Corporation's Electron Microscope Technology Research Institute. The "Ultra Microtome" is suitable for producing high-quality ultra-thin sections and cross-sections across a wide range of fields, including biological tissues, metal plating layers, inorganic deposition layers, and nanoparticles. Our company has started offering contract analysis services. We will conduct material analysis in collaboration with partner organizations. [Published Cases] - Structural analysis of liposomes - Structural analysis of HIPS - Structural analysis of lens cross-sections - Cross-sectional observation of candy bags - Morphological observation of metal particles using the dispersion method (metal microparticles/metal-supported carbon) *For more details, please refer to the PDF document or feel free to contact us.

Company：花市電子顕微鏡技術研究所
Price：Other

Contract Analysis
Electron microscope
Other microscopes

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[Case Analysis] Hepatocytes (Pig Liver)

Insert photo ×7,000 Analysis of the cell membrane (×100,000)! It can be seen that the cell membrane has a double structure approximately 7nm wide.

We would like to introduce a case study of the analysis of 'hepatocytes (pig liver)' conducted by our company. The liver has many functions, including lipid and protein synthesis, metabolism and removal of drugs, and energy storage, most of which are composed of hepatocytes. There are also other components such as bile canaliculi (BC) and blood vessels (HS), within which blood cells (EC, Kf) can be observed. The inserted photo shows an enlargement of the cell membranes of adjacent cells, revealing that each cell membrane has a double structure approximately 7nm wide. Additionally, hepatocytes possess typical organelles that are often referenced when explaining the structure and function of general cells. [Analysis Overview] ■ Analysis Subject: Hepatocytes (pig liver) ■ It is evident that each cell membrane has a double structure approximately 7nm wide. ■ Hepatocytes have typical organelles that are frequently cited when explaining the structure and function of general cells. *For more details, please refer to the PDF document or feel free to contact us.

Company：花市電子顕微鏡技術研究所
Price：Other

Contract Analysis

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Basic Analysis Methods for Things that are Similar Yet Different

Introducing the flow from optical microscope observation with a wide range of applications to SEM observation and EDX elemental analysis!

We will introduce the flow from basic and widely applicable optical microscope observation to SEM observation and EDX elemental analysis. Observation using an optical microscope is one of the fundamental observation techniques, allowing for quick examination of general shapes and other features. Its advantage lies in the ability to obtain color information, making it effective for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "observation using SEM" and "elemental analysis using EDX" with the help of photos and graphs. We encourage you to read it. [Contents] ■ Observation using an optical microscope ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.