サンケイエンジニアリング Product Lineup

Do you have any experience with these troubles on the high current inspection line? - The line keeps stopping without being able to identify the cause. - Various types of probes have been tried, but there is no improvement. - There are suspicions of overheating or poor contact, but it cannot be isolated. The trouble may actually be caused by "abnormal overheating at the contact points due to high current conduction." Furthermore, this abnormal overheating could be caused by multiple factors intricately intertwined, such as increased resistance at the contacts, the occurrence of tiny sparks, or exceeding specifications due to harsh operating environments. Therefore, we will take your actual measurement work and the probes that are currently problematic, conduct actual measurements and experiments on contact resistance and other factors using our in-house equipment, clarify the mechanism of abnormal occurrences, and select and propose the optimal contact probe that leads to trouble resolution based on objective evidence from actual measurement data. ★ Please feel free to consult us first through the inquiry form on our website or by phone.

The selection of high-current probes used for power device conduction tests needs to be done carefully. Incorrect selection can lead to abnormal heating or sparking, potentially resulting in significant losses such as damage to expensive devices or equipment failure. There are mainly two key points to consider when choosing the appropriate probe: 1. Compatibility of specifications: It is important to select a probe that has sufficient margin for the usable current in the limited space due to device miniaturization. 2. Contact resistance between the probe and the workpiece: Even slight contact resistance can cause measurement errors or abnormal heating, so it is crucial to choose a probe that can maintain stable contact with the workpiece. However, many customers are unsure about "what specific criteria to use for judgment." Therefore, Sankei Engineering offers a "Free Probe Selection Service." We will actually take your measurement workpiece, measure the contact resistance with our equipment, and based on the data obtained, we will select and propose the most suitable probe for your usage environment. Inquiries during the comparison and information-gathering stages are also welcome. Please feel free to consult us through the contact form on our website.

The selection of high-current probes used for battery charge and discharge testing must be done carefully. If the selection is incorrect, it can lead to abnormal heating or sparking, potentially causing workpiece welding or equipment failure. There are mainly two key points to consider when choosing the appropriate probe: 1. Specification compatibility: In charge and discharge cycle tests that involve long periods of continuous current flow, it is important to select a probe that has sufficient current capacity relative to the actual usage current value. 2. Contact resistance between the probe and the workpiece: Even slight contact resistance can cause contact heating during current flow, leading to workpiece welding, so it is crucial to choose a probe that can maintain stable contact with the workpiece. However, many customers struggle with "what specific criteria to use for judgment." Therefore, Sankei Engineering offers a **free probe selection service**. We will take your measurement workpiece and measure the contact resistance using our equipment. Based on the data obtained, we will select and propose the most suitable probe for your usage environment. Inquiries during the comparison and information-gathering stage are also welcome. Please feel free to consult us through the contact form on our website.

In power device conduction tests, do you have concerns such as, "The contact resistance varies, and the reliability of the data cannot be ensured" or "No improvement even after replacing the probes multiple times"? The causes of contact failure in conduction tests include a variety of factors, such as: - Mismatch between the probe tip shape and the work material - Wear of the probe tip - Adhesion of foreign substances - Deformation of the spring due to high temperatures leading to reduced load and identifying these issues is not easy. Especially in conduction tests that carry large currents, contact failures can lead to abnormal heating or sparking during conduction, potentially resulting in significant losses such as damage to expensive devices or equipment failures. Therefore, we collect your workpieces and the probes you are currently using and conduct experiments on contact resistance and other factors using our own equipment. We visualize the data to identify the root causes of contact failures. Based on this, we propose the optimal probe shape and load conditions tailored to your usage conditions and work characteristics, and we provide free support all the way to the selection that leads to actual improvements. Please feel free to consult us through the inquiry form.

Are you experiencing issues on your printed circuit board inspection line such as: "Measurement values are unstable due to poor contact," "Inspection fails on good boards, leading to increased rework," "Even after replacing the probes, poor contact occurs again shortly after"? The causes of poor contact in board inspection are varied and can include: - Adherence of solder flux - Mismatch between the probe tip and the board's shape and material - Wear of the probe tip and can be difficult to identify. Therefore, we will take your workpieces and the probes you are currently using, and conduct experiments on our own equipment to measure contact resistance and other factors. We will visualize the data to identify the root causes of poor contact. Based on this, we will propose the optimal probe shape and load conditions tailored to your usage conditions and workpiece characteristics, and we will support you free of charge all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.

In wire harness continuity testing, do you have concerns such as: "There are channels where contact is unstable due to terminal shape," "When I increased the probe load, it deformed the terminal," "Due to contact failure, good products are misjudged, increasing rework costs"? The causes of contact failure include: - Mismatch between terminal shape or material and the probe - Load settings that are too weak to avoid terminal deformation - Wear on the probe tip - Adhesion of foreign substances and various other factors, making it difficult to identify the specific cause. In particular, the shapes of wire harnesses are diverse, and selecting the appropriate probe for each is very challenging. Therefore, we collect your workpieces and the probes currently in use, and conduct experiments on contact resistance and other factors using our own equipment. We visualize "why contact failure occurs" with data and identify the root cause. Based on this, we propose the optimal probe shape and load conditions for your usage conditions and work characteristics, and we provide free support all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.

Are you troubled by issues such as: - "The resistance value is unstable, lacking reliability in the data" - "The probe cannot make proper contact, posing a risk of defective products being released" - "Repeated retries occur during the contact check stage"? The causes of poor contact with connectors include: - Insufficient probe load - Mismatch between connector shape and probe tip shape - Wear on the probe tip - Adhesion of foreign substances and various other factors, making it difficult to identify the specific cause. Especially in insulation resistance testing, if the probe does not make proper contact, there is a risk that genuine defective products may be misjudged as good products and released. Therefore, we will take your workpieces and the probes currently in use and conduct experiments on contact resistance and other factors using our own equipment. We will visualize the data to identify the root cause of "why contact failure occurs." Based on that, we will propose the optimal probe shape and load conditions tailored to your usage conditions and workpiece characteristics, and we will provide free support all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.

Do you have concerns such as, "The contact resistance is inconsistent, and I'm worried if charging and discharging are working," "The power supply is unstable, and the test stops midway," or "The workpiece and probe are sticking together and adhering"? Charging and discharging tests involve longer durations and higher currents than regular measurements, making it more likely for issues caused by heat generation to arise, such as: 【Problems due to heat generation across the entire line】 - Decreased load due to spring fatigue, etc. 【Problems due to heat generation at the contact points】 - Promotion of shape changes at the probe tip - Promotion of foreign object adhesion, etc. These issues can become more pronounced if the probe is not suitable for the workpiece shape or measurement conditions. Therefore, we will take your workpiece and the probes currently in use, and conduct experiments on contact resistance and other factors using our own equipment. We will visualize "why the measurements are not going well" with data and identify the root causes of measurement failures. Based on this, we will propose the optimal probe shape and load conditions suited to your usage conditions and workpiece characteristics, providing free support all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.

The selection of probes for high current applications must be done carefully. If the selection is incorrect, there is a risk of serious problems such as abnormal heating or sparks, which can lead to equipment failure. There are mainly two important points to consider when choosing the appropriate probe: 1. Compatibility of the operating current value and specifications: It is crucial to ensure that the probe's maximum operating current has sufficient margin compared to the actual operating current value. 2. Contact resistance between the probe and the workpiece: High contact resistance can lead to increased heating during current flow. Selecting a probe that can achieve stable low contact resistance contributes to ensuring safety and quality. However, there are many customers who say, "I don't know what specific criteria to use for judgment." Therefore, Sankei Engineering offers a **free probe selection service**. We will actually take your workpiece (product or part) and measure the contact resistance using our equipment. Based on the data obtained, we will propose the most suitable probe for your operating environment. Inquiries during the comparison and information-gathering stage are also welcome. Please feel free to consult us through the contact form on our website.

The selection of probes for charge and discharge testing of EV batteries and lithium-ion batteries must be done carefully. This is due to the risk of significant issues caused by heat generation in harsh environments where current is applied for longer periods than usual. There are three main important points to consider when choosing the appropriate probe: 1. Compatibility of operating current and specifications If there is not enough margin in the probe's allowable operating current, abnormal heat generation may occur during current flow. 2. Heat resistance of the probe Since heat generation due to prolonged current flow is unavoidable, selecting heat-resistant specifications may help reduce the deterioration (sagging) of the spring. 3. Contact resistance between the probe and the workpiece High contact resistance can cause heat generation at the contact point, potentially leading to deformation or welding of the probe tip. However, there are many customers who say, "I don't know how to specifically judge and choose." Therefore, Sankei Engineering offers a [Free Probe Selection Service]. We will take your workpiece and measure the contact resistance using our equipment, and based on that data, we will propose the most suitable probe for your operating environment. Inquiries during the information-gathering stage are also welcome. Please feel free to contact us through the inquiry form.

The selection of probes for insulation resistance testing must be done carefully. If the selection is incorrect, there is a risk of misclassifying defective products as good ones, leading to the worst-case scenario of "defective products entering the market." To prevent this situation, it is crucial to ensure reliable electrical contact between the workpiece and the probe. There are mainly two key points when selecting a probe that creates this situation: 1. Tip shape: A sharp (pointed) shape is recommended. It can penetrate through foreign substances such as oxide films or dirt on the workpiece surface, ensuring stable electrical contact. 2. Spring load: A relatively larger load is recommended. By applying high pressure, stable electrical contact with the workpiece can be achieved. However, many customers struggle with determining which probe will make stable contact with their workpieces. Therefore, Sankei Engineering offers a free probe selection service that leverages our expertise as a probe manufacturer. We will actually take your workpiece, measure the contact resistance value using our equipment, and based on that data, we will select and propose a probe that can ensure more reliable contact with your workpiece. Inquiries during the information-gathering stage are also welcome. Please feel free to consult us through the inquiry form.

The selection of contact probes for substrate inspection needs to be done carefully. Although it is referred to as for substrate inspection, there are various contact points such as through holes, leads, and bus bars. The optimal probe can vary greatly depending on the shape and material of these contact points. If the selection is incorrect, there is a risk of reduced inspection yield due to misjudgment caused by poor contact, or even damage to the substrate. There are mainly two key points for selecting the appropriate probe: 1. Tip shape: If it is not suitable for the shape or material of the contact point, there is a possibility of electrical contact failure or physical inability to make contact. 2. Spring load: If it is too weak, stable contact cannot be achieved, leading to misjudgment. Conversely, if it is too strong, there is a risk of damaging the substrate. However, there are many customers who are troubled by the question, "Which one is optimal for our measurement points?" Therefore, Sankei Engineering offers a free probe selection service that utilizes our expertise as a probe manufacturer. We take your workpieces and measure the contact resistance values using our own equipment. Based on that data, we select and propose the optimal probe. Inquiries during the information-gathering stage are also welcome. Please feel free to consult us through the inquiry form.