Testing, Analysis and Measurement

マーポス

EstablishmentJune 1970
addressTokyo/Ota-ku/5-34-1 Nambakome, Mapos Building
phone03-3772-7011
last updated：
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マーポス Product Lineup

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For the machine tool industry For the machine tool industry
Monitoring system for working machinery Monitoring system for working machinery
For the semiconductor industry For the semiconductor industry
For the processing industry For the processing industry
For the EV industry (electric drive units and battery components) For the EV industry (electric drive units and battery components)
For the forging, rolling, pressing, and die casting industries. For the forging, rolling, pressing, and die casting industries.
For the healthcare industry For the healthcare industry
Non-contact measuring device Non-contact measuring device
Manual gauge Manual gauge
Industrial Computer Software Industrial Computer Software
Measurement component Measurement component
Measuring bench and machine Measuring bench and machine
Non-destructive testing (NDT) using eddy currents Non-destructive testing (NDT) using eddy currents
Non-destructive

Non-destructive testing (NDT) using eddy currents

This is an introduction to non-destructive testing (NDT) using eddy currents.

New Universal Amplifier for Non-Destructive Testing E59N

The new E59N's high performance and compact size make it a very competitive product.

By using the appropriate frequency, it is possible to configure the suitable hardware and work. The multifunctional frequency testing and automatic acquisition function create a significantly new inspection tool, allowing material structure inspection to be conducted simultaneously at eight operational frequencies.

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Marpos screw inspection (non-contact method using eddy current probe)

The condition of the screw is checked against the entire profile of the screw hole.

Screw inspection can be performed on all workpieces using a probe with eddy currents. When the probe is inserted into the tapped hole, an electromagnetic field is generated that is proportional to the distance between the sensor and the surface of the tapped hole, and the measured analog signal can be viewed as a voltage.

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