雄山 List of Products and Services

This is an announcement from Yuzan Corporation regarding the "Compact A3 Prober." It is a simple A3-sized manual prober that accommodates chip-level to Φ50mm wafers. By closing the sliding case, it creates a simple shielded structure. Since the microscope and work position remain constant, the field of view does not change when opening and closing the case. It is ideal for evaluating the electrical characteristics of semiconductors.

• Circuit Board Inspection Equipment

"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.

• Insulation Tester

The compactly formed four-point probe system quickly and accurately measures the resistivity and sheet resistance of diverse electronic materials in the research and development, inspection processes, and manufacturing lines of semiconductor/liquid crystal substrates, solar cell cells, and conductive thin films using the four-probe method.

• Insulation Tester

The precision and special tweezers made in Switzerland that we handle are handmade products meticulously crafted from carefully selected materials. We offer a variety of shapes suited for different applications, including non-magnetic, corrosion-resistant, and rigid materials. The "Diamond Scriber" is suitable for wafer marking and scribing, and we have a wide range of products including replaceable tip types and pen types. 【Features】 ■ Made in Switzerland ■ Handmade with carefully selected materials ■ Abundant material options ■ Ideal for wafer marking and scribing ■ A variety of products including replaceable tip types and pen types *For more details, please refer to the PDF document or feel free to contact us.

• Other work tools

The "Orion3" is a test system that can simulate electrostatic discharge phenomena caused by device charging. It is equipped with humidity control functionality and can conduct ESD (CDM) tests compliant with various standards by exchanging the test head. It allows for easy creation of test patterns for any device, minimizing cycle time. 【Features】 ■ Test equipment with humidity control functionality ■ Conducts tests compliant with various standards by exchanging the test head ■ Easily creates test patterns for any device ■ Minimizes cycle time ■ The new feature CDM2 enables a new type of CDM testing that significantly improves the repeatability issues associated with the conventional air discharge method *For more details, please refer to the PDF materials or feel free to contact us.

• EMC/Static electricity measuring equipment

There are three variations available, allowing for system proposals tailored to user requirements. Each system can conduct ESD testing and latch-up testing (optional) that comply with today's latest standards. It is an ESD testing device that supports up to 256 pins.

• EMC/Static electricity measuring equipment

This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety.

• Other environmental analysis equipment

This is a CV/IV measurement system using a mercury probe method that exhibits excellent reproducibility and safety.

• Other environmental analysis equipment

This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety. It can measure the characteristics of various types of wafers, including Si, compounds, SOI, SiC, and bulk wafers. Users can specify up to 49 measurement sites, enabling mapping measurements of C-V, I-V characteristics, TDDB, Vbd, Qbd oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, and more.

• Other environmental analysis equipment

This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety. It can measure the characteristics of various types of wafers, including Si, compounds, SOI, SiC, and bulk wafers. Users can specify up to 49 measurement sites, and the system allows for mapping measurements of C-V, I-V characteristics, TDDB, Vbd, Qbd oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, and more.

• Other environmental analysis equipment

This is a notice from Yuzan Corporation regarding the "Prober for Glove Boxes."

• Other environmental analysis equipment

This is an announcement from Yuzan Corporation regarding the "Horizontal Magnetic Pole Prober 41RFR."

• Other environmental analysis equipment

This is a notice from Yuzan Corporation regarding the "Magnetic Pole Prober 4040MR."

• Other environmental analysis equipment

This is an announcement from Yuzan Corporation regarding the "Ultra-Low Temperature Prober."

• Other environmental analysis equipment

This is a notice from Yuzan Corporation regarding the "Low-Temperature Prober."

• Other environmental analysis equipment

This is an announcement from Yuzan Corporation regarding the "Vacuum Prober."

• Other environmental analysis equipment

This is a notice from Yuzan Corporation regarding the "High-Temperature Vacuum Prober."

• Other environmental analysis equipment

This is an announcement from Yuzan Corporation regarding "Probers for Large LCD Panels."

• probe

This is an announcement from Yuzan Corporation regarding the "Backlight Prober for Small LCD Panels."

• probe

This is an announcement from Yuzan Corporation regarding the "Shielding Prober."

• Circuit Board Inspection Equipment

This is an announcement from Yuzan Corporation regarding the "Simple Shield Box Prober."

• Circuit Board Inspection Equipment

This is an announcement from Yuzan Corporation regarding the "OYM-2000 Series."

• Circuit Board Inspection Equipment

This is a notice about the "Probing Station" from Yuzan Corporation.

• others

We would like to introduce the TLP test device 'Celestron' handled by Yuzan Corporation. It is capable of evaluating the characteristics of ESD protection circuits for devices at both wafer and package levels. It has a built-in curve tracer and is space-saving. Please feel free to contact us when needed. 【Features】 ■ Built-in curve tracer ■ Real-time display - TLP voltage and pulse current ■ Interface with prober - Connection with semi-auto probers ■ Space-saving * For more details, please refer to the PDF document or feel free to contact us.

• Other anti-static devices

This is an announcement from Yuzan Corporation regarding the "ESD Testing Equipment MK Series."

• others

This is a manual opening device designed for TO packages primarily used in laser diodes. 【Features】 ◆ Significantly reduces work time as there is no need for cumbersome manual condition setting. ◆ The quality of the opening is not dependent on the operator's skill level, making the opening process easy for anyone. Effective in reducing sample damage. ◆ Comes with a safety cover to protect hands and fingers from the circular blade during handling and operation.

• Other semiconductor manufacturing equipment

The OYM-401 is a basic model with a simple operation panel that prioritizes ease of use. 【Features】 ◆ A model set up with a stereo microscope suitable for probing IC pads. ◆ Equipped with a standard 8-inch stroke X-Y stage. ◆ Optional installation of various equipment such as probe card holders and hot chucks is available. *For more details, please request the materials.

• Semiconductor inspection/test equipment

This is a high-grade model equipped with a high-magnification metal microscope. 【Features】 ◆ A heavy-duty base and a positioning stage with excellent load-bearing capacity. ◆ High-precision and stable probing for fine circuits on the order of a few microns and sub-microns. ◆ The microscope mount features X-Y movement and quick lift for easy setup and positioning. *For more details, please refer to the catalog or feel free to contact us.

• Semiconductor inspection/test equipment

The "TB Series" is a model of probe that excels in cost performance and is suitable for various measurement purposes while saving space. Inside the compact shield box, standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table. Since the necessary components for the probe are included in advance, the initial setup cost is lower compared to building a new probing environment. 【Features】 ■ Standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table ■ Lower initial setup costs compared to building a new probing environment ■ A cost-effective probing system that can be widely used ■ Compact size allows for use in various applications and limited installation space ■ A wide range of optional items available, including hot chucks and probes with various tip diameters and materials *For more details, please refer to the PDF document or feel free to contact us.

• Semiconductor inspection/test equipment

This is a CV/IV measurement system using a mercury probe method developed by Four Dimensions, Inc. in the United States, which excels in reproducibility and safety. It can measure the characteristics of various wafers such as Si, compounds, SOI, and bulk. 【Features】 ◆ No need for electrode fabrication. Since mercury itself serves as the electrode, the costly and time-consuming patterning process is unnecessary. Measurements can be taken in a bulk state or with an insulating film formed. ◆ Automatic system. It allows for automatic mapping measurements of up to 49 designated measurement sites, including C-V, I-V characteristics, TDDB, Vdb, Qbd for oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, etc. ◆ High measurement reproducibility. Excellent measurement reproducibility is achieved through a uniquely designed mercury probe area and the use of fresh mercury for each measurement. ◆ Compact structure. Integrates CV and IV meters, transport platform, and probe section. ◆ Compatible with various wafers and chips. Capable of measuring 1 to 12-inch wafers and chip-sized samples.

• Semiconductor inspection/test equipment