アイテス Product Lineup

Aites is a solution-oriented company that sincerely addresses customer challenges in cutting-edge industrial fields. We utilize various owned devices to provide optimal solutions. ■ Product Analysis / Defect Analysis / Failure Analysis Morphological observation, electrical characteristic measurement, defect analysis, failure analysis, sample processing ■ Reliability Evaluation Testing Reliability evaluation testing, ESD/latch-up testing, strength testing, optical characteristics ■ Physical Analysis / Chemical Analysis Physical analysis, surface analysis, chemical analysis

We handle the tabletop SEM (scanning electron microscope) 'TM3030Plus' manufactured by Hitachi High-Tech. It has been half a century since SEM observation became common, and it has become an important observation method in various fields. With the "charge reduction mode" of the tabletop SEM, it is possible to observe and analyze samples that cannot be observed with FE-SEM. This capability is applicable not only in the semiconductor and electronic components fields but also in life sciences and biological fields. 【Features】 - For conductive samples such as semiconductors and electronic components, SEM observation is mainly recommended in normal/conductive mode. - For non-conductive samples such as plastics, paper, rubber, ceramics, and biological samples containing moisture or oil, SEM observation in surface/normal/charge prevention mode is recommended. *For more details, please refer to the PDF document or feel free to contact us.