一般財団法人材料科学技術振興財団　MST Product Lineup

TOF-SIMS and MALDI-MS, which are representative mass spectrometry methods for solid sample surfaces, both enable qualitative analysis and imaging analysis. TOF-SIMS, which utilizes hard ionization methods, can detect inorganic and organic components with masses up to several hundred with high sensitivity. On the other hand, MALDI-MS, which employs soft ionization methods, can detect polymers in the range of thousands to tens of thousands. Additionally, the spatial resolution of the images also varies depending on the diameter of the irradiation beam.

- Phosphorescence has a longer lifespan compared to fluorescence, and it often becomes thermally deactivated due to quenching by oxygen or the motion and collisions of solvents, making it difficult to measure at room temperature in most cases. Therefore, phosphorescence measurements are generally conducted at low temperatures. The fluorescence spectrometer owned by MST can cool samples to liquid nitrogen temperatures, allowing for phosphorescence measurements. - To perform phosphorescence measurements, it is necessary to measure the emission lifetime of phosphorescence and appropriately set the opening and closing time of the shutter integrated into the device based on the results. By establishing suitable measurement conditions, it is possible to distinguish and observe phosphorescence from fluorescence. This document explains the measurement of phosphorescence emission lifetime and phosphorescence measurements.

NMR is typically performed using the resonance signals of deuterium (2H or D) nuclei in deuterated solvents for reasons such as ensuring the stability of the magnetic field. However, by using the resonance signals of proton (1H) nuclei, measurements can also be conducted with light solvents (i.e., regular solvents) (No-D measurement method). The effective measurements for the No-D method are as follows: - Measurements to evaluate interactions with light solvents (e.g., degradation studies in light solvents) - Measurements of samples that cannot use deuterated solvents (e.g., samples in the biochemical field such as proteins) - Measurements of samples containing volatile components - Measurements of samples for which no dissolvable deuterated solvents are available.

Soft X-ray emission spectroscopy (SXES) using synchrotron radiation is widely used as a method to evaluate the electronic states of materials, as it allows for the direct acquisition of the partial density of states (pDOS) near the Fermi level for each element constituting the material. Furthermore, the characteristics of this method include: 1. Information from the bulk can be obtained. 2. It can be evaluated without being affected by charging effects, even for insulators. 3. The detection limit is low (<1 atomic%). These features make it particularly effective for evaluating materials containing light elements (such as B, C, N, O). In this document, we will introduce the SXES spectrum of a GaN substrate as a measurement example.

Our organization offers evaluation of the direct current voltage dependence of carriers in semiconductors. SMM measurement is a technique that can map the concentration of carriers in semiconductors. Additionally, it is possible to apply a direct current voltage to the sample during SMM measurement to induce carriers while measuring. Mapping measurements are conducted while acquiring SMM signals under different applied voltage conditions at each measurement point, constructing a data cube. After collecting all data, analyzing the SMM signals according to the applied voltage conditions allows us to visualize the behavior of carriers in response to the applied voltage. [Measurement Method / Processing Method] ■ [SMM] Scanning Microwave Microscope Method *For more details, please download the PDF or feel free to contact us.

Our organization conducts product degradation investigations through weather resistance testing. The Sunshine Weather Meter can artificially reproduce sunlight, temperature, humidity, and other conditions. We conducted weather resistance testing standards for bicycle lights and examined changes over time. To quantitatively discuss the discoloration of lights that are originally black, we refer to (JIS D 0205) and present a case study evaluating color difference and glossiness. 【Measurement Methods and Processing Methods】 ■Others ■Weather Resistance Testing *For more details, please download the PDF or feel free to contact us.

We have completely renewed our homepage. In this renewal, we have revamped the design and structure to make it more user-friendly and comfortable for everyone, while enhancing the information provided. ◆ Key Points of the Renewal - Improved accessibility to information We have reviewed the common navigation across all pages and improved the menu structure to make it easier to understand. The structure allows for intuitive access to the necessary information. - Comfortable viewing in all environments In addition to PCs, we have made the site compatible with various viewing environments, including smartphones and tablets. You can enjoy a comfortable experience regardless of location or device. - Enhanced visual design for better visibility We have reviewed the overall color scheme and layout of the site, refreshing it to a more understandable and sophisticated design. ▼ You can view it here https://www.mst.or.jp/ We would be grateful if you could take a look. We will continue to strive for further enhancement of our content, and we appreciate your continued support.

■ A consistent system that accompanies you until resolution and diverse analytical approaches We provide consistent support from hearing about the issues to reporting, collaboratively leading to optimal solutions through dialogue. With over 100 types of analytical methods and AI analysis, we cover challenges across all domains, responding to the trust that "MST is reliable" with flexible responses and proven results. ■ Abundant technical skills and experience We cater to a wide range of needs, from advanced analysis in existing fields like semiconductors to custom analysis in new areas. We have achievements in unique technologies such as the first domestic commercialization of FIB-TEM and SSDP-SIMS. ■ Fairness and reliability Since 1984, during the era when semiconductors took the world by storm, we have walked alongside the forefront of manufacturing. We maintain a fair and neutral stance, building solid trust through quality management based on ISO 9001. ■ Optimal problem-solving through AI analysis We propose solutions tailored to objectives and challenges through equipment analysis, AI analysis, and simulation. By maximizing the use of customer-owned data and designing and constructing custom AI models, we aim to generate results that meet specific needs. For inquiries regarding analysis and consultation, please feel free to contact us.