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  1. Home
  2. Testing, Analysis and Measurement
  3. 一般財団法人材料科学技術振興財団 MST
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Testing, Analysis and Measurement
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一般財団法人材料科学技術振興財団 MST

EstablishmentAugust 1, 1984
addressTokyo/Setagaya-ku/Kitaomi 1-18-6
phone03-3749-2525
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last updated:May 26, 2025
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一般財団法人材料科学技術振興財団 MST List of Products and Services

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Mass spectrometry Mass spectrometry
 【分析事例】高分子材料 【分析事例】高分子材料
【測定法】計算科学・AI・データ解析 【測定法】計算科学・AI・データ解析
Photoelectron spectroscopy Photoelectron spectroscopy
[Measurement Method] Electron Microscopy Observation and Analysis [Measurement Method] Electron Microscopy Observation and Analysis
Vibrational spectroscopy Vibrational spectroscopy
Measurement Method: X-ray Diffraction Related Measurement Method: X-ray Diffraction Related
[Measurement Method] Related to SPM [Measurement Method] Related to SPM
Measurement Method: Failure Analysis Measurement Method: Failure Analysis
[Measurement Method] Other Measurement Methods [Measurement Method] Other Measurement Methods
Processing methods and treatment methods Processing methods and treatment methods
Other services and support information Other services and support information
[Analysis Case] LSI・Memory [Analysis Case] LSI・Memory
[Analysis Case] Optical Devices [Analysis Case] Optical Devices
[Analysis Case] Solar Cells [Analysis Case] Solar Cells
[Analysis Case] Fuel Cell [Analysis Case] Fuel Cell
[Analysis Case] Display [Analysis Case] Display
[Analysis Case] Oxide Semiconductors [Analysis Case] Oxide Semiconductors
[Analysis Case] Power Device [Analysis Case] Power Device
[Analysis Case] Electronic Components [Analysis Case] Electronic Components
[Analysis Case] Secondary Battery [Analysis Case] Secondary Battery
[Analysis Case] Lighting [Analysis Case] Lighting
[Analysis Case] Manufacturing Equipment and Components [Analysis Case] Manufacturing Equipment and Components
[Analysis Case] Biotechnology [Analysis Case] Biotechnology
[Analysis Case] Cosmetics [Analysis Case] Cosmetics
[Analysis Case] Food [Analysis Case] Food
[Analysis Case] Pharmaceuticals [Analysis Case] Pharmaceuticals
[Analysis Case] Medical Devices [Analysis Case] Medical Devices
Analysis Case: Daily Necessities Analysis Case: Daily Necessities
[Analysis Case] Environment [Analysis Case] Environment
[Analysis Case] Others [Analysis Case] Others
Materials from the exhibition where MST exhibited. Materials from the exhibition where MST exhibited.
[Analysis

[Analysis Case] Lighting

We will introduce examples of lighting analysis.

Differentiation of mass spectrometry methods for solid sample surfaces

It is effective to differentiate between the two methods according to the purpose components and the size of the imaging field.

TOF-SIMS and MALDI-MS, which are representative mass spectrometry methods for solid sample surfaces, both enable qualitative analysis and imaging analysis. TOF-SIMS, which utilizes hard ionization methods, can detect inorganic and organic components with masses up to several hundred with high sensitivity. On the other hand, MALDI-MS, which employs soft ionization methods, can detect polymers in the range of thousands to tens of thousands. Additionally, the spatial resolution of the images also varies depending on the diameter of the irradiation beam.

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Measurement of phosphorescence lifetime and phosphorescence using a fluorometer.

Phosphorescence measurement is possible with a fluorometer.

- Phosphorescence has a longer lifespan compared to fluorescence, and it often becomes thermally deactivated due to quenching by oxygen or the motion and collisions of solvents, making it difficult to measure at room temperature in most cases. Therefore, phosphorescence measurements are generally conducted at low temperatures. The fluorescence spectrometer owned by MST can cool samples to liquid nitrogen temperatures, allowing for phosphorescence measurements. - To perform phosphorescence measurements, it is necessary to measure the emission lifetime of phosphorescence and appropriately set the opening and closing time of the shutter integrated into the device based on the results. By establishing suitable measurement conditions, it is possible to distinguish and observe phosphorescence from fluorescence. This document explains the measurement of phosphorescence emission lifetime and phosphorescence measurements.

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Structural analysis using NMR (nuclear magnetic resonance) spectroscopy.

Measurement of the light solvent as is.

NMR is typically performed using the resonance signals of deuterium (2H or D) nuclei in deuterated solvents for reasons such as ensuring the stability of the magnetic field. However, by using the resonance signals of proton (1H) nuclei, measurements can also be conducted with light solvents (i.e., regular solvents) (No-D measurement method). The effective measurements for the No-D method are as follows: - Measurements to evaluate interactions with light solvents (e.g., degradation studies in light solvents) - Measurements of samples that cannot use deuterated solvents (e.g., samples in the biochemical field such as proteins) - Measurements of samples containing volatile components - Measurements of samples for which no dissolvable deuterated solvents are available.

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[Analysis Case] Measurement of Partial Density of States of GaN

Information about valence bands and gap states can be obtained by element.

Soft X-ray emission spectroscopy (SXES) using synchrotron radiation is widely used as a method to evaluate the electronic states of materials, as it allows for the direct acquisition of the partial density of states (pDOS) near the Fermi level for each element constituting the material. Furthermore, the characteristics of this method include: 1. Information from the bulk can be obtained. 2. It can be evaluated without being affected by charging effects, even for insulators. 3. The detection limit is low (<1 atomic%). These features make it particularly effective for evaluating materials containing light elements (such as B, C, N, O). In this document, we will introduce the SXES spectrum of a GaN substrate as a measurement example.

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[Analysis Case] Evaluation of DC Voltage Dependence of Carriers in Semiconductors

We will introduce an analysis case using Si samples with known carrier concentration!

Our organization offers evaluation of the direct current voltage dependence of carriers in semiconductors. SMM measurement is a technique that can map the concentration of carriers in semiconductors. Additionally, it is possible to apply a direct current voltage to the sample during SMM measurement to induce carriers while measuring. Mapping measurements are conducted while acquiring SMM signals under different applied voltage conditions at each measurement point, constructing a data cube. After collecting all data, analyzing the SMM signals according to the applied voltage conditions allows us to visualize the behavior of carriers in response to the applied voltage. [Measurement Method / Processing Method] ■ [SMM] Scanning Microwave Microscope Method *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Investigation of Product Deterioration through Weather Resistance Testing

It is possible to reproduce the deterioration state using the Sunshine Weather Meter!

Our organization conducts product degradation investigations through weather resistance testing. The Sunshine Weather Meter can artificially reproduce sunlight, temperature, humidity, and other conditions. We conducted weather resistance testing standards for bicycle lights and examined changes over time. To quantitatively discuss the discoloration of lights that are originally black, we refer to (JIS D 0205) and present a case study evaluating color difference and glossiness. 【Measurement Methods and Processing Methods】 ■Others ■Weather Resistance Testing *For more details, please download the PDF or feel free to contact us.

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