一般財団法人材料科学技術振興財団　MST Product Lineup

Our organization offers evaluation of the crystallinity of carbon materials using Raman mapping. Carbon materials possess different properties depending on their structure and crystallinity, and are used in various applications such as industrial components and medical devices. Linking the characteristics of materials to their crystallinity is effective as an indicator for material development. This document presents a case study where the in-plane distribution (peak intensity) of diamond particles, a carbon material applied to the surface of components, and the crystallinity (full width at half maximum) of each diamond particle were evaluated using Raman mapping. Diamonds exhibit a sharp peak observed sensitively at 1330 cm-1, making Raman evaluation effective. [Measurement Method / Processing Method] ■ [Raman] Raman Spectroscopy *For more details, please download the PDF or feel free to contact us.

Our organization is capable of identifying the composition of petroleum products, evaluating molecular weight distribution, and distinguishing types of oils. Petroleum products such as oils and greases are mixtures of hydrocarbons with various compositions, and GC/MS methods are effective for their qualitative analysis. Here, we present a case study where commercially available oils with different molecular weight distributions were measured using soft ionization methods. Compared to hard ionization methods (EI), soft ionization methods (FI and FD) allow for the detection of molecular ions, making them effective for evaluating the composition of oil components. In particular, the FD method can also be applied to evaluate oils containing high molecular weight components that are difficult to volatilize. [Measurement Method / Processing Method] ■ [GC/MS] Gas Chromatography Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

Our organization offers analysis of the end group structure of polycarbonate. Polycarbonate is an engineering plastic known for its excellent impact resistance and heat resistance, and it is widely used as a material in electrical, electronic, and optical devices. There are mainly two methods of manufacturing polycarbonate, and the end group structure, which affects the physical properties of the polymer, varies depending on the manufacturing method. Since the end group portion of the polymer is small compared to the main chain, the analytical methods available for its structural analysis are limited. Here, we present a case study evaluating the end group structure of polycarbonate using thermal decomposition GC/MS. [Measurement Method / Processing Method] ■ [GC/MS] Gas Chromatography Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

Our organization conducts observations of structural changes in ABS resin through tensile testing using in situ X-ray CT. In in situ X-ray CT measurements, it is possible to perform structural observations while applying a load (tensile or compressive) to the sample. In this case, X-ray CT measurements were conducted on a sample of ABS resin containing glass filler under tensile load, and the tensile stress applied to the sample was calculated. The three-dimensional structural changes of the resin and glass filler under each stress condition were monitored. [Measurement Method / Processing Method] ■ X-ray CT Method *For more details, please download the PDF or feel free to contact us.

Our organization conducts metal analysis in organic materials. Metal components can cause a decrease in insulation properties when they contaminate organic materials, such as in semiconductor devices. Therefore, it is important to understand the amount of metal in organic materials. In this case, we analyzed the metal content in organic materials (polyethylene products, polypropylene products, polyimide films). Organic materials can be acid-digested by irradiating them with microwaves in a sealed state (under high temperature and pressure). [Measurement Method / Processing Method] ■ [ICP-MS] Inductively Coupled Plasma Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

With the miniaturization of semiconductor processes, the importance of surface reactions due to etching gases, precursors in ALD film formation, and plasma treatments is increasing. For systems involving complex chemical reactions such as etching, changes in surface bonding states, and defect generation, analysis using molecular dynamics calculations is effective for understanding phenomena at the atomic level. This document evaluates the HF etching reaction of a-SiO2 using molecular dynamics calculations. A similar approach can be applied to various reactions and materials.

TOF-SIMS has good depth resolution and can obtain fragment ions corresponding to bonding states, allowing for the evaluation of layer structures near the surface, within a few nanometers. This document presents a case study analyzing the layer structure of a tin plate surface based on the information obtained from the measurement of standard samples of tin oxide and hydrated tin oxide. By applying this technology, it is possible to evaluate modified layers and altered layers due to surface treatment.

ALD (Atomic Layer Deposition) is a method that allows for uniform film formation at the atomic layer level, even for high aspect ratio structures, and is being focused on as a useful technique for the miniaturization, integration, and fine wiring of semiconductors. Since it is a vapor-phase deposition method that utilizes the "adsorption saturation of precursors on the growth surface," high vapor pressure precursors are required to improve the coverage rate of precursors on the substrate and the deposition rate. This document predicts the vapor pressures of various Ga-containing precursors through molecular dynamics calculations and compares them with experimental values.

TOF-SIMS is a very effective method for investigating the causes of contamination due to foreign substances, deposits, dirt, discoloration, and other factors related to the process. By comparing the mass spectral information obtained from contamination such as foreign substances with the mass spectral information of candidate contamination source components, it is possible to infer the sources of that contamination. In this document, we prepared four types of resin tubes used in the wafer manufacturing process and foreign substances on Si wafers, and by comparing their mass spectral information, we evaluated which components used in the process the contamination from the foreign substances was attributed to.

Vacuum devices that utilize the characteristic of low gas molecular density in a space are used in various applications such as thin film formation and surface analysis in the manufacturing process of electronic components. Since the chamber of a vacuum device is a closed space, the presence of trace amounts of molecules can easily cause contamination within the device. To suppress contamination, it is necessary to conduct investigations to identify contamination sources such as pumps, devices, and samples. This document presents a case study investigating contamination within a vacuum device using TOF-SIMS.

We have completely renewed our homepage. In this renewal, we have revamped the design and structure to make it more user-friendly and comfortable for everyone, while enhancing the information provided. ◆ Key Points of the Renewal - Improved accessibility to information We have reviewed the common navigation across all pages and improved the menu structure to make it easier to understand. The structure allows for intuitive access to the necessary information. - Comfortable viewing in all environments In addition to PCs, we have made the site compatible with various viewing environments, including smartphones and tablets. You can enjoy a comfortable experience regardless of location or device. - Enhanced visual design for better visibility We have reviewed the overall color scheme and layout of the site, refreshing it to a more understandable and sophisticated design. ▼ You can view it here https://www.mst.or.jp/ We would be grateful if you could take a look. We will continue to strive for further enhancement of our content, and we appreciate your continued support.

■ A consistent system that accompanies you until resolution and diverse analytical approaches We provide consistent support from hearing about the issues to reporting, collaboratively leading to optimal solutions through dialogue. With over 100 types of analytical methods and AI analysis, we cover challenges across all domains, responding to the trust that "MST is reliable" with flexible responses and proven results. ■ Abundant technical skills and experience We cater to a wide range of needs, from advanced analysis in existing fields like semiconductors to custom analysis in new areas. We have achievements in unique technologies such as the first domestic commercialization of FIB-TEM and SSDP-SIMS. ■ Fairness and reliability Since 1984, during the era when semiconductors took the world by storm, we have walked alongside the forefront of manufacturing. We maintain a fair and neutral stance, building solid trust through quality management based on ISO 9001. ■ Optimal problem-solving through AI analysis We propose solutions tailored to objectives and challenges through equipment analysis, AI analysis, and simulation. By maximizing the use of customer-owned data and designing and constructing custom AI models, we aim to generate results that meet specific needs. For inquiries regarding analysis and consultation, please feel free to contact us.