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  1. Home
  2. Testing, Analysis and Measurement
  3. 一般財団法人材料科学技術振興財団 MST
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Testing, Analysis and Measurement
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一般財団法人材料科学技術振興財団 MST

EstablishmentAugust 1, 1984
addressTokyo/Setagaya-ku/Kitaomi 1-18-6
phone03-3749-2525
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last updated:May 26, 2025
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一般財団法人材料科学技術振興財団 MST List of Products and Services

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Mass spectrometry Mass spectrometry
 【分析事例】高分子材料 【分析事例】高分子材料
【測定法】計算科学・AI・データ解析 【測定法】計算科学・AI・データ解析
Photoelectron spectroscopy Photoelectron spectroscopy
[Measurement Method] Electron Microscopy Observation and Analysis [Measurement Method] Electron Microscopy Observation and Analysis
Vibrational spectroscopy Vibrational spectroscopy
Measurement Method: X-ray Diffraction Related Measurement Method: X-ray Diffraction Related
[Measurement Method] Related to SPM [Measurement Method] Related to SPM
Measurement Method: Failure Analysis Measurement Method: Failure Analysis
[Measurement Method] Other Measurement Methods [Measurement Method] Other Measurement Methods
Processing methods and treatment methods Processing methods and treatment methods
Other services and support information Other services and support information
[Analysis Case] LSI・Memory [Analysis Case] LSI・Memory
[Analysis Case] Optical Devices [Analysis Case] Optical Devices
[Analysis Case] Solar Cells [Analysis Case] Solar Cells
[Analysis Case] Fuel Cell [Analysis Case] Fuel Cell
[Analysis Case] Display [Analysis Case] Display
[Analysis Case] Oxide Semiconductors [Analysis Case] Oxide Semiconductors
[Analysis Case] Power Device [Analysis Case] Power Device
[Analysis Case] Electronic Components [Analysis Case] Electronic Components
[Analysis Case] Secondary Battery [Analysis Case] Secondary Battery
[Analysis Case] Lighting [Analysis Case] Lighting
[Analysis Case] Manufacturing Equipment and Components [Analysis Case] Manufacturing Equipment and Components
[Analysis Case] Biotechnology [Analysis Case] Biotechnology
[Analysis Case] Cosmetics [Analysis Case] Cosmetics
[Analysis Case] Food [Analysis Case] Food
[Analysis Case] Pharmaceuticals [Analysis Case] Pharmaceuticals
[Analysis Case] Medical Devices [Analysis Case] Medical Devices
Analysis Case: Daily Necessities Analysis Case: Daily Necessities
[Analysis Case] Environment [Analysis Case] Environment
[Analysis Case] Others [Analysis Case] Others
Materials from the exhibition where MST exhibited. Materials from the exhibition where MST exhibited.
[Analysis

[Analysis Case] LSI・Memory

We will introduce examples of LSI and memory analysis.

[Analysis Case] Vapor Pressure Calculation of Ga-containing Precursor by Molecular Dynamics Simulation

Effective for predicting the vapor pressure of metal complexes used as precursors in ALD and CVD!

ALD (Atomic Layer Deposition) is a method that allows for uniform film formation at the atomic layer level, even for high aspect ratio structures, and is being focused on as a useful technique for the miniaturization, integration, and fine wiring of semiconductors. Since it is a vapor-phase deposition method that utilizes the "adsorption saturation of precursors on the growth surface," high vapor pressure precursors are required to improve the coverage rate of precursors on the substrate and the deposition rate. This document predicts the vapor pressures of various Ga-containing precursors through molecular dynamics calculations and compares them with experimental values.

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[Analysis Case] Contamination Analysis in Vacuum Equipment

It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!

Vacuum devices that utilize the characteristic of low gas molecular density in a space are used in various applications such as thin film formation and surface analysis in the manufacturing process of electronic components. Since the chamber of a vacuum device is a closed space, the presence of trace amounts of molecules can easily cause contamination within the device. To suppress contamination, it is necessary to conduct investigations to identify contamination sources such as pumps, devices, and samples. This document presents a case study investigating contamination within a vacuum device using TOF-SIMS.

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