TAKAYA Corporation List of Products and Services

*Detailed features can be viewed in the catalog* TAKAYA's flying probe tester is equipped not only with in-circuit test capabilities but also with standard AOI (Automated Optical Inspection) functionality using a color camera. By partially inspecting components that cannot be measured through electrical testing, it is possible to further enhance the reliability of inspections. - AOI functionality capable of color identification - Serial number and barcode reading capabilities - PCB color image acquisition and generation capabilities We welcome inquiries for trials/tests. If you have any concerns, please feel free to contact us. *Detailed information can be viewed in the catalog*

*To customers using the old model If you are using an old model of the Takaya Flying Probe Tester, such as the APT-7400CJ, we encourage you to consider upgrading or expanding to the latest model. 〇 Programs can be transferred as is Inspection programs used in the old model can be smoothly converted to the latest model. There is no need to recreate or readjust the programs. 〇 Significant increase in inspection speed The latest model features a completely revamped drive motor and control system, increasing probe movement speed to 1.5 times that of the old model! This allows for a significant reduction in inspection time. 〇 Effectiveness seen through performance data Inspection time for one board, which took 33 seconds with the APT-7400CJ, has been reduced to 19 seconds with the latest model (approximately a 40% reduction). Improvements in inspection capacity can be expected. 〇 Benefits of upgrading or expanding - Improved inspection efficiency: Enhanced throughput on the production line - Zero hassle transition: No need to rebuild programs - Increased future adaptability: Peace of mind with the latest control system for long-term operation If you are considering an increase in inspection capacity or efficiency improvements, please feel free to consult with your sales representative.

The Takaya Flying Probe Tester "APT Series" comes standard with a "statistical function" that automatically collects and analyzes inspection results. 【Main Features】 〇 Inspection Types Counts the number of steps and displays the percentage in a graph for each inspection type. 〇 Defect Analysis Aggregates defect details and counts for each inspection step. 〇 Inspection Analysis Visually displays analysis results in graphs such as histograms. 〇 Inspection Aggregation Cumulatively displays total counts, good product counts, defect counts, and defect rates by date. 〇 Inspection Report Automatically compiles analysis results and outputs them in Excel format. It is effective for reviewing and streamlining inspection programs, providing feedback to the implementation process, and improving efficiency. For more details, please contact your sales representative.

One method for efficiently mass-producing products is the "line production method," which arranges machinery in order of the production process. This method excels in the productivity of single products and is adopted in many manufacturing sites. The incorporation of an inspection process into this line production method is referred to as "inline inspection." Takaya's flying probe testers have models that can accommodate this "inline inspection" by automatically transporting circuit boards on a conveyor. By collaborating with loaders, unloaders, and inversion machines through SMEMA, it enables automated and unmanned inspection even with large quantities of circuit boards. Additionally, when used in conjunction with other companies' 3D-AOI (automated optical inspection machines), the flying probe testers can detect issues such as microbridges that cannot be identified through visual inspection alone. This synergy leverages the strengths of each system, resulting in the elimination of false reports, improved inspection capabilities, and increased speed. If you are facing challenges with full electrical inspection (ICT) of mass-produced circuit boards, please consider Takaya's APT series, which allows for easy line switching without the need for fixtures.

This system allows for the addition of two vertical probes to the standard four inclined probes, enabling contact with points that were previously inaccessible, such as contact points between high components, vias, through-holes, and upward connectors, thereby enhancing defect detection capabilities. To select the optimal contact method according to the shape of the object being inspected, several types of probes with different tip shapes are available. Furthermore, by adding a dual Z-axis option that automatically switches between two different vertical probes according to the inspection program, manual probe replacement becomes unnecessary, allowing for more efficient inspections.

Are you struggling with the labor involved in inspecting the LED's emission color and brightness? Takahashi's flying probe tester has an optional feature that allows for the measurement of LED emission color and brightness using a color sensor. We have examples of cases where visual inspections have been switched to inspections using the flying probe tester. Here are the actual benefits of implementation: 1: Zero burden on visual inspectors Directly looking at the LED's emission color can damage the operator's eyes, but switching to the flying probe tester can eliminate this burden. 2: Clarification of measurement standards Visual inspection can lead to variability in judgment criteria among inspectors. However, inspections using a color sensor have clear judgment criteria based on numerical comparisons, allowing for stable inspections. 3: No need for jig manufacturing costs In the case of LED inspections with the flying probe tester, there is no need to create dedicated jigs. We welcome inquiries for trials and tests. If you have any concerns, please feel free to contact us.

*You can view detailed features in the catalog.* The TAKAYA flying probe tester is equipped with a system that uses a uniquely developed sensor probe to quickly detect issues such as lifted leads and solder defects in ICs like BGA, QFP, and SOJ. It can electrically detect lifted lead defects in narrow-pitch ICs and ball lift defects in BGAs without damaging the IC itself. We welcome inquiries for trials and tests. If you have any concerns, please feel free to contact us. *You can view detailed information in the catalog.*

*You can view detailed features in the catalog.* When conducting electrical inspections of printed circuit boards with a flying probe tester, there were challenges such as the need for knowledge in board and circuit design to create inspection programs, which limited the number of people who could perform the tasks. Taka's flying probe tester comes with proprietary software developed in-house that allows for easy creation of inspection programs without requiring specialized knowledge, enabling anyone to use it with simple operations. Leveraging the presence of an EMS division within the group, we directly reflect the genuine feedback from the implementation site into development, resulting in software that can truly be described as "user-friendly." If you would like to try it out with your own boards, we welcome inquiries for trials/tests. Please feel free to contact us. <Recommended for the following people!> - Those who require electrical inspections for a variety of low-volume boards - Those who want to reduce costs/time associated with creating inspection programs and improve efficiency - Those who want to conduct electrical inspections without specialized knowledge in circuit design *You can view detailed information in the catalog.*

This is a highly versatile workstation software that automatically generates inspection programs for Takaya flying probe testers from easily accessible mount data. It features user-friendly operability that anyone can handle in a short time and pursues functionality that accommodates various inspection purposes. Features: - Real map (actual board image) capture screen display, making it easy to identify defective areas and confirm contact positions. - Simple operation for data conversion, with one-touch support. - Comprehensive support features such as component shape/area specification and automatic probe selection. We are also happy to accept program creation tests and inspection demonstrations. Please contact our sales representative for inquiries.

In-circuit testing with a flying probe tester excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires specialized fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures to connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors) by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

This is an option that equips the underside operating axis of the APT-1600FD series with a dedicated fixture lifting mechanism. It allows for special inspections connected to external devices, such as Boundary Scan Tests (BST), as well as writing to and reading logs from ICs, to be performed in parallel with in-circuit testing. *For an image of the operation, please refer to the YouTube video.

Are you having trouble with ICT (In-Circuit Testing) for oversized PCBs? Even for oversized PCBs known as DIB (Device Interface Board) or PIB (Probe Interface Board), you can rely on Takaya's flying probe testers. By using our unique optional mechanisms, we can perform ICT inspection on PCBs up to 985x610mm in size without any modifications. Additionally, we are happy to accommodate automatic transport for heavy PCBs and individual customizations within the inspection area. For more details about Takaya's flying probe testers, please feel free to download the PDF catalog or contact your sales representative.

Special Feature Content ■ Latest Trends in BGA Implementation Board Inspection Hybrid Inspection of Flying Probe Testers and JTAG Testing Andor System Support Co., Ltd. / Masayuki Taniguchi Takaya Co., Ltd. / Kohei Yanagida Overview BGA (Ball Grid Array) components are now used in all types of electronic devices, from consumer products to industrial equipment, and more recently, automotive devices. However, a reliable method for inspecting boards with BGA components (hereafter referred to as BGA implementation boards) has not been established. This is because every inspection method has its advantages and disadvantages, making it impossible to conduct a complete test using only one inspection method. Therefore, inspecting BGA implementation boards has become a challenge for many companies. In this article, we will introduce the latest technological trends in hybrid inspection that combines flying probe testers and JTAG (Joint Test Action Group) boundary scan as one solution to this issue. 1. Introduction 2. Inspection and Challenges of BGA Implementation Boards 3. Possibilities of Electrical Testing 4. In-Circuit Testing 5. JTAG Boundary Scan Testing 6. Hybrid Testing 7. Conclusion

This is an optional feature for measuring: - Leakage current between any specified nets - Leakage current (leakage current) of semiconductor devices such as MOS-FETs and photo MOS relays - Reverse current of diodes by applying a maximum ±110V DC constant voltage using a flying probe tester. By contacting other probes to the same net as the measurement probe and measuring the resistance value, a check function is provided to prevent misjudgment. Trial/testing inquiries are welcome. If you have any concerns, please feel free to contact us.

At Takaya, in order to respond to further requests from our customers, we are advancing the development of a unique mode for the flying probe tester that adjusts the application parameters to measure lower resistance (0.1 mΩ and below). *Resolution: 0.001 mΩ Compared to handheld low-resistance meters, the flying probe tester has longer measurement lines (approximately 5 meters) from the measurement probes to the main unit, which necessitates machine design that takes external noise into account; however, we have expertise in this area. Additionally, when measuring with handheld probes, the force, angle, and position when contacting the measurement target are not consistent, which can lead to variations in measurement results and potential marks or damage to the object being measured. Our probe system is well-regarded for its damage-free contact and high-precision contact. If you have concerns such as wanting to eliminate the uncertainty of manual measurements or finding the measurement process too cumbersome, please feel free to reach out to us. We would be happy to accept test trials.

OPC UA (OPC Unified Architecture) is an open international standard developed for safe and reliable data exchange in industries such as industrial automation. It was announced by the OPC Foundation in 2008 and later standardized as IEC62541. It allows for secure and highly reliable data exchange across different types of devices, operating systems, and manufacturers, making it recommended as the standard communication for Industrie 4.0 and increasingly adopted worldwide. Additionally, it is aligned with the international standard for PLCs, IEC61131-3, which provides the advantage of reliably exchanging information from the manufacturing site with higher-level monitoring control systems and Manufacturing Execution Systems (MES). In response to this trend, Takaya has prepared an option to equip the APT series of flying probe testers with an OPC UA server. We are working to promote the spread of industrial IoT standards that bridge FA equipment and IT.