TAKAYA Corporation List of Products and Services

The electronic circuit board that serves as the basis for controlling electronic devices is one of the important components used in a wide range of fields. The "Flying Probe Tester" is an inspection machine that quickly and reliably detects various defects that occur during the manufacturing of this board. Takaya Corporation developed and began selling this "Flying Probe Tester" in 1987. Even today, it is a pioneering presence in the assembly board inspection machine industry, boasting a top-class market share. 【Features of the Flying Probe Tester】 ■ Measurement system capable of detecting various component defects ■ Ultra-fast and accurate probe contact control ■ Utilizes unique vertical probes to significantly expand the inspection area ■ Equipped with an interface compatible with smart factory applications ■ Unique clamping mechanism that accommodates special-shaped boards ■ Function test capabilities with expandability ■ AOI (Automated Optical Inspection) functionality included ■ +α A diverse lineup and options that can also accommodate large boards If you are interested in the flying probe type in-circuit tester or are facing challenges with electrical inspection of assembly boards, please feel free to contact us.

We have completely revamped the platform compared to the conventional model, increasing the probe movement speed by up to 50% and dramatically improving contact position accuracy. With a new high-precision, wide-range measurement system that offers great flexibility and a groundbreaking 4-head 6-flying probe mechanism, we can significantly reduce inspection costs and enhance quality in the assembly process, regardless of substrate variety or production volume. ★You can bring your own substrates for evaluation tests at our demo rooms in Okayama headquarters and Tokyo branch★ We can conduct a series of tests, including creating inspection programs, inspecting using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

The APT-1340J maintains its basic performance while expanding the compatible board size to W635×D610mm. Additionally, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of 60mm and board weights of up to 10kg, making it suitable for inspecting boards used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★You can bring your boards to our demo room at our Okayama headquarters for evaluation tests★ We can conduct a series of tests including creating inspection programs, inspecting actual boards, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below. *For product information, please download the PDF or feel free to contact us.*

Four probes are arranged on the top side of the substrate and two on the bottom side. Each probe can move freely and at high speed, achieving an astonishing inspection speed that is world-class in its category. By using the flying probes on both the top and bottom simultaneously, a combination inspection with up to six probes allows for simultaneous contact inspection at both points on the top and bottom sides of the substrate. This significantly expands the inspection range and further accelerates inspection time. It is equipped with a wealth of features and boasts world-class standards in speed and positioning accuracy. ★ You can bring your substrate to our demo room at our Okayama headquarters for evaluation testing ★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

The simultaneous use of upper and lower flying probes enables a combination inspection of up to 6 probes, allowing for the inspection of components that can make contact at both points on the top and bottom of the substrate. This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long substrates up to W985×D610mm. It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★Evaluation tests can be conducted by bringing your substrates to the demo room at our Okayama headquarters★ The entire process from creating inspection programs, inspecting using actual substrates, to summarizing evaluation results can be tested in a single flow. If you are interested, please apply through the 'Contact Us' section below.

OPC UA (OPC Unified Architecture) is an open international standard developed for safe and reliable data exchange in industries such as industrial automation. It was announced by the OPC Foundation in 2008 and later standardized as IEC62541. It allows for secure and highly reliable data exchange across different types of devices, operating systems, and manufacturers, making it recommended as the standard communication for Industrie 4.0 and increasingly adopted worldwide. Additionally, it is aligned with the international standard for PLCs, IEC61131-3, which provides the advantage of reliably exchanging information from the manufacturing site with higher-level monitoring control systems and Manufacturing Execution Systems (MES). In response to this trend, Takaya has prepared an option to equip the APT series of flying probe testers with an OPC UA server. We are working to promote the spread of industrial IoT standards that bridge FA equipment and IT.

Takaya Corporation (Headquarters: Ibara-cho, Ibara City, Okayama Prefecture; President: Ryuji Okamoto) has received the 20th "JPCA Award" for its "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing." The awarded "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing" integrates the flying probe tester with JTAG boundary scan testing, allowing for the mutual complementarity of each inspection method to maximize test coverage for high-density mounted boards and enable more accurate fault diagnosis. A panel introducing the award will be displayed at the "JPCA Show 2024 (Total Solution Exhibition for Electronic Devices 2024)" held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday). Our company will also have an exhibition booth at the event, showcasing a live flying probe tester. We invite you to come and see it.

Takaya Corporation will exhibit a corporate booth at the "MES024 34th Microelectronics Symposium," which will be held for three days from September 11 (Wednesday) to September 13 (Friday), 2024, at the Daido University Takiharu Campus in Minami Ward, Nagoya City. If you visit the symposium, please be sure to stop by Takaya's booth. Organizing Office (General Incorporated Association) Electronics Packaging Society 3-12-2 Nishiogikita, Suginami-ku, Tokyo 167-0042 TEL: 03-5310-2010 For details and the latest information, please visit the MES2024 website.

The APT-2400F is a next-generation flying probe tester that boasts industry-leading probing accuracy capable of inspecting high-density mounted circuit boards. With its unique control mechanisms and sensing technology, it achieves highly reliable electrical testing in all environments. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your circuit boards. We can conduct a series of tests including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototyping to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.*

Takaya Corporation has announced a new model of its flying probe tester, the "APT-2400F/APT-2600FD series," which reliably detects various defects in printed circuit boards through ultra-high-speed inspection. Equipped with cutting-edge inspection technology that can check the placement and connections of fine components with high precision, it ensures that even minor defects and risks are not overlooked, strongly supporting the improvement of product quality. Additionally, thanks to the company's unique control mechanisms and sensing technology, reliable inspections can be achieved even in fluctuating environments, contributing to quality management by reducing recall risks. Furthermore, it features a user-friendly interface that anyone can intuitively operate, helping to alleviate burdens in workplaces where labor shortages are becoming serious, while still ensuring high inspection accuracy and contributing to increased productivity. *For more details, please download the PDF document or feel free to contact us.*

The APT-2400F-SL is a large model that maintains the basic performance of the APT-2400F while expanding the compatible board size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long boards up to W985×D610mm. It can accommodate component heights of up to 60mm on the top and 120mm on the bottom, and can handle board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing with actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

The APT-2600FD-SL is a large model that maintains the basic performance of the APT-2600FD while expanding the compatible board size to W635×D610mm. Furthermore, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of 60mm and board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing with actual boards, and summarizing evaluation results. On July 31, 2025, at the Keidanren Kaikan in Otemachi, Chiyoda-ku, Tokyo, this product received the "Nikkankogyo Shimbun 110th Anniversary Award" at the "55th Mechanical Industry Design Award IDEA" ceremony. The judging committee praised the design philosophy that balances inspection efficiency and reliability, providing an opportunity for our technological and product design capabilities to be widely recognized. *For more details, please feel free to contact us.*

Takaya Corporation exhibited at the "39th Internepcon Japan Electronics Manufacturing and Packaging Exhibition" held at Tokyo Big Sight from January 22 (Wednesday) to January 24 (Friday), 2025. Exhibited Products Industrial Equipment Division - Flying Probe Tester - New model "APT-2600FD-A" *First exhibition in Japan RF Division / Solutions Division - RFID Products - RFID × IoT Platform - RFID Continuous Monitoring Middleware - RFID Outgoing Management System - RFID Inbound/Outbound Plugin Package Thank you very much to all the customers who visited our booth. If you have any questions regarding the exhibited products, please feel free to contact us.

The "APT-2600FD" dual-side flying probe tester has received the "Nikkankogyo Shimbun 110th Anniversary Award" at the "55th Mechanical Industry Design Award IDEA" hosted by the Nikkankogyo Shimbun. The "APT-2600FD" dual-side flying probe tester is an in-circuit tester that accurately inspects the continuity and resistance values of printed circuit boards. The "flying probe" testing technology, which uses high-speed contact probes, was developed by Takaya as the world's first and continues to hold a top-class share globally. This product has undergone a model change for the first time in ten years, incorporating numerous advanced technologies, including sophisticated control functions to prevent board damage and a high-resolution image inspection system. It achieves a balance between inspection accuracy and work efficiency, establishing a new standard for quality assurance in electronic device manufacturing. This award is a testament to the high evaluation of our technological capabilities and product design, serving as a significant encouragement for further technological innovation in the future. We would like to express our heartfelt gratitude to all those involved in the development, manufacturing, and implementation of this product, as well as to the judges who provided valuable feedback and evaluations during the award process.