SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.
- It is possible to evaluate the chemical bonding states focusing on specific elements in the sample (especially light elements such as B, C, N, O). - The spectral shape reflects the partial density of states of the targeted elements in the valence band. - Evaluation of the band structure is also possible through simultaneous measurement with X-ray absorption spectroscopy (XAS). - Since information from the bulk is obtained, it is less affected by the influence of the surface region within a few nanometers. - Evaluation can be performed without being affected by charging effects, even for insulators. - The detection limit is low (<1 atomic%), allowing for the evaluation of trace components.
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basic information
We use synchrotron radiation as an excitation source with characteristics such as variable energy and high intensity to generate luminescence.
Price information
The price varies depending on the measurement target, so please feel free to contact us.
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Applications/Examples of results
- Evaluation of gap states in dilute magnetic semiconductor Ga1-xCrxN - Local structure analysis of trace boron in HOPG (highly oriented pyrolytic graphite) - Evaluation of chemical bonding states of trace light elements in oxide semiconductors - Band structure evaluation of various thin film samples (combined analysis with XAS)
Detailed information
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Please consult with us first. ★ We will start with a proposal for an analysis plan ★ Meetings at your company are, of course, possible. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★We offer free seminars with engineers tailored to our customers' needs★ Depending on your requests, we will introduce analysis techniques and explain analysis data. ◆Examples of seminar content - A broad explanation of MST analysis methods - A detailed explanation of specific analysis methods from the principles - An explanation of the analysis data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
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