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  6. Surface mount electronic component cross-sectional observation service

Surface mount electronic component cross-sectional observation service

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last updated:Jun 26, 2025

アイテス
アイテス
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You can closely observe the solder joint condition of electronic components on the implementation board and the internal structure of the components!

Our company conducts "cross-sectional observation of surface-mounted electronic components." Through cross-sectional observation after mechanical polishing, it is possible to closely examine the solder joint condition (presence of cracks and voids) of electronic components on the mounted substrate, as well as the internal structure of the components. For "SOP components," detailed observation can be made from the overall cross-section to the solder connection, while for "aluminum electrolytic capacitors," it is possible to observe the internal structure of the electrolytic capacitor components and their connection to the substrate. 【Features】 ■ SOP (Small Outline Package) components - Detailed observation can be made from the overall cross-section of SOP components to the solder connection. ■ Chip ceramic capacitors - Detailed observation can be made from cracks in the component material to cracks in the solder area. ■ Aluminum electrolytic capacitors - Observation can be made from the internal structure of the electrolytic capacitor components to their connection to the substrate. *For more details, please refer to the PDF document or feel free to contact us.

    Contract InspectionOther contract services
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Surface mount electronic component cross-sectional observation service

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  • Related Link - https://www.ites.co.jp/section/index/%e8%a6%b3%e5%…
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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catalog(20)

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Surface mount electronic component cross-sectional observation service

Surface mount electronic component cross-sectional observation service

PRODUCT
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Observation of aluminum welding joints

Observation of aluminum welding joints

TECHNICAL
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Cross-sectional observation of large samples (expansion valve)

Cross-sectional observation of large samples (expansion valve)

TECHNICAL
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Observation of tracking camera cross-section by mechanical polishing.

Observation of tracking camera cross-section by mechanical polishing.

OTHER
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Example of failure analysis of chip resistors

Example of failure analysis of chip resistors

TECHNICAL
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Measurement of solder crack rate by cross-sectional observation.

Measurement of solder crack rate by cross-sectional observation.

TECHNICAL
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Observation of CMOS image sensor cross-section by mechanical polishing.

Observation of CMOS image sensor cross-section by mechanical polishing.

TECHNICAL
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Confirmation of chiplet package structure by mechanical polishing.

Confirmation of chiplet package structure by mechanical polishing.

TECHNICAL
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Solder Heat Resistance Test (SMD)

Solder Heat Resistance Test (SMD)

TECHNICAL
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Cross-sectional observation of substrate-mounted components.

Cross-sectional observation of substrate-mounted components.

TECHNICAL
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Cross-sectional observation of substrate-mounted components (1) to (6)

Cross-sectional observation of substrate-mounted components (1) to (6)

TECHNICAL
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Ink immersion test for implemented components (dye and pry)

Ink immersion test for implemented components (dye and pry)

OTHER
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Evaluation of various implementation boards

Evaluation of various implementation boards

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Evaluation of BGA/CSP solder

Evaluation of BGA/CSP solder

TECHNICAL
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3D construction through mechanical grinding

3D construction through mechanical grinding

TECHNICAL
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Examples of semiconductor observation through mechanical polishing.

Examples of semiconductor observation through mechanical polishing.

OTHER
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Example of analysis of compounds at the interface between SAC solder and Ni pads.

Example of analysis of compounds at the interface between SAC solder and Ni pads.

TECHNICAL
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Total support service for cross-section grinding, processing, observation, and analysis.

Total support service for cross-section grinding, processing, observation, and analysis.

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Comparison of cross-sectional observation images

Comparison of cross-sectional observation images

OTHER
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Observation of ceramic substrates

Observation of ceramic substrates

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News about this product(9)

Confirmation of chiplet package structure by mechanical polishing.

  • Product news

Regarding the chip mounted on the main circuit board of the VR goggles manufactured by Company A, upon visual observation, it was inferred that it has a chiplet structure with multiple chips integrated. To examine the structure in more detail, we created a cross-section using X-ray CT observation and mechanical polishing, and we will introduce the structural confirmation results. *For more details, please download the PDF or feel free to contact us.*

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Observation of tracking camera cross-section by mechanical grinding.

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I would like to introduce "Cross-sectional observation of tracking camera using mechanical polishing." Regarding the structure of the tracking camera components, when viewed from above, the lens can be identified. Although it cannot be clearly seen in the X-ray image, the lens is incorporated into the convex part. Additionally, the cross-sectional structure is similar to that of an RGB sensor, featuring a back-illuminated CMOS structure. However, since color information is not necessary for the tracking camera, there is no color filter layer. A jagged uneven shape was observed on the surface of the photodiode.

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Observation of CMOS image sensor cross-section by mechanical polishing.

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At our company, we created a cross-section of the CMOS image sensor component associated with A company's VR goggles through mechanical polishing while keeping the component intact, and we conducted structural observations of the CMOS sensor component. During the observation of the sensor component structure and sensor surface, we removed the glass filter and observed the CMOS sensor surface, where it was noted that the arrangement of the color filters was in a configuration known as a Bayer filter. In addition to mechanical polishing, methods for creating cross-sections include processing with ion beams such as FIB and CP, as well as microtome methods. Consultations are free, so please feel free to contact us if you are unsure about the cross-section creation method.

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Evaluation of various implementation substrates

  • Company news

At Aites Co., Ltd., we provide a wide range of technical services for evaluation tests of printed circuit boards (mounted boards) equipped with electronic components. We conduct reliability tests, solder joint observations, whisker observations, and cross-sectional observations. We have IPC-A-610 certified IPC specialists on staff who can assist with observations in accordance with international standards, consultations, and various observation-related concerns. Additionally, we offer services such as X-ray observations, appearance inspections, and shape measurements, so please feel free to consult with us when needed.

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Companynews list (108)

Company information

アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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