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  5. Tester
  6. High-Speed OPEN/LEAK Tester "R-5940"

High-Speed OPEN/LEAK Tester "R-5940"

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last updated:Nov 05, 2024

ニデックアドバンステクノロジー 本社、東京営業所、名古屋営業所
ニデックアドバンステクノロジー 本社、東京営業所、名古屋営業所
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IC multi-function inspection support! Equipped with an LCR meter developed in-house.

The R-5940 is a super tester specialized for IC embedded substrates. It meets the diverse needs of high-precision IC testing with high-speed continuity and short-circuit measurements, μΩ accuracy, high-speed testing with four-terminal measurements, and all-CH LCR measurements. By connecting up to 16 SMUs as power supplies and electronic loads to the DUT, it enables the implementation of power ON/OFF sequences, allowing for DUT measurements with freely combined SMUs. 【Features】 ■ High-speed testing ■ High precision ■ Specialized for IC embedded *For more details, please download the PDF or feel free to contact us.

    Tester
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High-Speed OPEN/LEAK Tester "R-5940"

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  • Related Link - https://www.nidec.com/jp/nidec-advancetechnology/p…

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IC Multi-Function Inspection Compatible High-Speed OPEN/LEAK Tester 'R-5940'

IC Multi-Function Inspection Compatible High-Speed OPEN/LEAK Tester 'R-5940'

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ニデックアドバンステクノロジー

ニデックアドバンステクノロジー 本社、東京営業所、名古屋営業所

Industrial Machinery

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Our inspection target areas include printed circuit boards, semiconductor packages, and display panels. These are core components of information and communication devices that are growing increasingly due to advancements in IT, as well as widely adopted digital home appliances. Printed circuit boards, semiconductor packages, and display panels are evolving at an astonishing speed, and higher precision technologies are required in inspections. Our company holds a significant share in these inspection fields that demand cutting-edge technology, and we have delivered numerous products recognized as "de facto standards" in the industry worldwide.

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