Flatness and warpage full measurement | Concept of measuring inline
To measure flatness and warpage for all items, a 3D measurement that can capture the height of the entire surface at once is preferable. Unlike measuring several points on the surface, this method allows us to determine the maximum and minimum deviations from the reference plane based on the overall shape. The results can vary depending on how the item is placed. For thin items that may sag under their own weight, the placement must be decided in advance. 【Key Points】 - Flatness and warpage are derived from the height of the entire surface. - For thin items, the warpage values can change based on how they are placed. - Reflective or transparent surfaces may have missing points that cannot be measured. *For detailed explanations, please refer to the technical notes and downloadable materials in the related links.
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basic information
【Contents of this Technical Note】 ■ Flatness and warpage refer to the variation in height across the entire surface. ■ The method of measurement changes the meaning of the results. ■ The way it is placed affects the value of warpage. ■ Conditions for measuring inline. ■ Cases where it is unsuitable or surfaces that cannot be measured. ■ How to verify whether the flatness numbers can be trusted. ■ Confirming the full measurement of flatness and warpage with the actual item. 【Consultation】 We will verify whether it can be measured or captured with the work at hand using the actual item. Please consult us with a photo.
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The technical notes can be read by anyone from the related links. We will discuss the costs of development and testing based on the details you provide.
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【Frequently Asked Questions】 Q. Do the measurements from sampling and the measurements from the entire lot match? A. If the measuring method and placement are different, they may not match. It is best to measure the same item with both methods and confirm the reasons for any differences. Q. Can you measure items with small warping? A. If the warping exceeds the measurement variability, it can be quantified. Warping below that level cannot be answered without checking the actual item. Q. How should measurement data be recorded? A. It is practical to retain the judgment value and the position of the maximum deviation. Keeping all data points will result in large data sizes.
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We specialize in 2D and 3D inspection and measurement technologies using cameras. We possess a wide range of knowledge in optics, mechanics, electronics, and software, enabling us to provide technical support for both hardware and software. Not only do we have personnel with experience working as researchers at image inspection device manufacturers, major electronic component manufacturers, and universities, but we also have numerous successful implementations of developed products in actual production environments, making our ability to adapt advanced technology to on-site needs a strong point. Additionally, we are skilled not only in developing proprietary algorithms but also in using off-the-shelf products such as image processing controllers from Keyence and Omron, allowing us to excel in selecting and utilizing the most suitable equipment for specific needs. In recent years, while AI technology has garnered attention, there are cases where utilizing 2D and 3D technologies can be implemented more easily than AI, and cases where optical devices and mechanical jigs can improve performance and reduce software load. We offer services related to image systems, including "equipment selection," "implementation support," "performance improvement of existing equipment," "technology development," and "joint development," so please feel free to consult with us first.


