List of Electronic Components and Modules products

Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

• air conditioning

Evaluation of microscopic atomic structures is possible through computational simulation.

• Contract Analysis
• Other semiconductors

Reverse engineering of DRAM on the product's internal substrate.

• Contract Analysis
• Memory

It is possible to obtain insights into the size and distribution of crystal grains in metallic polycrystals.

• Contract Analysis
• Memory

Case studies observed using X-ray CT.

• Contract Analysis
• Secondary Cells/Batteries

The temperature dependence evaluation of the desorption of specific organic components is possible through composite analysis.

• Contract Analysis
• Secondary Cells/Batteries
• LCD display

Detailed illustrations of the schematic diagram near the electrolyte interface and the solvation structure in the electrolyte are provided!

• Lithium-ion battery

It is possible to evaluate the shape change and strain energy when external forces are applied to nanomaterials.

• Contract Analysis
• others
• Secondary Cells/Batteries

We will evaluate the internal structure of the device in a comprehensive manner.

• Contract Analysis
• Other electronic parts

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

• Contract measurement
• Transistor
• Memory

Simultaneous measurement of inorganic and organic components in minute specific areas.

• Contract measurement
• Wafer
• Memory

Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!

• Secondary Cells/Batteries

We evaluate abnormalities inside the device non-destructively.

• Contract Analysis
• Other electronic parts
• Transistor

Composite approach to the cross-sectional structure and surface shape of the negative electrode, as well as elemental mapping images of the active material cross-section!

• Secondary Cells/Batteries
• Contract measurement

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

• Wafer
• Contract measurement
• Other semiconductors

Shape observation and simple quantitative analysis using SEM-EDX.

• Contract Inspection
• Wafer
• Other semiconductor manufacturing equipment