List of Measurement and Analysis products

For those who have isolators. Achieving high chemical resistance and workability. Low cost and short delivery times are also possible for glove box and isolator gloves.

• Work gloves

We will convert the transient absorption spectroscopy measurement to an advanced two-dimensional spectroscopic device.

• Other measurement, recording and measuring instruments

FMCW (Frequency Modulated Continuous Wave) radar transceivers are sub-THz devices. They are suitable for non-contact and non-destructive testing, as well as 3D imaging.

• Other inspection equipment and devices

A wide range of Vibration Control products.

• Analytical Equipment and Devices

High-precision analysis of particle shapes in the size range of 0.55 to 34,000 μm.

• Particle Counter

High-speed semiconductor laser capable of digital/analog modulation.

• Other measurement, recording and measuring instruments

Supports samples up to 100mm square in measurement modes such as C-AFM, KFM, and sMIM.

• Visual Inspection Equipment

Up to 6 wavelengths, the highest class of maximum 1W high-output LED light source on the market. Guarantees high stability and high reproducibility of output with temperature control of the LED chip a...

• Laser microscope

A compact housing that combines up to 5 wavelengths of DPSS/LD laser modules (375 to 808 nm) with a maximum of 2500mW per wavelength.

• Laser microscope

A compact diode laser capable of both picosecond and continuous wave oscillation. Wavelengths are available in the range of 375 to 2090 nm. Maximum CW output is 500 mW.

• Laser microscope

This is a fully integrated autocollimator for inspection and alignment with a resolution of 0.01 arc seconds or higher. It is compatible with AR/VR applications and can also measure multiple lasers.

• Optical Measuring Instruments

A diverse wavelength lineup from 375 to 830 nm. It is also possible to consolidate into a single housing. Output 25 mW to 260 mW.

• Laser microscope

Achieves high-speed scanning and high resolution imaging using atomic force microscopy. Compatible with measurements in air and liquid.

• probe

A solid-state single-photon source designed to deterministically generate single photons for quantum applications.

• Other measurement, recording and measuring instruments

Achieving stable oscillation and further miniaturization!

• Analytical Equipment and Devices

High-end camera developed for measurement and inspection with the highest sensitivity, accuracy, spatial resolution, and speed.

• Thermography

High-resolution, high-performance, high-speed, high-precision optical wavelength meter.

• Optical Measuring Instruments

DPSS EO-Q switch nanosecond laser, ideal for applications such as distance measurement.

• Distance measuring device

Wavelength measurement and spectral analysis can be performed with a single unit. It covers the wavelength range from visible light (VIS) to mid-infrared (MIR), from 375 nm to 12 μm.

• Other inspection equipment and devices

Optimal for QCL with high wavelength accuracy, high light removal ratio, and a wavelength range of 1 to 12 μm. Capable of measuring pulsed lasers (>50Hz) and CW lasers.

• Other measurement, recording and measuring instruments

DPSS / LD laser module with up to 6 wavelengths. Wavelengths: 355 to 1550 nm in a compact single package.

• Laser microscope

Compact package containing a maximum of 7 wavelengths of DPSS / LD laser modules (375 to 1550 nm). Up to 300mW per wavelength.

• Laser microscope

It is a compact and cost-effective simple atomic force microscope (AFM). It is ideal for research and educational purposes, as well as for use as a secondary instrument.

• Other microscopes

The YOA-8401 series is a Raman spectrometer equipped with a narrow linewidth laser. It offers models with excitation wavelengths of 785 nm and 532 nm.

• Spectroscopic Analysis Equipment

High-precision interferometer for inspecting the end face quality of optical fibers and optimizing the cutting process.

• Other inspection equipment and devices

Compact and highly stable single-frequency diode-pumped solid-state (DPSS) laser. Ideal for Raman spectroscopy, interference experiments, lithography, and quantum research.

• Laser microscope

Robust armor exterior, compatible with various types of fibers, emission beam diameter from 0.4 to 5.0 mm, supported output (transmission light): 30 to 400 W.

• Optical microscope

OEM support available. Usable in spectroscopy, interferometry, confocal and fluorescence microscopy, bioanalytical research, particle measurement, industrial measurement, holography, and scientific ed...

• Analytical Equipment and Devices

Maximum 2-channel PCI board type module. Two models with base resolution of nanoseconds or picoseconds.

• Optical Measuring Instruments

24-bit AFM controller compatible with discontinued Agilent Technology AFMs, can be replaced.

• Other measurement, recording and measuring instruments

AFM-IR device Spectroscopic Nanoscopy PiFM・PiF-IR

• Other microscopes

Wavelength 375 to 1550 nm. Capable of mounting up to 6 high-power lasers. Supports multi-mode. Wide-field laser illumination.

• Laser microscope

Ultra-low jitter digital sampling oscilloscope. Optimizes test throughput (processing capability). Supports embedded applications.

• oscilloscope

PDT, PIT, and PTT research multi-channel desktop laser. Ideal for research and development in photodynamic therapy, photoimmunotherapy, and photothermal therapy.

• Laser microscope

12-inch wafer. AFM-IR device compatible with 300 mm × 300 mm. Ideal for research and development in nanofabrication and failure analysis.

• Visual Inspection Equipment

A high-precision diffraction system that can comprehensively evaluate the quality of AR light guide plate gratings.

• Optical Measuring Instruments

Achieving automatic image quality testing for AR light guide plates.

• Optical Measuring Instruments

AR/XR glasses, multi-purpose imaging and testing station for subassemblies

• Optical Measuring Instruments

Optical microscope with a resolution of ≦100nm, capable of non-destructive observation in full color.

• Optical microscope

Defect inspection imaging device that visualizes defects in substrates such as glass substrates, semiconductor substrates, and display substrates.

• Circuit Board Inspection Equipment

Optical transceiver test wavelength meter for communication wavelength band compatibility

• Optical Measuring Instruments

OEM Embedded Support Single Cavity Femtosecond Laser

• Spectroscopic Analysis Equipment

Wide response wavelength range, high sensitivity with amplifier, digital & analog output. Versatile photodetector, price excluding tax starting from ¥478,000!

• Optical Measuring Instruments

This is a large sample-compatible model that allows for AFM-IR measurements to be conducted by placing an 8-inch (200mm) wafer directly onto the sample stage.

• Other microscopes

Original PiFM AFM for nanoscale IR chemical analysis

• Other microscopes

High-performance thermography that can obtain high-resolution, high-definition, and high-precision thermal images.

• Thermography