List of 3D measuring device products
- classification：3D measuring device
181～225 item / All 898 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
Modeling from 3D scan data! Streamlining toy prototyping.
- 3D measuring device
- Other CAD related software
- 3D CAD
Streamlining reverse engineering from 3D scan data.
- 3D measuring device
- Other CAD related software
- 3D CAD
The industry's first photo measurement and mapping system has arrived!
- 3D measuring device
Industrial CT data analysis and visualization software. Strongly supports internal observation.
- Analytical Equipment and Devices
- 3D measuring device
- Image analysis software
CT data analysis software that strongly supports quality control of automotive parts.
- Analytical Equipment and Devices
- 3D measuring device
- Image analysis software
High-speed display of various 2D/3D data! For simulation of machine tools.
- 3D measuring device
- Other CAD related software
- 3D CAD
In-house developed series of 3D shape inspection devices! A dimensional inspection device that accommodates high-difficulty work such as metallic luster and cylindrical shapes without contact.
- 3D measuring device
Creating drawings of things that are not on the drawings! Realizing 'reverse engineering' with a 3D scanner measuring device.
- 3D CAD
- 3D measuring device
Automated pallet measurement system to support efficient loading into containers.
- 3D measuring device
Streamlining cargo inspection with high-speed measurement.
- 3D measuring device
Automated pallet dimension measurement system to improve return and storage efficiency.
- 3D measuring device
Speeding up the measurement, weighing, and barcode scanning of pallets.
- 3D measuring device
Accelerate, streamline, and accurately identify chemical product containers.
- 3D measuring device
![[Agricultural] TLD870 Pallet Dimens...](https://image.mono.ipros.com/public/product/image/212619/IPROS9318741464267879236.png?w=280&h=280){kind=small}
Automated pallet measurement system to support efficient management of harvested products.
- 3D measuring device
Improving storage efficiency in warehouses through high-speed measurement.
- 3D measuring device
Improving shipping and receiving efficiency and achieving cost reduction through high-speed measurement.
- 3D measuring device
A pallet measurement solution to enhance the traceability of pharmaceuticals.
- 3D measuring device
Automated pallet dimension measurement system to streamline food quality management.
- 3D measuring device
High-speed and efficient measurement, weighing, and barcode reading of pallets.
- 3D measuring device
Achieving tracking and efficiency of pallets through high-speed measurement.
- 3D measuring device
Visualize the anilox and protect print quality with numbers.
- 3D measuring device
![[For Research Institutions] Real Na...](https://image.mono.ipros.com/public/product/image/248027/IPROS577054615448303967.jpg?w=280&h=280){kind=small}
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enabling nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enables nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enabling nanoscale "actual measurements" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical methods enable the measurement of nanoscale fine structures.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale measurements with optical methods. For evaluating reflection characteristics.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Measured nanoscale shape accuracy using optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
3D modeling and drafting of products without drawings (e.g., manufacturing drawings for discontinued parts)
- 3D measuring device
- 3D CAD
Large workpieces can also be measured with high precision without contact!
- 3D measuring device
Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.
- 3D measuring device
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor