List of Inspection Equipment and Devices products
- classification：Inspection Equipment and Devices
1636～1650 item / All 8364 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Ideal for micro-machining! Achieves deburring of holes and double-sided machining in one pass, which was difficult with conventional tools!
- Other machine tools
We will be exhibiting at Mecatronics Tech Japan 2021 from October 20 (Wednesday) to October 23 (Saturday)!
Our company will exhibit at "Mechatrotech Japan 2021," which will be held at Portmesse Nagoya from Wednesday, October 20 to Saturday, October 23, 2021. We will introduce our tools, including the 'Bar Off Tool' capable of chamfering and deburring from a diameter of 0.8 mm, and the 'FEM' tool breakage detection device that reliably detects breakage. We look forward to your visit. (Booth number: 2B12)
Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.
- Circuit Board Inspection Equipment
Notice of Joint Research Report and Seminar Presentation with Ehime University (JPCA Show 2024 / 2024 Microelectronics Show)
Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on "Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning." We are pleased to announce that a report on this research will be displayed and introduced at the Ehime University booth during the JPCA Show 2024 / 2024 Microelectronics Show, which will be held from June 12 (Wednesday) to June 14 (Friday) at Tokyo Big Sight. Additionally, a seminar presentation related to this topic will take place on June 14 (Friday) at the venue. Takaya will also be exhibiting at the same exhibition, showcasing a real flying probe tester. We hope that all attendees will visit the booth and seminar venue. *Ehime University Booth Booth Number: 3B-56 (Academic Plaza) *Seminar Date and Time: June 14 (Friday) 13:20-13:40 Venue: Seminar Room E Session: 3DMID Seminar / Academic Plaza *Takaya Corporation Booth Booth Number: 4C-38 (Hall 4 East)
A highly versatile real-time terahertz imaging system, suitable for high-resolution applications.
- Other inspection equipment and devices
![[Demo unit available] TCSPC & High ...](https://image.mono.ipros.com/public/product/image/dcc/2000643183/IPROS23124138733711316035.jpeg?w=280&h=280){kind=small}
The MultiHarp 150 is a multi-channel event timer and time-correlated single photon counting device (TCSPC module).
- Other inspection equipment and devices
It is a simple inspection tool that enables 3D sub-terahertz NDT non-destructive testing sensing and imaging.
- Other inspection equipment and devices
A compact and high-performance flight time mass spectrometer. It can monitor gas composition in real-time with high resolution and high sensitivity.
- Other inspection equipment and devices
FMCW (Frequency Modulated Continuous Wave) radar transceivers are sub-THz devices. They are suitable for non-contact and non-destructive testing, as well as 3D imaging.
- Other inspection equipment and devices
Supports samples up to 100mm square in measurement modes such as C-AFM, KFM, and sMIM.
- Visual Inspection Equipment
Achieves high-speed scanning and high resolution imaging using atomic force microscopy. Compatible with measurements in air and liquid.
- probe
Wavelength measurement and spectral analysis can be performed with a single unit. It covers the wavelength range from visible light (VIS) to mid-infrared (MIR), from 375 nm to 12 μm.
- Other inspection equipment and devices
High-precision interferometer for inspecting the end face quality of optical fibers and optimizing the cutting process.
- Other inspection equipment and devices
12-inch wafer. AFM-IR device compatible with 300 mm × 300 mm. Ideal for research and development in nanofabrication and failure analysis.
- Visual Inspection Equipment
Defect inspection imaging device that visualizes defects in substrates such as glass substrates, semiconductor substrates, and display substrates.
- Circuit Board Inspection Equipment
High-speed laser defect scanner compatible with photoluminescence mapping.
- Circuit Board Inspection Equipment