List of Microscopes products
- classification：Microscopes
376～390 item / All 1913 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
Until now, I had been working while looking through a magnifying glass, but aligning positions at the level of several tens of microns has become significantly easier.
- Microscope
No need for core removal, improving efficiency! Quickly check the processing status without removing the workpiece.
- Microscope
We visualize and quantify the effects of blood flow changes using our health devices (thermal, hydrogen-oxygen inhalation machine) with the GOKO Bscan-ZD capillary scope.
- Microscope
Measure vibration and displacement using an interference method, and check the data in real-time on the monitor.
- Testing Equipment and Devices
- Optical microscope
- Other measurement, recording and measuring instruments
◆New Product Information◆ Added product page for the vibration controller "RL-C21"!
This is a flexible vibration controller and data acquisition system that can be used in combination with your existing shaker. Since you can freely set the frequency, it is possible to create a unique program that is not available elsewhere. There are also many other features, so please check the product page for more details.
We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!
- Other microscopes
- Resist Device
- Semiconductor inspection/test equipment
This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.
- Other microscopes
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
It is possible to observe cross-sections while observing FIB processing in real time.
- Contract Analysis
- Other contract services
- Electron microscope
Power device failure location / Slice & View three-dimensional reconstruction
I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.
Introducing examples of measurement cases for important management items in the production of lithium-ion batteries and all-solid-state batteries!
- Laser microscope
- Other measurement, recording and measuring instruments
Measurement of specific surface area of powdered zeolite by the BET method.
Our company conducts specific surface area measurements of powdered zeolite using the BET method. In addition to powdered zeolite, it can also be used for specific surface area measurements of catalysts and activated carbon, and by utilizing other applications, it is possible to measure not only specific surface area but also pore distribution. Furthermore, particle size and pore distribution can be evaluated using methods and equipment other than those mentioned. For more details, please refer to our catalog.
Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.
- Electron microscope
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
- Electron microscope
- Contract Analysis
- Contract Inspection
A microscope allows you to observe tiny defects that cannot be seen with the naked eye!
- Microscope
- Other microscopes
- Contract measurement
Non-destructive observation is possible! It is effective in detecting defects in internal conditions and adhesion states!
- Other microscopes
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment
![[Data] Cross-sectional observation ...](https://image.mono.ipros.com/public/product/image/5fd/2000561894/IPROS71970030245724406256.png?w=280&h=280){kind=small}
We have published cross-sectional observations in clear vision mode and normal/standard mode!
- Electron microscope
- Contract Analysis
- Contract Inspection
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment