List of Microscopes products
- classification：Microscopes
406～450 item / All 1898 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!
- Other microscopes
- Resist Device
- Semiconductor inspection/test equipment
This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.
- Other microscopes
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
It is possible to observe cross-sections while observing FIB processing in real time.
- Contract Analysis
- Other contract services
- Electron microscope
Power device failure location / Slice & View three-dimensional reconstruction
I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.
Introducing examples of measurement cases for important management items in the production of lithium-ion batteries and all-solid-state batteries!
- Laser microscope
- Other measurement, recording and measuring instruments
Measurement of specific surface area of powdered zeolite by the BET method.
Our company conducts specific surface area measurements of powdered zeolite using the BET method. In addition to powdered zeolite, it can also be used for specific surface area measurements of catalysts and activated carbon, and by utilizing other applications, it is possible to measure not only specific surface area but also pore distribution. Furthermore, particle size and pore distribution can be evaluated using methods and equipment other than those mentioned. For more details, please refer to our catalog.
Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.
- Electron microscope
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
- Electron microscope
- Contract Analysis
- Contract Inspection
A microscope allows you to observe tiny defects that cannot be seen with the naked eye!
- Microscope
- Other microscopes
- Contract measurement
Non-destructive observation is possible! It is effective in detecting defects in internal conditions and adhesion states!
- Other microscopes
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment
![[Data] Cross-sectional observation ...](https://image.mono.ipros.com/public/product/image/5fd/2000561894/IPROS71970030245724406256.png?w=280&h=280){kind=small}
We have published cross-sectional observations in clear vision mode and normal/standard mode!
- Electron microscope
- Contract Analysis
- Contract Inspection
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment
High-resolution imaging with a micro probe! Achieving nano-level structural analysis.
- Contract Analysis
- Contract measurement
- Other microscopes
This is the successor model of the popular gas pressure arm stand F10. It features a rotation mechanism for the optical tube, allowing for more flexible observation.
- Optical microscope
A unique microscope stand for observing samples from a horizontal direction.
- Optical microscope
Visualizing tiny, difficult-to-observe scratches on flat surfaces! Even scratches that are hard to identify in images can be distinguished by color.
- Other microscopes
It is a microscope stand that can be securely fastened to a table with screws.
- Other microscopes
4K camera, digital 3D microscope inspection platform "sinaSCOPE" with 3D display, manufactured by SOLECTRIX.
- 3D measuring device
- Electron microscope
- Electron microscope
It is a phase contrast microscope for counting dust, fibers, asbestos, etc. in the atmosphere.
- Optical microscope
Announcement of the successor product to "IF6PD4"! It will be purchased from Sherry Corporation.
- Microscope
- Other microscopes
Instantly detects defects and contributes to reduced analysis time. An all-in-one system that achieves overwhelming image quality, operability, and guaranteed measurement accuracy!
- Microscope
- Microscope
- Other microscopes
Not only direct visual observation but also an industrial rigid mirror that can be connected to a C-mount camera. *Product catalog is currently available.
- Other microscopes
- Microscope
- Microscope
Made of impact-resistant and bend-resistant image fiber! Suitable for visual inspection.
- Industrial Endoscope
- Endoscopes and fiberscopes
The world's smallest class micro-Raman spectroscopic Raman sensor! Compatible with all microscopes regardless of the manufacturer!
- Other microscopes
Instantly convert your microscope into a Raman device! World-class smallest Raman sensor! Compatible with all upright microscopes, regardless of the manufacturer!
- Other microscopes
Introducing a compact and lightweight model! With a 360° rotating hinge bracket, you can observe the subject from any angle! Free demo units available for loan!
- Microscope
4K digital microscope for weld penetration inspection
- Optical microscope
This is a gemological microscope equipped with standard features and specifications required for gem appraisal.
- Optical microscope
Full HD high frame rate digital phase contrast microscope. Capable of magnification switching and capturing still images and videos.
- Optical microscope
Long working distance, wide workspace, with lens protector. Microscope for soldering small electronic components.
- Optical microscope
An inverted fluorescence microscope equipped with three fluorescent filters and a high-quality Chroma fluorescent filter.
- Optical microscope
Each layer of the multi-layer culture device can be observed at 50 to 400 times magnification! Achieving portability and space-saving design!
- Culture Equipment
- Microscope
A fluorescence microscope with an upright design equipped with three fluorescent filters and featuring Chroma fluorescent filters and Nikkai LED light source.
- Other microscopes
A simple inverted LED fluorescence microscope equipped with a single fluorescence filter.
- Optical microscope
A simple upright fluorescence microscope equipped with a single fluorescence filter. It features a fluorescence filter from Chroma and an LED light source from Nichia.
- Optical microscope
Side-view camera with a diameter of 4mm.
- Industrial Endoscope
High-quality imaging even in narrow spaces.
- Industrial Endoscope
The best balance of usability and functionality.
- Industrial Endoscope
Everything is here. A video scope that stands at the pinnacle of the IPLEX series, meeting the expectations of professionals.
- Industrial Endoscope
Quickly and efficiently inspect distant locations.
- Industrial Endoscope
We also support in-process image inspections and in-process visual inspections!
- Other inspection equipment and devices
- 3D measuring device
- Microscope
It is possible to observe the processes of wetting, infiltration, and evaporation of tiny droplets on a substrate in a time series with microsecond resolution!
- Microscope
- Other microscopes
Scope exchange is possible! You can choose from two models suitable for the observation target.
- Other microscopes
A videoscope that enables efficient and economical tube inspection.
- Optical microscope
- Microscope
- Other image-related equipment