List of Contract Analysis products
- classification：Contract Analysis
76～90 item / All 662 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Applying advanced sample preparation techniques and failure analysis equipment for semiconductors! Investigating the causes of non-lighting and brightness degradation.
- Contract Analysis
- Analysis Services
Examples of semiconductor observation using mechanical polishing.
In the methods for cross-section preparation in semiconductor structure observation and defect analysis, CP, FIB, and mechanical polishing are mentioned, each having its own advantages and disadvantages, making it necessary to consider which method to use. In recent years, CP and FIB have become more common, and it seems that the use of mechanically polished methods, which require technical skill, is decreasing. However, it is still not something to be dismissed. While there are merits and demerits, it is possible to achieve cross-section preparation with mechanical polishing that is on par with FIB and CP. At our company, based on years of accumulated know-how, we propose the most appropriate processing method according to the observation purpose, sample composition, and structure.
With our advanced technology, we can also create cross-sections of highly challenging samples!
- Analysis Services
- Contract Analysis
Observation of tracking camera cross-section by mechanical grinding.
I would like to introduce "Cross-sectional observation of tracking camera using mechanical polishing." Regarding the structure of the tracking camera components, when viewed from above, the lens can be identified. Although it cannot be clearly seen in the X-ray image, the lens is incorporated into the convex part. Additionally, the cross-sectional structure is similar to that of an RGB sensor, featuring a back-illuminated CMOS structure. However, since color information is not necessary for the tracking camera, there is no color filter layer. A jagged uneven shape was observed on the surface of the photodiode.
![[Analysis Example by EBSD] Kanikan](https://image.mono.ipros.com/public/product/image/ada/2000560445/IPROS24200233374735850115.jpeg?w=280&h=280){kind=small}
Here is an example of analysis regarding the broken part of a crab claw that was damaged due to long-term use!
- Analysis Services
- Contract Analysis
Example of analysis of compounds at the SAC solder and Ni pad interface.
We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface of NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is a technique that analyzes based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, it may be possible to analyze using crystallographic data for Ni3Sn4 and Cu6Sn5 as substitutes.
Useful for long-term quality control! Ultra-microhardness measurement of materials such as metals, polymers, and ceramics.
- Contract Analysis
- Analysis Services
Tensile test
The "tensile test" is a test that measures the load and displacement (elongation) when a material is pulled at a constant speed, in order to determine the physical and mechanical properties of the material. By pulling the test specimen in a temperature-controlled chamber, it is possible to determine and understand the temperature dependence of these properties. Our company is capable of conducting material property tests under temperature-controlled conditions. We can also propose conditions tailored to the materials and properties you wish to measure. Please feel free to consult with us.
![[Defective Analysis Case] X-ray Obs...](https://image.mono.ipros.com/public/product/image/60f/2000560433/IPROS23663256669774859476.jpeg?w=280&h=280){kind=small}
Non-destructive X-ray observation is effective for initial inspection! We will introduce examples of defect analysis.
- Analysis Services
- Contract Analysis
Estimate bonding states by comparing with standard spectra! Introducing state analysis using EPMA.
- Analysis Services
- Contract Analysis
Detection sensitivity is excellent! It is particularly superior in quantitative analysis of trace components and map analysis.
- Analysis Services
- Contract Analysis
Supports 100×100mm size! The movable stage allows for extensive mapping.
- Analysis Services
- Contract Analysis
- Other contract services
We conducted an observation of the fracture surface of the crab claw that was damaged due to long-term use!
- Analysis Services
- Contract Analysis
We have a track record of large-scale analysis using supercomputers such as "Fugaku"! We are also skilled in computational utilization techniques.
- Contract Analysis
- Contract Analysis
Create a custom dataset from dashcam footage and sports matches!
- Image analysis software
- Contract Analysis
- Contract Analysis
We offer a standard measurement menu for measuring the spectral transmittance and reflectance of materials, as well as the scattering characteristics of transmittance and reflectance.
- Contract measurement
- Contract Analysis
SCORG is a measurement software for the design and analysis of screw compressors, expanders, pumps, and motors.
- simulator
- Thermo-fluid analysis
- Contract Analysis
Collecting resin data independently within the company and accumulating reliable 'CAE analysis examples' with our expertise!
- Contract Analysis
Because Sanko has a mold department within the organization! We have a wealth of analysis experience with a total of 5,171 cases.
- Contract Analysis
- Other analyses
- Contract Analysis