List of Tester products
- classification：Tester
1～45 item / All 115 items
Heat resistant up to 1200℃. We will custom-make high-performance insulation covers that ensure safety in the working environment!
- Glass
IC multi-function inspection support! Equipped with an LCR meter developed in-house.
- Tester
Compatible with flat cables! Equipped with automatic mechanisms, manual mechanisms, and desktop mechanisms, etc.
- Tester
Micro-capacity inspection with high resolution! Capable of inspecting various products such as thin-film RF filters and accelerometers.
- Tester
Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!
- Tester
Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26
Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=
High-performance wafer-level test system compatible with wafers from 8 inches to 12 inches!
- Tester
Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26
Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=
Supports PAM4/NRZ signals and covers the 1.6TBASE/CEI-224G standard!
- Tester
Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26
Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=
The versatile bond tester DAGE4000 has been completely redesigned, becoming more multifunctional and achieving higher precision, thus being reborn!
- Tester
It can handle various bonding strength tests in the assembly process of various semiconductor components and electronic parts, as well as in the mounting process on substrates, all with one machine!
- Tester
Leak tester that supports the reliability of aircraft maintenance.
- Calibration and repair
- Tester
- Other measurement, recording and measuring instruments
A mid-range model that pursues excellent stability and reduced working hours.
- Tester
- Circuit Board Inspection Equipment
A handler that thoroughly pursues excellent stability and reduced working hours.
- Tester
- Circuit Board Inspection Equipment
![[For AI] IC Test Handler NS-8080SH](https://image.mono.ipros.com/public/product/image/2058125/IPROS6648713953462063254.png?w=280&h=280){kind=small}
A mid-range handler that supports the efficiency of IC testing in AI development.
- Tester
- Circuit Board Inspection Equipment
A handler that thoroughly pursues excellent stability and reduced working hours.
- Tester
- Circuit Board Inspection Equipment
Streamlining IC testing for small home appliances while ensuring high quality.
- Tester
- Circuit Board Inspection Equipment
High-speed, high-precision IC test handler that supports the reliability of automotive components.
- Tester
- Circuit Board Inspection Equipment
A mid-range handler that thoroughly pursues excellent stability and reduced working hours.
- Tester
- Circuit Board Inspection Equipment
A mid-range IC test handler that pursues excellent stability and reduced working time.
- Tester
- Circuit Board Inspection Equipment
High-precision pressure calibration equipment that supports the safe operation of aircraft.
- Calibration and repair
- Tester
- Other measurement, recording and measuring instruments
Eliminating keypad operations, we have adopted an intuitive touchscreen method!
- Tester
One unit compatible with LIV·EA·spectrum — fully automatic, ultra-high efficiency tester, essential for mass production.
- Tester
A smart test system optimized for mass production screening of silicon photonics.
- Tester
Overwhelming mass production capability at 4000 UPH. Automatic for dynamic, static, and high-temperature conditions.
- Tester
Compatible with SFP112/QSFP112! Can be mounted in the compact FTB-1 HPDC chassis.
- Tester
Customize the optical integrated circuit you want to measure! Introducing our testing solutions.
- Tester
Starting the 800GbE point-to-point test, also supporting breakout tests with 2x400GbE and 8x100GbE!
- Tester
A modular measurement platform for testing optical passive components 24 hours a day, 365 days a year!
- Tester
Full support for testing transmission standards of 800G/400G/200G/100G!
- Tester
Leakage Current Circuit Breaker 【LCB 15mA 100V 15A PSC AAM A】
- Tester
Introduction to Theoretical Analysis of Wire Probe Wear
- probe
- Tester
- Semiconductor inspection/test equipment
The layout and operability of the NS series remain unchanged, achieving stable low-temperature measurements.
- Tester
- Other semiconductor manufacturing equipment
Changing the common sense of testing. AMB5600, an innovative platform that supports diverse ICs.
- Tester
- Testing Equipment and Devices
Supports up to 4096 channels, a multi-site open short tester that achieves the fastest test time in the industry.
- Tester
- Testing Equipment and Devices
High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.
- Semiconductor inspection/test equipment
- Tester
High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.
- Tester
- Circuit Board Inspection Equipment
Middle Range Model: A handler that thoroughly pursues excellent stability and significant reduction in work time.
- Tester
- Circuit Board Inspection Equipment
Middle-range model: A handler that thoroughly pursues excellent stability and significant reduction in working time.
- Tester
- Circuit Board Inspection Equipment
If you do not perform a proof test, it can also be used as a regular winding machine!
- Tester
- Testing Equipment and Devices
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
- Calibration and repair
- Tester
- Other measurement, recording and measuring instruments
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Tester
Exhibited at SEMICON Japan 2021 Hybrid.
Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.
Easily achieve communication tests for 1553 signals! DBT300 Network Tester
- Tester
Minimize aggressiveness towards the rim! There are plenty of clamp options available, compatible with various rims and vehicles.
- Tester
