List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
136～150 item / All 726 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
High-precision inspection equipment compatible with transparent materials.
- Semiconductor inspection/test equipment
[Exhibition Information] We will be exhibiting at 'SEMICON JAPAN 2025'.
We will be exhibiting Kubota's semiconductor inspection equipment at SEMICON JAPAN, an international exhibition of manufacturing technologies, equipment, and materials in the semiconductor industry. All of our staff sincerely look forward to your visit. 【Exhibition Information】 Date: December 17 (Wed) - 19 (Fri), 2025, 10:00 - 17:00 Venue: Tokyo Big Sight Booth Location: W1963 *Advance registration is required for attendance. Please check the SEMICON JAPAN website for registration details.
Automating visual inspection of wafer defects.
- Semiconductor inspection/test equipment
[Exhibition Information] We will be exhibiting at 'SEMICON JAPAN 2025'.
We will be exhibiting Kubota's semiconductor inspection equipment at SEMICON JAPAN, an international exhibition of manufacturing technologies, equipment, and materials in the semiconductor industry. All of our staff sincerely look forward to your visit. 【Exhibition Information】 Date: December 17 (Wed) - 19 (Fri), 2025, 10:00 - 17:00 Venue: Tokyo Big Sight Booth Location: W1963 *Advance registration is required for attendance. Please check the SEMICON JAPAN website for registration details.
Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.
- Semiconductor inspection/test equipment
[Exhibition Information] We will be exhibiting at 'SEMICON JAPAN 2025'.
We will be exhibiting Kubota's semiconductor inspection equipment at SEMICON JAPAN, an international exhibition of manufacturing technologies, equipment, and materials in the semiconductor industry. All of our staff sincerely look forward to your visit. 【Exhibition Information】 Date: December 17 (Wed) - 19 (Fri), 2025, 10:00 - 17:00 Venue: Tokyo Big Sight Booth Location: W1963 *Advance registration is required for attendance. Please check the SEMICON JAPAN website for registration details.
~Easily choose specifications on the web~ Semi-order porous chuck
- Semiconductor inspection/test equipment
A new pixel-shifting SWIR camera capable of high-resolution (5M, 12M, 21M) imaging in the SWIR band and applicable for various inspection purposes has arrived!
- Semiconductor inspection/test equipment
- Monochrome camera
- Color camera
Introducing a 21-megapixel CoaXPress-over-Fiber (CoF) camera that supports image transmission at up to 425 fps!
- Semiconductor inspection/test equipment
Compact, lightweight, and low-cost! The CXP interface enables high frame rates and long-distance transmission.
- Semiconductor inspection/test equipment
【NEW!】CIS Product Comprehensive Catalog【March 2020】
A variety of cameras are packed with features such as compact size, high speed, high image quality, high resolution, the adoption of new interfaces, and the inclusion of a CIS original image processing engine! [Contents of this issue] ■ CoaXpress cameras ■ CameraLink cameras ■ Pixel-shift cameras ■ Board cameras (GigE/USB3.0) ■ Accessories ■ Semi-custom lenses ■ Cameras equipped with our proprietary technology "Clairvu" ■ Case studies on image processing system development In addition to the models that have been well-received so far, we are excited to introduce new products: "50M high-resolution CXP camera," "25M high-speed CXP camera," "RGB+Depth information acquisition capable USB3.0 I/F ToF camera development kit," "4K high-speed Clairvu-equipped camera," and "4K camera with 18x zoom lens and Clairvu." There is a wide range of cameras suitable for various industrial applications such as traffic monitoring, broadcasting, medical, heavy steel plants, logistics, robot vision, and various inspections. Please take a look at the enhanced lineup of CIS cameras! *For more detailed information or to request an English version of the catalog, please contact our sales department.
Ideal for FA applications such as substrate and appearance inspection. A camera series that is compact, high-resolution, low-cost, capable of high frame rates, long-distance transmission, and multi-ch...
- Semiconductor inspection/test equipment
【NEW!】CIS Product Comprehensive Catalog【March 2020】
A variety of cameras are packed with features such as compact size, high speed, high image quality, high resolution, the adoption of new interfaces, and the inclusion of a CIS original image processing engine! [Contents of this issue] ■ CoaXpress cameras ■ CameraLink cameras ■ Pixel-shift cameras ■ Board cameras (GigE/USB3.0) ■ Accessories ■ Semi-custom lenses ■ Cameras equipped with our proprietary technology "Clairvu" ■ Case studies on image processing system development In addition to the models that have been well-received so far, we are excited to introduce new products: "50M high-resolution CXP camera," "25M high-speed CXP camera," "RGB+Depth information acquisition capable USB3.0 I/F ToF camera development kit," "4K high-speed Clairvu-equipped camera," and "4K camera with 18x zoom lens and Clairvu." There is a wide range of cameras suitable for various industrial applications such as traffic monitoring, broadcasting, medical, heavy steel plants, logistics, robot vision, and various inspections. Please take a look at the enhanced lineup of CIS cameras! *For more detailed information or to request an English version of the catalog, please contact our sales department.
We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!
- Other microscopes
- Resist Device
- Semiconductor inspection/test equipment
We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis regarding the malfunctioning part!
- Analysis Services
- Contract Analysis
- Semiconductor inspection/test equipment
Announcement of the introduction of Talos F200E
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which accumulates multiple frames while correcting for drift.
Back grinding is possible with various types of semiconductors! You can observe the elements and the condition of defects.
- Analysis Services
- Semiconductor inspection/test equipment
We leverage our expertise in hydraulic, pneumatic, and electrical technologies to propose and provide solutions that align with our customers' needs.
- Assembly Machine
- Semiconductor inspection/test equipment
- Transport and handling robots
We leverage our expertise in hydraulics, pneumatics, and electrical technology to propose and provide solutions that align with our customers' needs.
- Assembly Machine
- Semiconductor inspection/test equipment
- Transport and handling robots
We leverage our expertise in hydraulics, pneumatics, and electrical technology to propose and provide solutions that align with our customers' needs.
- Assembly Machine
- Semiconductor inspection/test equipment
- Transport and handling robots