List of Semiconductor inspection/test equipment products

Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

• air conditioning

Using two inspection cameras for semiconductor wafer inspection equipment, the tact time has been reduced by half. 3D bump inspection is also possible.

• Visual Inspection Equipment
• Semiconductor inspection/test equipment
• Tester

We specialize in processing sizes from 500 to 1200 mm and can guarantee precision in the 1000s range. Please feel free to consult with us first.

• Stepper
• Sputtering Equipment
• Semiconductor inspection/test equipment

Semiconductors, dies, package sorters. This is a device that performs visual inspection after extracting from tubes, trays, and taping/reels, and then repackages them.

• Binding/Packing Machine
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Cost-reduction model of Prestige II developed specifically for 8-inch wafers. It is capable of simultaneously inspecting defects and irregularities on the wafer.

• Visual Inspection Equipment
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

The CS series is a handler for memory, designed for Pick & Place type substrates.

• Other conveying machines
• Semiconductor inspection/test equipment
• Substrate transport device (loader/unloader)

A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.

• Semiconductor inspection/test equipment
• Tester
• Other semiconductor manufacturing equipment

Non-destructive/non-contact! Detection and monitoring of expansion defects inside wafers at the nm scale is possible.

• Semiconductor inspection/test equipment
• Other inspection equipment and devices

A device that transports parts to semiconductor inspection equipment. It is a gravity-based transport device. It is capable of performing transport and appearance inspection simultaneously.

• Tester
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Power transistor, measurement inspection, visual inspection, tape storage, tube storage.

• Other inspection equipment and devices
• Semiconductor inspection/test equipment
• Taping Machine

TO220 series device high temperature measurement inspection equipment

• Other inspection equipment and devices
• Semiconductor inspection/test equipment
• Automatic sorting machine

Small semiconductor electrical measurement inspection marking appearance inspection taping device. High-speed processing composite equipment.

• Other inspection equipment and devices
• Semiconductor inspection/test equipment
• Taping Machine

A device for laser marking on semiconductor frames. Achieves high-speed transport of frames without jamming through a unique grip transport mechanism!

• Other inspection equipment and devices
• Semiconductor inspection/test equipment
• Automatic sorting machine

SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.

• Other inspection equipment and devices
• Semiconductor inspection/test equipment
• Automatic sorting machine

SOP device measurement inspection equipment. Supports RF measurement! High-speed, compact equipment for SOP, SSOP, and DIP.

• Other inspection equipment and devices
• Semiconductor inspection/test equipment
• Automatic sorting machine

Map frame compatible laser marking device

• Semiconductor inspection/test equipment
• Assembly Machine
• Other assembly machines