List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
541～555 item / All 738 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
Pass/Fail Judgment Device
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
A device capable of performing three types of operations.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for drying 300mm wafers that have been cleaned after double-sided polishing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for simple cleaning (brush + water) of φ300 mm silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Loading and unloading of φ150 mm and φ125 mm silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for storing φ300 mm wafers, which have completed processing, one by one into a Teflon cassette for submersion.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that loads wafers one by one.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device for inverting and transferring silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Classified by resistivity and thickness categories.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the edge of a wafer and measures its diameter through image processing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment