List of probe products
- classification:probe
361~405 item / All 493 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
Supports a wide frequency range from several Hz to 30 MHz! Ultra-thin probe with a cross-section of 1.7 mm.
- Other measurement, recording and measuring instruments
- probe
- Ammeter
Easy to use! DC Flex is active where large direct currents need to be measured.
- Other measurement, recording and measuring instruments
- probe
- Ammeter
Easy management of hole diameter! Introducing a high-current probe with a constant phase current of 20A.
- probe
We introduce a probe with a nylon finish that won't scratch delicate surfaces!
- probe
- Anti-static products
- Other anti-static devices
Ergonomically designed hexagonal handle! Introducing high-quality probes made in the USA.
- probe
- Anti-static products
- Other anti-static devices
Introducing a high-quality probe set made in America! The handle thickness is 3.96mm ± 0.08mm.
- probe
- Anti-static products
- Other anti-static devices
Ideal for use in ESD protection areas! Introducing probes that won't damage delicate surfaces.
- probe
- Anti-static products
- Other anti-static devices
High quality made in America! No problem using it with magnetized parts.
- probe
- Anti-static products
- Other anti-static devices
Ideal as a tool for removing batteries! Introducing an American-made probe.
- probe
- Anti-static products
- Other anti-static devices
Introducing an ideal American-made probe for opening plastic cases.
- probe
- Anti-static products
- Other anti-static devices
Ideal for use in areas equipped with static electricity measures! Introducing American-made probes.
- probe
- Anti-static products
- Other anti-static devices
AFM/SPM probes boasting long lifespan and high durability with diamond coatings and single crystal diamonds.
- Other microscopes
- Analytical Equipment and Devices
- probe
This is a probe with a long extra tip at the tip end. It is effective for measuring samples with deep grooves and vertical sidewalls.
- Other microscopes
- Analytical Equipment and Devices
- probe
High cost-performance AFM/SPM probes
- Other microscopes
- Analytical Equipment and Devices
- probe
AFM/SPM probe for high-resolution measurements with a tip curvature radius of less than 3 nm.
- Other microscopes
- Analytical Equipment and Devices
- probe
Student experiments, operation confirmation and setting adjustment of AFM/SPM.
- Other microscopes
- Analytical Equipment and Devices
- probe
A wide variety of gratings are available. Suitable for calibration and test measurements.
- Other microscopes
- Analytical Equipment and Devices
- probe
Introducing non-magnetic conductive 300 series stainless steel!
- Other anti-static devices
- probe
- Anti-static products
It can be used together with parts that are magnetized without corroding!
- Other anti-static devices
- probe
- Anti-static products
What are the factors preventing the efficiency and standardization of large-scale measurement operations, and what are effective solutions to address them? A resource for identifying and solving issue...
- 3D measuring device
- Other inspection equipment and devices
- probe
Non-destructive measurement of thin film optical properties! Easy and high-precision measurement with spectral ellipsometry.
- Optical Measuring Instruments
- Spectroscopic Analysis Equipment
- probe
Significantly suppresses the variation of spring constant and resonance frequency! Can be used as an alternative to silicon nitride probes.
- probe
Supports high-temperature environments up to 150℃. Direct probing of the current waveform of the IC leads mounted on the substrate.
- oscilloscope
- Ammeter
- probe
A power device for high current testing that achieves a stable connection by using multiple pin settings!
- probe
Compact and versatile measurements without restrictions on installation location or purpose! An easy-to-operate comparative measurement device!
- probe
- Other measurement, recording and measuring instruments
Introducing probes suitable for connectors and interfaces with a 1.27mm pitch!
- probe
We offer a wide range of probes and probe-related products.
- probe
Designed in-house! Processed in-house! Leave it to us for custom-made IC sockets!
- probe
- socket
- Contract manufacturing
【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!
- probe
We offer various specialized types tailored to different applications. High precision, touch probes with no differential.
- Other machine elements
- probe
A new wireless communication method resistant to noise. A touch probe that can be used continuously for 180 hours on a single battery.
- Other machine elements
- probe
Affordable pricing for measurements up to DC~40GHz!
- probe
Affordable pricing for measurements up to DC~26GHz!
- probe
Affordable pricing for measurements up to DC~50GHz!
- probe
Affordable pricing for measurements up to DC~67GHz!
- probe
Affordable pricing for measurements up to DC~110GHz!
- probe
Affordable pricing for RF high power measurements from DC to 26GHz!
- probe
Compared to conventional products, the chip is approximately 33% smaller, allowing for contact with a very small chip width of about 20μm.
- probe
Affordable differential measurements from DC to 26GHz!
- probe
The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]
- probe
A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!
- probe
With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!
- probe
We are introducing a comparison of contact resistance values between our products and overseas products from other companies.
- probe
Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.
- probe
Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.
- Processing Jig
- probe