List of Contract Analysis products

  • classification:Contract Analysis

631~675 item / All 2066 items

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It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...

  • Sensors

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We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!

  • Other semiconductors
  • Processing Contract
  • Wafer

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Technical information "Raman 3D mapping of organic multilayer films" and three other items have been released.

We have published the following three analysis case studies on the MST website: - Raman 3D mapping of organic multilayer films - Evaluation of metal and organic contamination on wafer surfaces - Foreign substance analysis on metal components using Raman For more details, please visit the MST website. http://www.mst.or.jp/

Depth direction analysis will be conducted to a depth of several micrometers.

  • Contract Analysis
  • Contract manufacturing

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We will evaluate the internal structure of the device in a comprehensive manner.

  • Contract Analysis
  • Other electronic parts

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Evaluation of GFRP is possible according to the purpose.

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  • Contract Analysis
  • Contract measurement

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It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).

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  • Contract Analysis

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Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).

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  • セミナー.jpg
  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Reduce the impact of foreign object surrounding information with appropriate sampling.

  • Contract Analysis

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X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

  • Contract Analysis

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Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.

  • Contract Analysis

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Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.

  • Contract Analysis

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Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.

  • Contract Analysis

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Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.

  • Contract Analysis

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We have compiled frequently asked questions regarding your order in an FAQ format.

  • 打ち合わせ.jpg
  • セミナー.jpg
  • Contract Analysis

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Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.

  • Contract Analysis

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A lineup of AlGaN standard samples with various Al compositions.

  • Contract Analysis

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Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.

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  • Contract Analysis

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Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.

  • Contract Analysis

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Quantitative analysis of main components and trace components is possible.

  • Contract Analysis

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Verification of the luminous characteristics of the chip and phosphor in white LEDs.

  • Contract Analysis

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Evaluation of the composition and distribution of impurities in polymer materials using XRF.

  • Contract Analysis

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It is possible to evaluate the depth distribution of B, Al, N, P, and As in SiC with high sensitivity.

  • Contract Analysis

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Imaging SIMS allows for the evaluation of localized elements.

  • Contract Analysis

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It is possible to identify the components of each layer of PET bottles using TOF-SIMS.

  • Contract Analysis

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Cool the sample and evaluate the shape of the separator more accurately.

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  • Contract Analysis
  • Contract measurement

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It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

  • Contract Analysis

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It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

  • Contract Analysis

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It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

  • Contract Analysis

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Estimation of film thickness using the average free path of photoelectrons.

  • Contract Analysis

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Evaluation of activation rate is possible through composite analysis.

  • Contract Analysis

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The coordinate linkage function with the foreign object inspection device allows for the evaluation of specific foreign objects.

  • Contract Analysis

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Capable of evaluating the composition of the main elemental components of GaN-based LEDs in the depth direction.

  • Contract Analysis

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It is possible to obtain the impurity profile in the GaN-based LED structure from the backside.

  • Contract Analysis

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Capable of highly sensitive evaluation of the distribution of additives at the ppm level.

  • Contract Analysis

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Capable of evaluating the composition of the main elemental components of compound semiconductors in the depth direction.

  • Contract Analysis

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Evaluation of melamine concentration in infant formula milk powder

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  • Contract Analysis

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Capable of structural analysis at the nanoscale and evaluation of nanoparticle size.

  • Contract Analysis

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It is possible to evaluate the film thickness of the degraded layer using the GCIB (Ar cluster).

  • Contract Analysis

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Technical Information "Analysis of Trace Metal Elements in the Environment (B0231)" Released

We have published the following analysis case on the MST website: - Trace metal element analysis in the environment (B0231) For more details, please visit the MST website. http://www.mst.or.jp/

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