List of Contract measurement products
- classification：Contract measurement
46～90 item / All 2094 items
We provide manufacturing technology for neutralization, esterification, sulfonation, phosphorylation, polycondensation reactions, powder mixing, emulsification, and dispersion, etc. *We can also handl...
- Contract manufacturing
Do you have any concerns about contract manufacturing of various chemical products?
We would like to introduce the contract manufacturing services provided by Riten Chemical Co., Ltd. We are a chemical manufacturer based in Kyoto with 70 years of experience. Since our establishment, we have been developing, manufacturing, and selling various surfactants used in the textile and paper industries. Based on the technology and development capabilities we have cultivated over the years, we accept contract manufacturing of various chemical products, so please feel free to contact us. 【Contract Manufacturing Achievements】 ■ Construction waterproofing agents ■ Plant growth promoters ■ Construction waterproofing materials ■ Greening-related agents ■ Chemicals for the electronics industry ■ Wastewater treatment agents ■ Industrial preservatives ■ Special surfactants... We provide more detailed information through related products and catalogs.
Heat resistant up to 1200℃. We will custom-make high-performance insulation covers that ensure safety in the working environment!
- Glass
TOF-SIMS, D-SIMS: Secondary Ion Mass Spectrometry
- Contract measurement
The mass array method allows for the simultaneous analysis of multiple genetic polymorphisms.
- Contract measurement
- Contract Analysis
![[MALDI-MS] Matrix-Assisted Laser De...](https://image.mono.ipros.com/public/product/image/fda/2001512022/IPROS11338482308148200208.jpg?w=280&h=280){kind=small}
It is a type of ionization method in mass spectrometry that is a soft ionization technique capable of suppressing the fragmentation of sample molecules.
- Contract measurement
![[PFM] Piezoelectric Response Micros...](https://image.mono.ipros.com/public/product/image/82b/2001512029/IPROS3629037656067593219.jpg?w=280&h=280){kind=small}
By using a probe coated with a conductive film and applying an alternating voltage to the sample surface, the sample surface is vibrated to obtain electromechanical information.
- Contract measurement
It is possible to evaluate the resistance when a certain load (temperature, humidity, pressure, voltage) is applied to materials and components.
- Contract measurement
![[AFM-MA・DMA] Mechanical Property Ev...](https://image.mono.ipros.com/public/product/image/0ec/2001512502/IPROS15276089049362651398.jpg?w=280&h=280){kind=small}
AFM-MA and AFM-DMA are analyses that can provide insights into hardness.
- Contract Analysis
- Contract measurement
A method for removing the surface of a sample by utilizing the sputtering phenomenon, where sample atoms are ejected from the sample surface.
- Contract Analysis
- Contract measurement
By bonding heavy elements to polymer chains, the contrast of structures and forms derived from the polymers can be enhanced, allowing for clearer observation under an electron microscope.
- Contract Analysis
- Contract measurement
TG-DTA-MS Thermogravimetric Differential Thermal Mass Spectrometry
- Contract Analysis
- Contract measurement
It is possible to observe three-dimensional structures under heating/cooling and stress/compression load conditions.
- Contract measurement
- Contract Analysis
Here is an example comparing the analysis results of catechin standard solutions using CAD and UV detectors.
- Contract Analysis
- Contract measurement
It is effective to differentiate between the two methods according to the purpose components and the size of the imaging field.
- Contract Analysis
- Contract measurement
Comparison of spectra obtained from Ga line (HAXPES) and Al line/Mg line (XPS) measurements.
- Contract Analysis
- Contract measurement
Phosphorescence measurement is possible with a fluorometer.
- Contract Analysis
- Contract measurement
Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
![[TOF-SIMS] Time-of-Flight Secondary...](https://image.mono.ipros.com/public/product/image/cf8/387108015/IPROS364447109984113922.jpg?w=280&h=280){kind=small}
This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the v...
- Contract Analysis
- Contract measurement
- Contract Inspection
Announcement of the new TOF-SIMS service starting from October 2016.
In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx
XRR：X-ray Reflectivity
- Contract Analysis
- Contract measurement
- Contract Inspection
![[FIB] Focused Ion Beam Processing](https://image.mono.ipros.com/public/product/image/b01/387108030/IPROS7900017760392336423.jpg?w=280&h=280){kind=small}
FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas...
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
- Contract Analysis
- Contract measurement
- Contract Inspection
Obtain information about the molecular structure and crystal structure of the sample.
- Contract Analysis
- Contract measurement
- Contract Inspection
[MST Homepage] Analysis Case "Evaluation of Bone Condition Before and After HF Treatment" has been published.
We have published analysis cases on the MST homepage. ◆Title Evaluation of Bone Condition Before and After HF Treatment ~Evaluation of Condition Before and After Chemical Treatment Using Raman Analysis~ ◆Measurement Method / Processing Method Raman / Chemical Treatment ◆Product Field Pharmaceuticals / Biotechnology ◆Analysis Purpose Evaluation of Chemical Bonding State ◆Overview HF (hydrofluoric acid) is widely used in processes such as wet etching of SiO2 and plays a very important role in semiconductor manufacturing. However, it is also a very dangerous chemical that can penetrate the skin and damage bones, requiring careful handling. The erosion of bones caused by HF occurs due to the reaction between Ca, which exists in bones as apatite, and HF, resulting in the formation of CaF2. This case introduces an evaluation of the changes in this reaction using Raman analysis. ★★For detailed data, please see the link★★
![[EBSD] Electron Backscatter Diffrac...](https://image.mono.ipros.com/public/product/image/bef/387108007/IPROS4688397342881936146.jpg?w=280&h=280){kind=small}
It is possible to easily obtain crystal information over a wide area.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[EBIC] Electron Beam Induced Curren...](https://image.mono.ipros.com/public/product/image/03a/387108025/IPROS8986659968992890200.jpg?w=280&h=280){kind=small}
A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EELS] Electron Energy Loss Spe...](https://image.mono.ipros.com/public/product/image/d11/387108027/IPROS1835117444880261851.jpg?w=280&h=280){kind=small}
By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.
- Contract Analysis
- Contract measurement
- Contract Inspection
Ion chromatography is a method for detecting ionic components in liquid samples.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[GDMS] Glow Discharge Mass Spectrom...](https://image.mono.ipros.com/public/product/image/569/2000240719/IPROS13633680634984708159.jpeg?w=280&h=280){kind=small}
Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EDX] Energy Dispersive X-ray S...](https://image.mono.ipros.com/public/product/image/eea/2000240814/IPROS3960834512466909797.jpg?w=280&h=280){kind=small}
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional...
- Contract Analysis
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- Contract Inspection
![[ED] Electron Diffraction Method](https://image.mono.ipros.com/public/product/image/aa2/2000240821/IPROS81867168414493685965.jpeg?w=280&h=280){kind=small}
ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.
- Contract Analysis
- Contract measurement
- Contract Inspection
UV-Vis is a method that measures the intensity of light transmitted through a sample by irradiating the sample with light divided by wavelength, allowing for the determination of the sample's absorban...
- Contract Analysis
- Contract measurement
- Contract Inspection
Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[Analysis Case] Structural Evaluati...](https://image.mono.ipros.com/public/product/image/f93/2000745939/IPROS12667462697641529093.jpg?w=280&h=280){kind=small}
Evaluation of particle size and crystal orientation of living materials, atomic-level observation is possible.
- Charger
- Contract measurement
![[TEM ED-Map] TEM Electron Diffracti...](https://image.mono.ipros.com/public/product/image/371/2000823132/IPROS13976815575557580837.jpg?w=280&h=280){kind=small}
This is a method for analyzing the orientation distribution of crystalline samples using electron diffraction in a transmission electron microscope (TEM).
- Contract measurement
- Contract Analysis
By measuring the fluorescence lifetime of a substance, we can grasp the luminescent transient phenomena more dynamically.
- Contract measurement
Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.
- Contract Analysis
- Contract measurement
We will conduct qualitative evaluation of organic materials, focusing on hall transport materials, using LC/MS.
- Contract measurement
We evaluate the effects of vibrations and durability on electronic components, electronic devices, and other products during use or transportation.
- Contract measurement
Testing can be conducted using the solder pot balance method, solder ball balance method, and solder paste method.
- Contract measurement
By detecting the sound generated when tiny foreign objects inside the hollow structure collide with the wall, it is possible to prevent troubles such as shorts before they occur.
- Contract measurement
We evaluate the effects and destruction tolerance when semiconductors and electronic components are subjected to stress from static electricity.
- Contract measurement
![[Analysis Case] Component Analysis ...](https://image.mono.ipros.com/public/product/image/c2b/2001512432/IPROS10397238807307473945.jpg?w=280&h=280){kind=small}
We will conduct a comprehensive qualitative evaluation of vulcanization accelerators, aging inhibitors, lubricants, and other substances in rubber products.
- Contract measurement
- Contract Analysis
High magnification observation (up to about 300,000 times) is possible.
- Contract Analysis
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- Contract Inspection
Notice of publication of a written article in the May 2012 issue of Applied Physics.
In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.
![[LC/MS] Liquid Chromatography Mass ...](https://image.mono.ipros.com/public/product/image/5c5/387108008/IPROS3879984652898883434.jpg?w=280&h=280){kind=small}
It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.
- Contract Analysis
- Contract measurement
- Contract Inspection
This is a method for qualitative and quantitative analysis of components contained in a sample by detecting secondary ions and measuring the detection amount at each mass.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[AES] Auger Electron Spectroscopy](https://image.mono.ipros.com/public/product/image/abb/387108005/IPROS917026522925720880.jpg?w=280&h=280){kind=small}
By measuring the kinetic energy distribution of Auger electrons emitted by electron beam irradiation, insights can be gained regarding the types and quantities of elements present on the sample surfac...
- Contract Analysis
- Contract measurement
- Contract Inspection
![[EMS] Emission Microscopy Method](https://image.mono.ipros.com/public/product/image/ebd/387108012/IPROS78188100613521420358.jpeg?w=280&h=280){kind=small}
Rapid identification of the malfunctioning area.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[SEM-EDX] Energy Dispersive X-ray S...](https://image.mono.ipros.com/public/product/image/c19/387108026/IPROS3784980461565155978.jpg?w=280&h=280){kind=small}
It is a method for conducting elemental analysis and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy.
- Contract Analysis
- Contract measurement
- Contract Inspection