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Analysis Equipment Product List and Ranking from 39 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門 Tokyo//Trading company/Wholesale
  2. 日本ベクトン・ディッキンソン 品質管理・研究開発・注射剤の製剤研究・CMO Tokyo//Medical Devices
  3. ゼロシーセブン Tokyo//Testing, Analysis and Measurement
  4. 4 null/null
  5. 4 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
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Analysis Equipment Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Next Generation NTA Device ZetaView Evolution DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門
  2. Nanoparticle Tracking Analysis (NTA) Device ZetaView x30 DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門
  3. Microbio μ 3D (TM) 日本ベクトン・ディッキンソン 品質管理・研究開発・注射剤の製剤研究・CMO
  4. Flow Imaging Particle Image Analysis System - FlowCam Series DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門
  5. 5 [Analysis Case] Lock-in Thermal Analysis of Package Products 一般財団法人材料科学技術振興財団　MST

Analysis Equipment Product List

76～90 item / All 133 items

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Introduction to 5G Wideband Signal Generation/Analysis Solutions

Introduction to 5G Wideband Signal Generation/Analysis Solutions

Introducing RODE Schwarz's 5G wideband signal generation and analysis solution!

Recently, efforts towards the commercialization of 5G (next-generation mobile communication systems) have been actively underway. 5G requires more advanced mobile network technologies than before, and it is believed that the development of equipment will necessitate the procurement of corresponding measuring instruments. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ 　　　　　＼＼ Our company is enhancing its lineup of the latest measuring instruments for 5G ／／ ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We introduce the latest 5G solutions along with examples of wideband signal generation and analysis! Renting allows for the smoothing of development budgets and significantly reduces initial procurement costs.

  • Wireless LAN
  • VPN/Wide Area Ethernet
  • LAN construction and wiring work

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Contracted Analysis: Streamlining Performance Evaluation of Spray Nozzles for Problem Solving!

Contracted Analysis: Streamlining Performance Evaluation of Spray Nozzles for Problem Solving!

We present materials that visualize the performance of spray nozzles through analyses related to nozzle performance, such as fluid analysis, particle size measurement, and impact force distribution, along with examples of analysis and evaluation.

The performance of a spray nozzle is influenced by factors such as pressure, flow rate, spray pattern, particle size, flow velocity, flow distribution, and impact force distribution. Everloy possesses measurement equipment and analytical evaluation techniques for these factors and has conducted numerous analyses to date. Based on years of accumulated experiments and analytical evaluations, we can propose optimization plans for spray nozzles tailored to your specific usage purposes. Customers who require analysis are welcome to consult with us.

  • Contract Analysis

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Particle Shape Image Analysis Device "PITA-04"

Particle Shape Image Analysis Device "PITA-04"

Achieve vast particle imaging and analysis involving tens of thousands in just a few minutes! 【Demo measurements / Can be brought in!】 Please consult with us.

By evaluating particle shape through imaging and quantifying it, we enhance the added value of powders and bulk materials beyond conventional particle size distribution measurement devices. It goes without saying that clear particle images are essential for particle image analysis. The camera's depth of field is on the order of a few microns, so the observed particles must pass precisely through the focus. Additionally, we must ensure that the observation zone is not overlapped by the particles as much as possible. The "PITA-04" has achieved a particle imaging environment with its unique planar stretching cell and high-resolution CCD camera. With the PITA-04, it is possible to reliably analyze aspects such as "the length and thickness of needle-like/fibrous particles," "the dispersion/agglomeration state of suspended particles," "whether coarse particles are single particles, agglomerated particles, or foreign substances," and "whether there are irregularities in particles with controlled shapes." 【Features】 - Clear particle images achieved through the use of a planar stretching cell - Easy measurement that anyone can perform in a short time - Capable of various measurements including heavy, large, fibrous particles and agglomeration confirmation - Compatible with organic solvents - Successful cost reduction through compact design For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments
  • Other powder equipment
  • Analytical Equipment and Devices

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Double Titration Handy Contact Angle Meter / Surface Free Energy Analysis Device MSA

Double Titration Handy Contact Angle Meter / Surface Free Energy Analysis Device MSA

A highly popular model that allows surface free energy analysis in just 1 second!

The world's first air pressure-based double titration system allows for the measurement of the contact angles of two liquids simultaneously with a single click, calculating surface free energy in as little as one second. With fully automated measurements, human error is minimized to the greatest extent.

  • Other measurement, recording and measuring instruments

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Deprotection Reaction Analysis Device PAGA Series

Deprotection Reaction Analysis Device PAGA Series

We provide various devices for advanced evaluation of photoresists.

The Deprotection Reaction Analysis Device PAGA series features in-situ reaction analysis using PEB and 248mm exposure, as well as the capability to calculate deprotection reaction parameters. A bake plate is placed in the FT-IR chamber, allowing for the observation of functional group changes while heating. Additionally, it is equipped with a UV (248nm) irradiation device, which can also be used to analyze mechanisms of acid generation during exposure. For more details, please contact us or refer to the catalog.

  • Other process controls
  • Spectroscopic Analysis Equipment

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Rapid Eye Movement Analysis Device "EyeLink Portable Duo"

Rapid Eye Movement Analysis Device "EyeLink Portable Duo"

The new EyeLink allows for easy and high-precision eye tracking anywhere.

Measuring with the EyeLink Portable Duo is easy; you just need to connect the camera to a laptop. High-precision eye tracking can be easily done anywhere, such as in clinics, offices, labs, or at home. It can also be used with a laptop or simply by using a tripod for head stabilization, allowing for flexible usage. You can conveniently carry the dedicated laptop and camera in a specialized carry bag, making transportation easy without the need for special packaging.

  • Other measurement, recording and measuring instruments

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High-Speed Eye Movement Analysis Device "EyeLink 1000 PLUS Series"

High-Speed Eye Movement Analysis Device "EyeLink 1000 PLUS Series"

Customizable according to the purpose, it accommodates various experimental conditions.

The basic system allows for the selection of lenses/camera mounts according to the task. It consists of four types: desktop, tower, remote, and arm. The video-based eye tracking system can also be expanded to the world's fastest 2000Hz sampling. Thanks to the special image processing technology integrated into the EyeLink1000 PLUS, stable measurements can be conducted for extended periods with low noise and minimal drift, allowing for the capture of highly accurate data. <Standard Camera Mount> ■ Desktop Type: This type involves placing the eye camera under the stimulus presentation monitor and having the subject rest their face on a headrest for measurement. ■ Tower Type: This type uses a half mirror to capture images of the eyeball, allowing the camera to view the eyeball from the front. ■ Remote Type: This type allows for non-contact measurement, reducing the burden on the subject. ■ Arm Type: This type involves attaching the eye camera to the bottom of the visual stimulus presentation monitor.

  • Other measurement, recording and measuring instruments

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[Example of analysis using EBSD] Chip

[Example of analysis using EBSD] Chip

I will introduce an example of analysis using EBSD where orientation was observed in the Al wiring.

We will introduce an example of analysis of the chip surface wiring (Al) using EBSD. The package resin was opened using a chemical solution/RIE, and an analysis of the Al pattern on the chip surface was conducted using EBSD. As a result, orientation was observed in the Al wiring. The normal orientation is distributed, and it is believed that many crystals are present. 【Overview】 ■ Analysis Method - The package resin was opened using a chemical solution/RIE. - An analysis of the Al pattern on the chip surface was conducted using EBSD. ■ Results - Orientation was observed in the Al wiring. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Analysis Services

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Example of analysis using EBSD: Via

Example of analysis using EBSD: Via

The EBSD method allows for the estimation of crystal size distribution and residual stress.

We will introduce an example of analysis using EBSD for vias (Cu) formed in a multilayer substrate. With the EBSD method, it is possible to infer the distribution of crystal sizes and residual stress. Additionally, by highlighting on the map, the features that appear in the graph can be visualized. 【Overview】 ■Observation of crystal structure using EBSD ・IPF map ・GROD map ・Crystal grain distribution map *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Analysis Services

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Example of analysis using the EBSD method

Example of analysis using the EBSD method

We will introduce an example of the analysis of EBSD patterns (Kikuchi patterns) at gold wire bond joints.

The EBSD (Electron Backscatter Diffraction) method obtains orientation information of individual crystals from the electron diffraction patterns generated by electron beam irradiation and maps this information. It is a technique used to investigate not only crystal orientation (texture) but also material microstructural states such as grain distribution and stress-strain as quantitative and statistical data. For example, when the sample is tilted significantly in a SEM and the electron beam is irradiated, if the sample is crystalline, electron diffraction occurs within the sample. By indexing the resulting pattern, it becomes possible to determine the crystal orientation at that point. By observing the differences in crystal orientation, it is possible to infer the residual stress within the crystal grains. 【Features】 ■ Obtains and maps orientation information of individual crystals ■ Investigates material microstructural states such as crystal orientation, grain distribution, and stress-strain ■ Allows inference of residual stress within crystal grains by observing differences in crystal orientation *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Analysis Services

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Narrowing down defective areas using the EBAC (Absorption Current) method.

Narrowing down defective areas using the EBAC (Absorption Current) method.

"SEM images" and "absorption current images (current sensing)" etc.! It identifies open defects in wiring and areas with high resistance defects.

Our company provides analysis and reliability evaluation services. In the "Narrowing Down Defective Areas Using the EBAC (Absorbed Current) Method," we identify open defects and high-resistance areas in wiring using the EBAC method with a nano-probe and high-sensitivity amplifier. By sensing the absorbed current as voltage, we can obtain a contrast based on the resistance division within the wiring, allowing us to detect high-resistance defects in TEGs such as via chains. [Analysis Examples Using the EBAC Method] ■ SEM Images ■ Overlaid Images ■ Absorbed Current Images (Current Sensing) ■ Absorbed Current Images (Voltage Sensing) *For more details, please refer to the PDF materials or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Example of analysis using EBSD (ceramics)

Example of analysis using EBSD (ceramics)

Examples of analysis using EBSD, such as 'Observation/Elemental Analysis' and 'Analysis by EBSD'!

This is an example of analysis using EBSD for ceramics (Al2O3). In the "Observation/Elemental Analysis," it was determined to be Al2O3 based on elemental analysis using EDX, and it was observed that Si was scattered as shown in the map. In the "Analysis using EBSD," the distribution of crystal size and orientation can be confirmed using the EBSD method, and by highlighting the map, the features that appeared in the graph can be visualized. [Analysis Overview] ■ Observation/Elemental Analysis - Observation using SEM and elemental analysis using EDX ■ Analysis using EBSD - Observation of crystal structure using EBSD *For more details, please refer to the PDF document or feel free to contact us.

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  • Contract Analysis
  • Analysis Services

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[Data] Whisker Analysis by EBSD

[Data] Whisker Analysis by EBSD

Introducing a case study analyzing whiskers that occurred on the lead terminals of an IC package!

This document introduces a case study on whiskers that occurred on the lead terminals of IC packages, where cross-sections were created through mechanical polishing, followed by SEM observation and EBSD analysis. It includes surface SEM images of the IC package as well as cross-sectional SEM images. It is evident that the crystal grains and grain boundaries measured by the EBSD method are consistent. We encourage you to read it. 【Published Cases】 ■Observation/Cross-section Preparation ■Analysis by EBSD *For more details, please refer to the PDF document or feel free to contact us.

  • Other contract services
  • Contract Analysis
  • Analysis Services

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Crystal analysis by EBSD: Aluminum weld joint (spot welding)

Crystal analysis by EBSD: Aluminum weld joint (spot welding)

We will introduce an analysis example confirming that the welded area has a large distribution of grain crystals.

As a case study of EBSD, we conducted an analysis of the cross-section of an aluminum welding joint from the cross-sectional direction, which I would like to introduce. For a sample where an aluminum plate was spot welded to an aluminum case, we prepared a cross-section of the weld and performed EBSD analysis. In the distribution of grain sizes, it was confirmed that the weld area has a greater number of larger grains compared to the base material. [Analysis Overview] ■ Visualization of Grain Structure - It is evident that the shape and size of the grains in the weld area differ from those in the base material. ■ Distribution of Grain Sizes - It can be confirmed that the weld area has a greater distribution of larger grains compared to the base material. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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