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Analysis Equipment Product List and Ranking from 74 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門 Tokyo//Trading company/Wholesale
  2. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  3. ゼロシーセブン Tokyo//Testing, Analysis and Measurement
  4. 4 アイテス Shiga//Electronic Components and Semiconductors
  5. 5 ソニー ライフサイエンス＆テクノロジー事業部 Kanagawa//Optical Instruments
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Analysis Equipment Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Nanoparticle Tracking Analysis (NTA) Device ZetaView x30 DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門
  2. Flow Imaging Particle Image Analysis System - FlowCam Series DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門
  3. "Sony Life Science Products" [*Catalog available] ソニー ライフサイエンス＆テクノロジー事業部
  4. 4 Next Generation NTA Device ZetaView Evolution DKSHマーケットエクスパンションサービスジャパン テクノロジー事業部門
  5. 5 Lock-in thermal analysis device "ELITE"

Analysis Equipment Product List

91～105 item / All 139 items

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Crystal analysis by EBSD: Aluminum weld joint (spot welding)

Crystal analysis by EBSD: Aluminum weld joint (spot welding)

We will introduce an analysis example confirming that the welded area has a large distribution of grain crystals.

As a case study of EBSD, we conducted an analysis of the cross-section of an aluminum welding joint from the cross-sectional direction, which I would like to introduce. For a sample where an aluminum plate was spot welded to an aluminum case, we prepared a cross-section of the weld and performed EBSD analysis. In the distribution of grain sizes, it was confirmed that the weld area has a greater number of larger grains compared to the base material. [Analysis Overview] ■ Visualization of Grain Structure - It is evident that the shape and size of the grains in the weld area differ from those in the base material. ■ Distribution of Grain Sizes - It can be confirmed that the weld area has a greater distribution of larger grains compared to the base material. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Lock-in thermal analysis method

Lock-in thermal analysis method

The lock-in thermal analysis method detects slight temperature increases in the current path.

- The IR-OBIRCH function is also included, allowing for further narrowing down of the fault location after identifying the heat generation area through IR-OBIRCH measurement. - By detecting infrared, it is possible to non-destructively identify fault locations without the need for opening the package through etching or removing electrodes. - By using lock-in signals, it is possible to identify heat generation areas with high S/N, enabling cross-sectional analysis such as Slice & View.

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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[Analysis Case] Evaluation of Liquid Crystal Structure and Micelle Size of Emulsifiers by SAXS

[Analysis Case] Evaluation of Liquid Crystal Structure and Micelle Size of Emulsifiers by SAXS

Capable of structural analysis at the nanoscale and evaluation of nanoparticle size.

Emulsification technology is a fundamental technology in cosmetic development and is utilized across various cosmetics. Changes in the structure of emulsifiers are closely related to the balance of water and oil in the product, the permeability of encapsulated active ingredients, cleansing power, and changes in user experience, making its analysis very important.

  • Contract Analysis

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[Analysis Case] Identification of the Crystal Structure and Calculation of the Composition Ratio of HfZrOx Film

[Analysis Case] Identification of the Crystal Structure and Calculation of the Composition Ratio of HfZrOx Film

More detailed evaluation is possible through combined analysis using XRD and XAFS.

The HfZrOx film, which is attracting attention as a high-k material and ferroelectric, has its physical properties such as dielectric constant significantly affected by its crystal structure. Therefore, identifying the crystal structure and calculating the proportion of each crystal structure are important evaluation criteria. While these can typically be assessed using XRD and XAFS, combining these two methods can provide more detailed information, even in cases where detailed analysis is difficult with just one method. In this instance, we present a case of identifying the crystal structure of HfZrOx films and calculating the proportions of each crystal structure through combined analysis of XRD and XAFS.

  • Contract Analysis

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[Analysis Case] HF Etching Simulation of a-SiO2 Film

[Analysis Case] HF Etching Simulation of a-SiO2 Film

Effective for understanding surface reactions at the atomic level in the etching process.

With the miniaturization of semiconductor processes, the importance of surface reactions due to etching gases, precursors in ALD film formation, and plasma treatments is increasing. For systems involving complex chemical reactions such as etching, changes in surface bonding states, and defect generation, analysis using molecular dynamics calculations is effective for understanding phenomena at the atomic level. This document evaluates the HF etching reaction of a-SiO2 using molecular dynamics calculations. A similar approach can be applied to various reactions and materials.

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  • Contract measurement
  • Contract Analysis
  • simulator

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TD Imaging | Semiconductor Failure Analysis Device (Heat Measurement)

TD Imaging | Semiconductor Failure Analysis Device (Heat Measurement)

By using heat reflection and laser technology, LIT narrows down the heat generation points beneath the metal layer, which were difficult to detect, to as small as 2μm, breaking through the limits of heat generation analysis.

TD Imaging is a new heat generation analysis method that uses a laser scanning thermal reflection technique developed and patented by Hamamatsu Photonics. Compared to a 1300nm near-infrared laser, a 670nm short-wavelength laser achieves over four times the S/N ratio on metal surfaces such as copper and aluminum. Furthermore, it can pinpoint heat generation locations down to 2μm, making it possible to identify defects beneath metal layers, which was difficult with conventional LIT. Additionally, by combining it with LIT, which excels in wide-area detection, the accuracy and efficiency of the entire analysis flow from electrical failure analysis (EFA) to physical failure analysis (PFA) are dramatically enhanced.

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  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

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Can you find hints to enhance product value through metabolome analysis?

Can you find hints to enhance product value through metabolome analysis?

Would you like to solve the challenges your company faces with metabolome analysis? We will introduce a variety of analysis plans.

"I don't know the differentiation points of our products..." "I want to find new selling points without conducting new development..." "The direction for future product development is unclear..." ...These challenges may be solved with "metabolome analysis." Our company is a leading provider of metabolome analysis, with nearly 5,000 testing achievements across various fields, primarily in food and pharmaceuticals, as well as materials, cosmetics, environment, fermentation, and exercise. We analyze samples derived from various foods, plants, animals, and microorganisms, measuring metabolites contained in the samples, such as amino acids, vitamins, and functional components. Would you like to clarify the potential of your materials and products that you haven't measured yet through metabolome analysis? We will propose a measurement plan suitable for your company's objectives. *For more details, please refer to the PDF materials or feel free to contact us.

  • Other analyses
  • Analysis Services
  • Other contract services

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[Application Example] BGA Void Analysis Technology "BGA Pro"

[Application Example] BGA Void Analysis Technology "BGA Pro"

Clearly display the state inside the solder and assist with soldering analysis!

We would like to introduce a product that applies "Smart X-ray." "BGA Pro" assists in soldering analysis by calculating and processing image signal changes of BGA and CSP that are not visible in regular X-ray transmission images, quantifying their size and position, and clearly displaying the internal condition of the solder. 【Applicable Uses】 ■ By quantifying the void state of BGA and CSP, it can evaluate the soldering condition. ■ Understanding the void state can be utilized as information for setting conditions such as reflow. *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
  • Other measurement, recording and measuring instruments
  • Other image-related equipment

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Stereo X-ray Image 3D Analysis Device

Stereo X-ray Image 3D Analysis Device

A 3D stereo X-ray imaging system completed through joint development with two venture companies!

The "Stereo X-ray Image 3D Analysis Device" provides a high-speed and high-precision 3D measurement method suitable for industrial applications by performing 3D measurements using only X-ray images from two directions, unlike X-ray CT. This product can be applied for various purposes and allows for precise measurement and detailed examination of the bonding wires inside semiconductor packages from multiple viewpoints. 【Features】 ■ High-precision 3D measurement ■ Precise calibration ■ Applicable for various purposes *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment
  • Other measurement, recording and measuring instruments
  • Other image-related equipment

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Shipbuilding / Underwater Robot Development Three-Dimensional Motion Analysis Device Qualisys

Shipbuilding / Underwater Robot Development Three-Dimensional Motion Analysis Device Qualisys

Wide-ranging support from fishing gear development to shipbuilding, underwater unmanned robot development, and research.

Model ship motion analysis experiments can be conducted over a wide range. Qualisys supports long-range active markers, allowing it to recognize and track model ships located more than 100 meters away, which is impossible with standard markers. By using long-range active markers, it enables motion analysis of objects moving over large distances. Additionally, Qualisys has the world's only optical underwater camera, making it possible to obtain highly accurate underwater motion data that was previously unattainable. This opens up new possibilities for various research areas, including fishing gear, ship propellers, and naval research. Furthermore, by combining ground-based Qualisys cameras with underwater Qualisys cameras, it is also possible to integrate ground data with underwater data.

  • 3D measuring device
  • Other measurement, recording and measuring instruments
  • Testing Equipment and Devices

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