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Analysis Product List and Ranking from 381 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Analysis Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. ダイコーテクノ Hiroshima//others
  2. 中電シーティーアイ 本社 Aichi//Service Industry
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 環境シミュレーション Tokyo//software
  5. 5 同仁グローカル Kumamoto//others
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Analysis Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. 水処理分野向け　流体解析サービス 中電シーティーアイ 本社
  2. Metabolome analysis 同仁グローカル
  3. Food-grade twin-screw extruder "TEX-F"
  4. 4 FEM (Finite Element Method) Contract Analysis Service ベンカン機工
  5. 5 Hepasine™ liver-related health indicator analysis service for medical institutions. プロトセラ

Analysis Product List

136～150 item / All 1057 items

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[Analysis Case] Extraction, Chemical Decomposition, and Structural Analysis of Lignin

[Analysis Case] Extraction, Chemical Decomposition, and Structural Analysis of Lignin

Various analyses targeting the wood biomass component "lignin" are possible.

Lignin is an aromatic polymer component that accounts for about 30% of wood biomass, and attention is being drawn to its potential as an alternative to petrochemical raw materials and its use in engineering plastics. This document presents a comprehensive evaluation of lignin, starting from extraction from wood to chemical structure analysis. Measurement methods: NMR, LC/MS, GC/MS Product fields: Environment, Biotechnology, Polymer Materials Analysis purposes: Composition evaluation, identification, chemical bonding state evaluation, structural evaluation For more details, please download the document or contact us.

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  • Contract Analysis
  • Contract measurement

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What can be understood from first-principles calculations.

What can be understood from first-principles calculations.

We will introduce the target of analysis, the physical property information obtained, and examples of analysis.

Analysis targets (Information such as composition and crystal structure is required for calculations) ? The main analysis targets are systems with periodicity, such as crystals. ? Calculations for systems with amorphous structures, surfaces, and interfaces are also possible. Obtained physical property information ? Crystal structure parameters (lattice constants, atomic arrangements, etc.) ? Electronic structure and spin states (charge distribution, band structure, Fermi surface, magnetic moments, etc.) ? Chemical bonding states such as covalent bonds and ionic bonds ? Stable structures and defect formation energies when lattice defects such as atomic substitutions and vacancies are present ? Formation energies and atomic arrangements of surfaces and interfaces ? Information related to chemical reactions, such as activation energies and structures of intermediates ? Electronic response characteristics such as dielectric functions, electrical resistivity, and Seebeck coefficients ? Thermodynamic quantities of solids, such as specific heat ? Various spectroscopic spectra (XPS, XAFS, etc.)

  • Contract measurement
  • Contract Analysis

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Structural analysis using NMR (nuclear magnetic resonance) spectroscopy.

Structural analysis using NMR (nuclear magnetic resonance) spectroscopy.

Measurement of the light solvent as is.

NMR is typically performed using the resonance signals of deuterium (2H or D) nuclei in deuterated solvents for reasons such as ensuring the stability of the magnetic field. However, by using the resonance signals of proton (1H) nuclei, measurements can also be conducted with light solvents (i.e., regular solvents) (No-D measurement method). The effective measurements for the No-D method are as follows: - Measurements to evaluate interactions with light solvents (e.g., degradation studies in light solvents) - Measurements of samples that cannot use deuterated solvents (e.g., samples in the biochemical field such as proteins) - Measurements of samples containing volatile components - Measurements of samples for which no dissolvable deuterated solvents are available.

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  • Contract Analysis
  • Contract measurement

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[Analysis Case] Simulation of Impurity Diffusion in Silicon Crystals

[Analysis Case] Simulation of Impurity Diffusion in Silicon Crystals

It is possible to determine the diffusion pathways and barriers through simulation.

The electrical, optical, and magnetic properties of semiconductors are strongly influenced by defects and impurities present in the system. Therefore, to achieve the desired material properties, it is necessary to understand and control the behavior of defects and impurities. However, evaluating atomic-level microscopic behavior through experimental methods is challenging, making approaches using computational simulations effective. This document presents a case study using first-principles calculations with the NEB (Nudged Elastic Band) method to evaluate the diffusion pathways and barriers of metal impurities (Fe) in silicon crystals.

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  • Contract Analysis
  • Contract measurement

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[Analysis Case] Analysis of Bacteria Using DNA Analysis

[Analysis Case] Analysis of Bacteria Using DNA Analysis

We will analyze the bacteria in the sample from DNA without isolation or culture.

Bacteria have various growth environments depending on their species, and there are many bacteria that are difficult to isolate and culture. Therefore, by extracting and analyzing DNA, which is the blueprint of life that all bacteria possess, it becomes possible to investigate the existing bacteria without isolation or culture. Here, we will introduce examples of analysis methods for sequencing bacterial DNA to infer the existing bacteria through microbiome analysis, as well as investigating bacterial numbers using real-time PCR methods.

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  • Contract Analysis

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[Analysis Case] Three-Dimensional Structural Analysis of 3D Printed Objects

[Analysis Case] Three-Dimensional Structural Analysis of 3D Printed Objects

We will utilize the measurement and analysis of the product's three-dimensional structure for quality control!

Our organization offers three-dimensional structural analysis of 3D printed objects. Understanding the differences between the design drawings and the manufactured products is an important process in quality control. By conducting X-ray CT measurements, it becomes possible to compare the three-dimensional structural "discrepancies" between the printed objects and the design drawings, allowing for an evaluation of the quality. In this case study, we are evaluating molded products made from resin-based materials, but similar evaluations can also be conducted for molded products made from metal-based materials that allow X-rays to pass through. [Measurement Method / Processing Method] ■ X-ray CT Method *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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Analysis case: Assignment of the Raman spectrum of copper phthalocyanine.

Analysis case: Assignment of the Raman spectrum of copper phthalocyanine.

By combining actual measurements and simulations, detailed peak attribution is possible!

Our organization is conducting the assignment of the Raman spectrum of copper phthalocyanine through quantum chemical calculations. By comparing the measured results with the simulation results from quantum chemical calculations, we can perform spectral assignment, which allows for the analysis of vibrational modes. Here, we will introduce a case study of the analysis of "copper phthalocyanine," which is also expected to be utilized in organic thin-film transistors and other applications. 【Measurement and Processing Methods】 ■ [Raman] Raman Spectroscopy ■ Computational Science, AI, Data Analysis *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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Transmission line analysis

Transmission line analysis

Investigate and implement measures for causes that may lead to malfunction on the circuit board, such as SI analysis.

Printed circuit board design technology utilizing transmission line simulation and EMI suppression support tools.

  • Printed Circuit Board
  • EMC countermeasure products
  • Prototype Services

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Simple Thermal Analysis Service

Simple Thermal Analysis Service

We can provide simple thermal analysis solutions for issues related to the substrate's "heat."

In terms of heat dissipation measures for the substrate, pre-simulation is crucial. Our company will confirm various heat dissipation conditions of the substrate during the estimation and provide "simple thermal analysis."

  • Circuit board design and manufacturing

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Fluid and Solidification Analysis Service "Casting Simulation"

Fluid and Solidification Analysis Service "Casting Simulation"

Significantly contributes to shortening delivery times and reducing production costs! Analysis service to optimize mold designs and casting conditions.

The fluid flow and solidification analysis service "Casting Simulation" is designed to perform flow and solidification analysis of molten materials within molds in order to establish the best mold design and casting conditions during the initial design phase. By utilizing the latest software for simulation, it minimizes the need for modifications after the first trial. This enables higher quality, shorter delivery times, and significantly reduced production costs. It allows for high precision, high airtightness, and high strength. 【Features】 ○ Flow analysis and solidification analysis ○ Minimization of modifications ○ Enables high quality ○ Shortened delivery times ○ Cost reduction For more details, please contact us or download the catalog.

  • Mold Design

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Structural analysis of paint fragments using a micro-infrared spectroscopic imaging system.

Structural analysis of paint fragments using a micro-infrared spectroscopic imaging system.

[Free Gift] Technical Documentation Using a Cutting-Edge Micro Infrared Spectroscopy Imaging System

Automotive paint is composed of multiple layers of paint to enhance weather resistance and aesthetic quality, with the layer structure and types of paint varying by vehicle model. Therefore, the component analysis of each layer that makes up a paint chip provides valuable information for identifying the vehicle model. This document presents case studies on the analysis of automotive paint chips conducted using a state-of-the-art micro-infrared spectroscopic imaging system. [Contents] ■ Introduction ■ Samples and Analysis System ■ Data Analysis ■ Results ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Real-time analysis of photopolymerization reactions using rapid scan FT-IR.

Real-time analysis of photopolymerization reactions using rapid scan FT-IR.

Provides very useful information for elucidating reaction mechanisms! Essential for the development of functional materials.

We would like to introduce our "Real-time Analysis of Light Curing Reactions Using Rapid Scan FT-IR." By analyzing changes in molecular structure during polymerization reactions using infrared spectra, we can gain a detailed understanding of specific chemical changes and reaction rates, providing very useful information for elucidating reaction mechanisms. Furthermore, we can indicate pathways for practical application, such as optimizing material properties and manufacturing processes. [Features] ■ Provides very useful information for elucidating reaction mechanisms ■ Capable of indicating pathways for practical application, such as optimizing material properties and manufacturing processes *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices

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Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

It can be confirmed without loss by the "sampling method that protects the surface" of the adhered layer (approximately 20nm) on the surface of the connector terminal plated with STEM.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information about the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. The following features are also available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information about crystal defects (dislocations, twins, etc.) within the crystal In this case, we will introduce "Failure Analysis of Au-Plated Connector Terminal Contacts Using STEM." Please take a moment to read the PDF materials. Additionally, our company conducts various cross-sectional analyses using not only STEM but also TEM and SEM. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Plating Equipment
  • Contract Analysis
  • Other metal materials

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Evaluation of semiconductor insulating films using STEM/EDS.

Evaluation of semiconductor insulating films using STEM/EDS.

STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information regarding the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. Additionally, the following features are available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information on crystal defects (dislocations, twins, etc.) within the crystal In this case, we introduce "Evaluation of Semiconductor Insulating Films using STEM-EDS." This case yielded no issues, but abnormal detection is also possible. Please take a moment to read the PDF materials. Furthermore, in addition to this STEM, our company excels in identifying defective areas by performing 3D reconstruction on specific regions of the sample in combination with FIB. We would be happy to provide a demonstration, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Semiconductor inspection/test equipment
  • Contract Analysis
  • Other semiconductors

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Analysis of AC Resistance of the Ritz Line

Analysis of AC Resistance of the Ritz Line

Low-cost AC resistance calculation is possible! A solution for AC analysis of Ritz lines.

When an alternating current is applied to a Litz wire, it is known that the resistance increases with higher frequencies due to the skin effect and proximity effect, and this AC resistance can be determined through electromagnetic field analysis. This document introduces examples of calculating the AC resistance of a Litz wire twisted in two stages using EMSolution. By utilizing the periodic symmetry conditions available in EMSolution, it demonstrates that AC resistance calculations using a three-dimensional model of the Litz wire can be performed with low computational costs. **Benefits of calculating AC resistance through electromagnetic analysis:** - Frequency-dependent characteristics of AC resistance can be obtained before prototyping. - The quantitative impact of the number of strands and twist pitch on AC resistance can be understood. - The current distribution within the strands can be visualized. - A deeper understanding of the phenomena can be achieved. *For more details, please refer to the PDF document or feel free to contact us.*

  • Magnetic field analysis/electromagnetic wave analysis
  • Contract Analysis
  • Analysis Services

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