We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Analysis.
ipros is IPROS GMS IPROS One of the largest technical database sites in Japan that collects information on.

Analysis Product List and Ranking from 382 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Oct 15, 2025~Nov 11, 2025
This ranking is based on the number of page views on our site.

Analysis Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Oct 15, 2025~Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. ダイコーテクノ Hiroshima//others
  2. 中電シーティーアイ 本社 Aichi//Service Industry
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 環境シミュレーション Tokyo//software
  5. 5 同仁グローカル Kumamoto//others

Analysis Product ranking

Last Updated: Aggregation Period:Oct 15, 2025~Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. 水処理分野向け 流体解析サービス 中電シーティーアイ 本社
  2. Metabolome analysis 同仁グローカル
  3. Food-grade twin-screw extruder "TEX-F"
  4. 4 FEM (Finite Element Method) Contract Analysis Service ベンカン機工
  5. 5 Hepasine™ liver-related health indicator analysis service for medical institutions. プロトセラ

Analysis Product List

121~135 item / All 1059 items

Displayed results

Power product electrical analysis services

Design and development support considering the transmission line characteristics of power products.

Our company provides design support based on a wide range of experience in semiconductor application products, from LSI to power electronics. In the field of power electronics, represented by inverters, which has gained attention in recent years, solving challenges during switching is a key point. We can offer comprehensive design support, from transmission line analysis using electromagnetic field analysis simulators to product evaluation, and further to analysis and verification of circuit simulations.

  • Calibration and repair

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Analysis of crystal grains below 30nm using the EBSD method.

EBSD: Electron Backscatter Diffraction

By conducting EBSD analysis on thinned samples, higher spatial resolution can be achieved compared to conventional bulk samples.

  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[Analysis Case] Analysis of H termination on Si surface

Qualitative and relative comparison of SiH and states on the Si surface due to differences in processing.

We compared the states of the Si surface after HF treatment and after ozone treatment. In the positive ion spectrum, the peak intensity of Si was different. The weaker Si intensity after HF treatment is due to Si being metallic, while the stronger Si intensity after UV-ozone cleaning and in the As Received state is due to Si being oxide-based. From the negative ion spectrum, fragment ions reflecting the surface state were detected: SiF, SiH, and Six series after HF treatment, and SiO2 series after UV-ozone cleaning and in the As Received state.

  • 定性スペクトル_負イオン.png
  • 負イオンピークリスト.png
  • サムネ.png
  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[Analysis Case] Structural Analysis of Epoxy Resin

Structural analysis of LED encapsulants using thermal decomposition GC/MS method.

Epoxy resin is excellent in heat resistance, chemical resistance, and insulation properties, and also has high mechanical strength, making it suitable for various applications such as insulation materials for electronic devices, adhesives, paints, and construction materials. However, due to the lack of solvent solubility, the analytical methods for structural determination are limited. This case presents an example of thermal decomposition GC/MS measurement of epoxy resin used as a sealing material for LEDs. The thermal decomposition products reflecting the structures of the main agent and curing agent were obtained, and this resin was estimated to be a bisphenol A/anhydride type epoxy resin.

  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[Analysis Case] Peptide Sequence Analysis by LC/MS/MS

We will analyze the amino acid sequence of the peptide using LC/MS/MS analysis.

When peptides are measured using LC/MS/MS, characteristic fragment ions are obtained, allowing for the analysis of the amino acid sequence that makes up the peptide. Additionally, because peptides are separated and analyzed by LC, it is possible to analyze the sequences even in samples containing multiple peptides or impurities. Here, we present a case study where low molecular weight peptides were analyzed using LC/MS/MS, and the amino acid sequences were estimated.

  • クロマト_MSMSスペクトル.png
  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Shotgun analysis of proteins

LC/MS/MS: Liquid Chromatography-Mass Spectrometry

In protein composition analysis, there are methods to examine only the target protein after electrophoresis, but this document introduces "shotgun analysis," which comprehensively investigates proteins. In shotgun analysis, after separating proteins and obtaining mass information using LC/MS/MS measurements, a database search is conducted to comprehensively analyze the proteins present in the solution.

  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

Microscopic structural analysis of amorphous films is possible through simulation.

Amorphous SiNx (a-SiNx) films exhibit significant changes in physical properties from semiconductors to insulators due to compositional variations such as the N/Si ratio, making them suitable for a wide range of applications, including gate insulating films for transistors. On the other hand, experimental methods capable of atomic-level microscopic structural analysis for materials with non-crystalline amorphous structures are limited. Therefore, creating and analyzing amorphous structures with various compositions and densities through simulation becomes an effective tool. This document presents examples of structural analysis of a-SiNx films using molecular dynamics calculations.

  • Contract Analysis
  • Memory

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

XPS spectrum data analysis service

I will take care of the analysis of your XPS spectral data and the creation of the report.

In recent years, advancements in measurement devices have made it possible to obtain high-quality and large amounts of XPS spectral data in a short period. However, analyzing the acquired spectral data requires not only time and effort for database research and mastering analytical techniques but also often demands judgments backed by past experience, which poses a barrier to the effective utilization of the devices and data held. MST offers a one-stop service for users facing such challenges, handling everything from analysis to report creation for your XPS spectral data.

  • データ例1.png
  • データ例3.png
  • データ例4.png
  • サムネ.png
  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Defect level analysis in wide bandgap semiconductor GaN using first-principles calculations.

Various physical property information such as point defect formation energy, charge, and optical transitions can be obtained.

Gallium nitride (GaN), a wide bandgap semiconductor, is primarily used in the field of power devices, and in recent years, there has been an increasing demand for applications such as rapid chargers and 5G communication base stations. In the development of high-reliability GaN, it is important to understand the reduction of defects in the crystal and the impact of these defects on electrical and optical properties. This document presents a case study analyzing the defect levels formed by nitrogen vacancies (VN) in GaN using first-principles calculations. This analysis is applicable not only to vacancies but also to various point defects in crystalline materials, such as element substitutions. For more details, please download the document or contact us.

  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[Analysis Case] Three-Dimensional Structure Analysis of Hair

Quantitative evaluation of hair is possible using X-ray CT and image analysis technology.

Hair that has been damaged by factors such as hair color, ultraviolet rays, and aging undergoes structural changes, and measuring these structural changes is important for the research and development of hair care products. In this case, we observed the structure of hair using X-ray CT. Furthermore, by performing image analysis on the obtained CT cross-sectional images, we created histograms of the void volume in the cortex and the spacing of the cuticles. By combining X-ray CT and image analysis in this way, it is possible to quantitatively evaluate the three-dimensional structure of hair. Measurement methods: X-ray CT, computational science, AI, data analysis Product fields: Biotechnology, pharmaceuticals, cosmetics Analysis objectives: Shape evaluation, structural evaluation For more details, please download the materials or contact us.

  • Contract Analysis
  • Contract measurement

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[Analysis Case] Analysis of Organic EL (OLED) Emission Layer

Quantitative evaluation of the guest in the light-emitting layer and film thickness is possible.

Organic EL displays are advancing towards practical use by leveraging advantages such as high brightness, high-resolution color, and thinness due to their self-emission principle. In the emission layer, guest molecules are doped into host molecules to enhance the emission efficiency. In this study, we identified the emission layer materials for red pixels in organic EL display elements. Additionally, we conducted thickness evaluation of the emission layer using a newly developed step gauge and quantified the guest materials within the emission layer. This allows for qualitative and quantitative analysis of guest molecules in the emission layer, as well as evaluation of the thickness of the emission layer. Measurement methods: TOF-SIMS, TEM, XPS Product field: Displays Analysis purpose: Composition evaluation, identification, thickness evaluation For more details, please download the materials or contact us.

  • C0033_2.png
  • C0033_3.png
  • LCD display

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration