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Analysis Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Analysis Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. ユーロフィンFQL Kanagawa//Service Industry
  2. The Japan Steel Works, Ltd. Plastics Machinery Business Tokyo//Industrial Machinery
  3. 有限会社エムティプレシジョン Tokyo//Optical Instruments
  4. 4 Bühler K.K. Kanagawa//Food Machinery
  5. 5 ヒューリンクス Tokyo//software
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Analysis Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Yearly increasing battery fire incidents. Free distribution of safety evaluation guidebook! ユーロフィンFQL
  2. Food-grade twin-screw extruder "TEX-F" The Japan Steel Works, Ltd. Plastics Machinery Business
  3. Food-grade twin-screw extruder 'TEX-F' The Japan Steel Works, Ltd. Plastics Machinery Business
  4. 4 Positioning control with a laser distance sensor that can be retrofitted to a ceiling crane. 有限会社エムティプレシジョン
  5. 5 Graph Creation and Data Analysis for Researchers: KaleidaGraph ヒューリンクス

Analysis Product List

106～120 item / All 1079 items

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Failure analysis of an orange LED damaged by electrostatic discharge.

Failure analysis of an orange LED damaged by electrostatic discharge.

We will introduce a comparison of brightness and characteristics between good products and ESD-damaged products, along with examples of luminescence analysis using EMS microscopy!

We conduct failure analysis of orange LEDs that have been damaged by electrostatic discharge (ESD). LEDs that have been destroyed in ESD testing and show a decrease in luminous intensity can be analyzed using emission luminescence and the IR-OBIRCH method, allowing us to clarify the failure phenomena. We have examples such as "Comparison of brightness and characteristics between good products and ESD-damaged products" and "Luminescence analysis using emission microscopy." [Analysis Examples] ■ Comparison of brightness and characteristics between good products and ESD-damaged products - By polishing the lens part of a bullet-type LED to flatten it, dark areas were observed during brightness comparison. ■ Luminescence analysis using emission microscopy - In ESD-damaged products, dark areas were observed under forward bias, while only the damaged areas emitted light under reverse bias. ■ IR-OBIRCH and SEI analysis - Detailed damage locations were identified through IR-OBIRCH analysis of ESD-damaged products. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Analysis of good LCD panels

Analysis of good LCD panels

Check the quality status of LCD components and products! We will analyze the structures of the LCD panels using our analytical methods and expertise!

At AITES, we conduct quality analysis of LCD components/products, confirming the quality status of products based on our expertise in LCDs. The target panels include SEG-LCD, AM-LCD (a-Si TFT / LTPS TFT), OLED for automotive, monitors, mobile devices, and more. We perform quality analysis using our analytical methods on the various structures of liquid crystal panels. 【Analysis Content (Excerpt)】 <Reliability/Lighting Tests> ■ Classification - Reliability Tests - Lighting Inspections ■ Analytical Methods - Oven Drive Tests - Visual Inspection *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis Services
  • Contract Analysis

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Power semiconductor analysis service

Power semiconductor analysis service

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis regarding the malfunctioning part!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu office in 1993, we have cultivated our own unique analysis and evaluation techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 ■ OBIRCH analysis supports not only Si but also SiC and GaN devices ■ FIB processing is possible from either side ■ Visualization of the depletion layer formed at the PN junction ■ Elemental analysis such as EDS and EELS is also supported *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis
  • Semiconductor inspection/test equipment

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Defective analysis of liquid crystal panels

Defective analysis of liquid crystal panels

We will narrow down the defective areas through lighting confirmation, panel disassembly, and optical microscope observation!

We provide a defect diagnosis menu for LCD panels, from confirming defects to identifying causes and conducting detailed failure analysis. In the initial analysis, we perform a status check (lighting test), panel disassembly, and optical microscope observation, tailored to the defect symptoms. In the detailed analysis, based on the diagnostic results from the initial analysis, we propose suitable methods such as surface analysis, cross-sectional analysis, and component analysis. It is also possible to speculate on the mechanisms of defect occurrence, including narrowing down the production processes that caused the defects. 【Analysis Content】 ■ Initial Analysis - Status check (lighting test), panel disassembly, optical microscope observation, conducted according to defect symptoms - Narrowing down from general areas such as cell panels and peripheral circuits to finer details ■ Detailed Analysis (additional analysis fees apply) - Based on the diagnostic results from the initial analysis, we propose suitable methods such as surface analysis, cross-sectional analysis, and component analysis - It is also possible to speculate on the mechanisms of defect occurrence, including narrowing down the production processes that caused the defects *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Research Institute of Chemical Reaction Mechanisms, Material Degradation Analysis (Decomposition and Deterioration of PET)

Research Institute of Chemical Reaction Mechanisms, Material Degradation Analysis (Decomposition and Deterioration of PET)

We will suggest appropriate analysis methods based on the condition of polymer materials and samples!

At AITES Co., Ltd., we conduct material degradation analysis. We propose appropriate analytical methods based on the condition of polymer materials and samples. By analyzing the degradation process that the material has undergone and optimizing the polymer materials and usage environment, it is possible to extend the product's lifespan. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Analysis Services
  • Contract Analysis

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Panel Polarizer Degradation Analysis

Panel Polarizer Degradation Analysis

Examples of degradation analysis of panel polarizers are published! We conducted degradation analysis through reliability testing and outgassing analysis using HS-GCMS.

The polarizers used in LCD panels are made of multilayer films laminated with materials such as triacetyl cellulose, polyvinyl alcohol, and polyethylene terephthalate. This document presents a case study of the degradation analysis of panel polarizers after reliability testing, conducted through HS-GCMS analysis and thermal desorption GCMS analysis. Even invisible degradation might be detected with this analysis?! Please take a moment to read it. [Contents] ■ Reliability Testing ■ Outgassing Analysis via HS-GCMS ■ Low Boiling Point Component Analysis via Thermal Desorption GCMS *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Other contract services

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Microscopic EL/PL imaging device PVX1000+POPLI-μ

Microscopic EL/PL imaging device PVX1000+POPLI-μ

Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.

The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess damage to the passivation layer around laser contact holes. Additionally, defect location identification is possible through EL observation of modules using a DC power supply.

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  • Image Processing Equipment
  • Defect Inspection Equipment
  • Contract measurement

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EL/PL imaging device PVX1000+POPLI-Octa

EL/PL imaging device PVX1000+POPLI-Octa

Wafer can be evaluated using photoluminescence during the solar cell manufacturing process.

The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the locations of defects. By applying reverse bias to the module and observing LEAK points, defects causing PID can be easily identified.

  • Image Processing Equipment

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Analysis of film property changes due to UV irradiation.

Analysis of film property changes due to UV irradiation.

Investigating how the light transmittance of blue light cut film changes using a spectrophotometer!

Blue light cut film has the effect of suppressing the transmission of visible light, particularly light with a wavelength of 500nm or less, compared to regular PET film. Using a spectrophotometer, we examined how the light transmission of the blue light cut film changes under UV irradiation. The transmission of light in the wavelength range of 350 to 400nm decreased further due to UV irradiation. Additionally, we conducted an analysis of the reactions occurring within the film using GC-MS. [Analysis Content] ■ Light transmission characteristics of regular PET film and blue light cut film ■ UV irradiation on blue light cut film ■ GC-MS analysis of components within the film *For more details, please refer to the PDF document or feel free to contact us.

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  • Ultraviolet irradiation equipment

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Analysis of good quality overseas manufactured LCD displays

Analysis of good quality overseas manufactured LCD displays

If any issues arise, detailed analysis will also be provided! A simplified analysis for customers considering the introduction of overseas LCDs.

We will introduce the analysis of good products for liquid crystal displays by Aites Co., Ltd. First, we conduct optical microscope observations focusing on the FPC, FOG, COG, and sealing materials in the state of the cell panel as part of the appearance observation. Next, we dismantle the cell panel to check the sealing materials, PI film, and TFT shape. If any defects are found during the good product analysis, we will propose additional analyses such as cross-sectional observation of wiring and foreign matter analysis to investigate the cause. Please feel free to consult us when needed. [Contents of Appearance Observation] ■ Are there any corrosion or foreign matter on the FPC wiring? ■ Is there any issue with the FOG bonding? ■ Is there any issue with the COG bonding? ■ Are there any breaks or defects in the sealing material? *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis Services

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Power product electrical analysis services

Power product electrical analysis services

Design and development support considering the transmission line characteristics of power products.

Our company provides design support based on a wide range of experience in semiconductor application products, from LSI to power electronics. In the field of power electronics, represented by inverters, which has gained attention in recent years, solving challenges during switching is a key point. We can offer comprehensive design support, from transmission line analysis using electromagnetic field analysis simulators to product evaluation, and further to analysis and verification of circuit simulations.

  • Calibration and repair

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WTI Heat and Stress Clinic - Heat and Stress Simulation - (Analysis)

WTI Heat and Stress Clinic - Heat and Stress Simulation - (Analysis)

If a product malfunctions, let's consult a specialist (expert) and take measures! Simulation, analysis.

"Troubles have occurred with development and mass-produced products. I want to quickly identify the cause and implement countermeasures." "I want to understand the necessity of heat dissipation measures and the methods for implementing them." By receiving diagnostic results and solutions for defects from experts in heat and stress, you can resolve issues in a short period of time. (Simulation, analysis) By utilizing this before product prototyping, it is possible to know in advance the "preventive measures" to prevent product troubles related to heat and stress. By conducting development in accordance with these "preventive measures," you can significantly avoid issues arising towards the end of the development period, design revisions, and the resulting time losses. [Features] ■ Understand actual products and provide analysis results ■ Provide solutions that combine various technologies ■ Possess a unique semiconductor thermal resistance measurement technology developed based on the structure and thermal characteristics of semiconductors *For more details, please refer to the PDF materials or feel free to contact us.

  • Circuit board design and manufacturing
  • Other contract services

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