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Analysis(tem) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
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Analysis Product List

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Power semiconductor analysis service

Power semiconductor analysis service

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis regarding the malfunctioning part!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu office in 1993, we have cultivated our own unique analysis and evaluation techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 ■ OBIRCH analysis supports not only Si but also SiC and GaN devices ■ FIB processing is possible from either side ■ Visualization of the depletion layer formed at the PN junction ■ Elemental analysis such as EDS and EELS is also supported *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis
  • Semiconductor inspection/test equipment

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Phase analysis of duplex stainless steel using EBSD.

Phase analysis of duplex stainless steel using EBSD.

You can understand the performance comparison of metals and metal compounds in terms of hardness and brittleness, as well as why discoloration issues occur.

Electron Backscatter Diffraction Pattern (EBSD) allows for the following when combined with a Scanning Electron Microscope (SEM): - Separation of phases with different crystal systems - Distribution ratio and crystal orientation analysis for each separated phase In this case, we introduce phase analysis of a two-phase stainless steel using EBSD. With EBSD, the distribution ratio and crystal orientation of the α phase and γ phase in the two-phase stainless steel were confirmed. This measurement technique can be utilized to compare properties such as hardness and brittleness in the distribution of materials in metals and metal compounds, as well as to detect the degree of precipitation and understand its impact on color. We encourage you to give it a try. Additionally, our company conducts various cross-sectional analyses using TEM and surface analysis using XPS, allowing for multifaceted analytical assessments. Our engineers are available to assist directly, so please feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/

  • Contract Analysis
  • Other metal materials
  • stainless

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Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

It can be confirmed without loss by the "sampling method that protects the surface" of the adhered layer (approximately 20nm) on the surface of the connector terminal plated with STEM.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information about the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. The following features are also available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information about crystal defects (dislocations, twins, etc.) within the crystal In this case, we will introduce "Failure Analysis of Au-Plated Connector Terminal Contacts Using STEM." Please take a moment to read the PDF materials. Additionally, our company conducts various cross-sectional analyses using not only STEM but also TEM and SEM. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Plating Equipment
  • Contract Analysis
  • Other metal materials

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Surface and thin film analysis of semiconductors

Surface and thin film analysis of semiconductors

Detailed investigation of surface chemical composition, bonding states, and impurity distribution!

We would like to introduce our "Surface and Thin Film Analysis of Semiconductors." We propose effective analyses for material evaluation and failure mode identification in the process development, process management, and failure analysis of semiconductor devices. We provide detailed information that is useful for research and development, manufacturing processes, and failure analysis by examining the chemical composition, bonding states, and impurity distribution of surfaces. Please feel free to contact us when you need our services. 【Top Surface】 ■Composition: XPS ■Bonding State: XPS ■Contamination: TOF-SIMS, ICP-MS ■Roughness: AFM, SEM *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis

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Evaluation of semiconductor insulating films using STEM/EDS.

Evaluation of semiconductor insulating films using STEM/EDS.

STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information regarding the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. Additionally, the following features are available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information on crystal defects (dislocations, twins, etc.) within the crystal In this case, we introduce "Evaluation of Semiconductor Insulating Films using STEM-EDS." This case yielded no issues, but abnormal detection is also possible. Please take a moment to read the PDF materials. Furthermore, in addition to this STEM, our company excels in identifying defective areas by performing 3D reconstruction on specific regions of the sample in combination with FIB. We would be happy to provide a demonstration, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Semiconductor inspection/test equipment
  • Contract Analysis
  • Other semiconductors

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Specification verification and failure analysis through reliability testing.

Specification verification and failure analysis through reliability testing.

Analysis can be performed on samples in various conditions thanks to our unique preprocessing technology!

Our company conducts consistent analysis from reliability testing to failure analysis. This allows us to confirm whether the samples meet the specifications, as well as to identify and observe the defective areas of failed samples. We propose and implement tests and analyses tailored to our customers' requests and objectives, assisting from cause investigation to problem resolution. Please feel free to contact us when you need our services. 【Analysis Flow】 ■ Specification confirmation of semiconductor devices through reliability testing ■ Identification of defective areas and observation of failure points using TEM ・ Identification of defective areas through EMS/OBIRCH analysis ・ Observation of failure points using TEM *For more details, please download the PDF or feel free to contact us.

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  • Other Testing Contract
  • Contract Analysis

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Genetic Analysis: Cell Line Authentication (STR Analysis) Contract Analysis Service

Genetic Analysis: Cell Line Authentication (STR Analysis) Contract Analysis Service

For the identification and authentication of human cell lines and the detection of cross-contamination within the same cell line!

Our company offers a cell line authentication (STR analysis) contract analysis service. We determine the STR (short tandem repeat) genotype from samples derived from human cultured cells. We use the GenePrint® System (10 loci) or the PowerPlex® 16 System (16 loci). Please use this service for the identification and authentication of human cell lines, as well as for detecting cross-contamination within the same type of cell lines. 【Features】 - Determine STR genotype from samples derived from human cultured cells. - Use the GenePrint® System, which is suitable for the identification and authentication of human cell lines and for detecting cross-contamination within the same type of cell lines. - Use the PowerPlex® 16 System, which is suitable for confirming the genotype of iPS/ES cells. - We can provide a free English report for customers who wish to submit it for publication. *For more details, please refer to the PDF materials or feel free to contact us.

  • Contract Analysis

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EMI analysis using R&S RTO/RTE

EMI analysis using R&S RTO/RTE

Implemented important functions to capture and analyze unnecessary radiation.

The R&S RTO/RTE digital oscilloscope is a valuable tool for analyzing EMI issues in electronic design. High input sensitivity, high dynamic range, and powerful FFT implementation are essential features for capturing and analyzing unwanted emissions. 【Applications】 ■ Easy setup ■ Clear navigation across a wide capture bandwidth and frequency domain ■ Implementation of overlapping FFT with color-coded display of spectral components ■ Gate FFT for correlation time-frequency analysis ■ Capture of sporadic events using frequency masks *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • oscilloscope

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FEM (Finite Element Method) Contract Analysis Service

FEM (Finite Element Method) Contract Analysis Service

At Benkan Kiko, we offer services such as strength analysis using FEM (Finite Element Method).

The various special fittings for processes handled by Benkan Kiko require more diverse specifications than commonly used and sold pipe fittings. In particular, pressure resistance performance is a crucial characteristic for ensuring the behavior and safety of pipe fittings under high pressure. Pressure resistance is secured by optimizing the shape and dimensions of the pipe fittings, and one of the design methods used is FEM analysis. This service includes the following main contents: - Design support for piping materials such as pipe fittings using FEM analysis ▻ Design of special-shaped pipe fittings (replacement from cast piping materials in high-pressure environments, etc.) ▻ Evaluation of pressure resistance performance of existing pipe fittings ▻ Manufacturing of special fittings (support from material procurement to manufacturing, testing, inspection, and shipping) - Various responses are possible by combining with our proprietary technology. For inquiries, please first contact our sales representative or use the web inquiry form on our website. From the initial meeting, a dedicated representative from our technical headquarters will respond, allowing you to directly reflect your requests in the analysis results. We can accommodate various meeting formats, including on-site visits, visits to our company, and web conferences (Zoom, MS Teams, etc.). Please feel free to consult with us.

  • Pipe Fittings
  • Beverage Production Equipment
  • Wastewater/wastewater treatment equipment

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[Case Study] Dental Instruments - Vibration Characteristics Simulation of Ultrasonic Scalers

[Case Study] Dental Instruments - Vibration Characteristics Simulation of Ultrasonic Scalers

I investigated the vibration characteristics of ultrasonic scalers based on various chip shapes.

We will introduce a case study of analysis using Simcenter Femap with Nastran, focusing on the vibration characteristics simulation of dental instruments - ultrasonic scalers.

  • Other analyses

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3D Skeleton Analysis with a Single Camera: "VisionPose Singe3D"

3D Skeleton Analysis with a Single Camera: "VisionPose Singe3D"

Compatible with Unity, iOS/iPadOS, and Android! A posture estimation AI engine that enables easy motion capture without markers.

"VisionPose Single3D" is an SDK (Software Development Kit) for a posture estimation AI engine that captures 3D coordinates with a single camera and detects human skeletal information in real-time. It allows for easy motion capture without the need for calibration. Utilizing technology that estimates 3D coordinates from 2D images, it detects skeletal information with up to 30 key points in 2D coordinates and up to 17 key points in 3D coordinates. The skeletal data obtained from the analysis can be used for commercial purposes as well as for research and development, regardless of the application or genre. ■ Features - Easily obtain 3D coordinates with a single camera - Compatible with Unity, iOS/iPadOS, and Android - No restrictions on usage, including commercial use - Comes with two immediately usable standard applications └ Real-time skeletal visualization sample app "BodyAndColor" └ Video & still image analysis app "VP Analyzer" *Excluding iOS/iPad and Android versions - Additional training is possible *Additional training is optional

  • Image analysis software

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FEM stress structural analysis

FEM stress structural analysis

We are utilizing cutting-edge systems such as 3D robot simulation and FEM stress structural analysis to improve productivity and quality.

We use HYPER MESH for FEM analysis modeling. A wide range of engineers, from skilled professionals to young talent, provide stable quality and the latest technology. You can rely on us for everything from design to simulation, analysis, and robot teaching.

  • Other industrial robots
  • Assembly Machine
  • simulator

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Serial Data Analysis SDAIII-CompleteLinQ

Serial Data Analysis SDAIII-CompleteLinQ

Software for serial data analysis compatible with multi-lane for wideband oscilloscopes.

SDAIII-CompleteLinQ can expand up to 4 lanes simultaneously. Multi-lane analysis allows engineers to quickly observe the eye patterns of all lanes. Alternatively, in a single lane, it is possible to analyze multiple different locations from a probing state at one point using LeCroy's differential probes or virtual probe options.

  • oscilloscope

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Real-time behavior analysis "VP-Motion"

Real-time behavior analysis "VP-Motion"

Analyze the handling of tasks and machinery to improve work efficiency! Quickly detect falls and accidents! It can be utilized in a wide range of scenes, including production sites, healthcare, and nursing care.

"VP-Motion" is an AI-powered behavior analysis system that can analyze what actions a person is taking by using skeletal and image information obtained from video. When analyzing workers in manufacturing and production facilities, it can be used to improve work efficiency by analyzing assembly line tasks and machine handling, as well as to quickly detect accidents or falls during work for prompt response. By training the AI embedded in the system, various analyses can be performed. Here is an example of a scenario where it can be used in production sites: - Detecting errors in work procedures or mistakes made by workers in the factory - Detecting mistakes in the installation of parts - Detecting whether proper pointing and calling or safety checks are being conducted within the factory - Detecting individuals who have fallen within the facility *After purchase, customers can manage all operations themselves. If there are any concerns, we also offer various contracting services. Please feel free to consult with us.

  • Other analyses

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