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Analytical Equipment - メーカー・企業224社の業務用製品ランキング | イプロスものづくり

更新日: 集計期間:Jun 03, 2026~Jun 30, 2026
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Analytical Equipmentのメーカー・企業ランキング

更新日: 集計期間:Jun 03, 2026~Jun 30, 2026
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  1. FOSS JAPAN Co., Ltd. Tokyo//Testing, Analysis and Measurement
  2. 一般財団法人材料科学技術振興財団 MST Tokyo//Testing, Analysis and Measurement
  3. サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  4. 4 ビーエルテック Tokyo//Testing, Analysis and Measurement
  5. 5 null/null

Analytical Equipmentの製品ランキング

更新日: 集計期間:Jun 03, 2026~Jun 30, 2026
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  1. Sake FT-IR component analysis device "OenoFoss2" FOSS JAPAN Co., Ltd.
  2. iCAP PRO Series ICP Emission Spectrometer サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K.
  3. Alcohol analysis device for sake Alcolyzer3001 SAKE
  4. 4 Laser Ablation ICP-MS System サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K.
  5. 5 Total Organic Carbon Automatic Analyzer "TOC-200 Series" 東レエンジニアリングDソリューションズ

Analytical Equipmentの製品一覧

661~690 件を表示 / 全 999 件

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[Analysis Case] Secondary Battery

Evaluation of the components distributed on the surface of a single particle of powder is possible.

We will introduce a case where a sheet coated with graphite negative electrode particles used in lithium-ion secondary batteries was analyzed using TOF-SIMS. It was confirmed that graphite and PVDF are distributed on the surface of a single powder particle. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a method suitable for qualitative analysis and imaging of organic and inorganic substances on surfaces from the mass spectrum of secondary ions. It is effective for evaluating the distribution of minute foreign substances and stains due to its high resolution. Measurement method: TOF-SIMS Product field: Secondary batteries Analysis purpose: Composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] LC/MS/MS Analysis of Catechin Metabolites in Urine

Qualitative analysis of catechin metabolites in urine, as well as investigation of temporal changes and individual differences.

By using high-sensitivity LC-MS (Q-TOF type), qualitative analysis of low-concentration components such as metabolites in biological samples is possible. It allows for the search for components that have undergone metabolism such as addition or conjugation in the body, as well as inter-sample comparisons aimed at investigating temporal changes and individual differences. After consuming a high-concentration catechin beverage and collecting urine, both unchanged catechin and the metabolite catechin-glucuronide conjugate were confirmed. The amounts of catechin and metabolites in the urine of eight individuals were plotted for excretion over 0.5 to 8 hours post-consumption, and comparisons were made.

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[Analysis Case] De-gassing Evaluation During Temperature Holding by TDS

You can investigate the changes in degassing intensity while maintaining the temperature.

TDS is a method for real-time detection of desorbed gases while heating the sample in high vacuum or maintaining a constant temperature. An example is shown where a SiN film on a Si substrate was held at 350°C to investigate the amount of H2 desorption. In simple heating, a desorption peak was observed around 500°C, but during the temperature hold at 350°C, the detection intensity of H2 decreased, and a desorption peak was observed upon re-heating.

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Evaluation methods for organic compounds in clean rooms

GC/MS: Gas Chromatography-Mass Spectrometry

In clean rooms where the manufacturing of semiconductors and liquid crystals takes place, it is important to monitor not only particles but also molecular-level chemical contamination (molecular contamination). Floating molecular contaminants include acidic and basic gases, cohesive organic substances, dopants, and metals, and the analysis methods vary depending on the components. Here, we will introduce details about cohesive organic substances and the representative collection methods, "adsorbent collection" and "wafer exposure collection."

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[Analysis Case] Hair Component Analysis

It is possible to evaluate hair components according to the purpose.

TOF-SIMS allows for simultaneous elemental analysis and molecular information analysis of organic and inorganic substances, and it also enables imaging analysis, making it an effective method for analyzing the distribution and penetration of target components in samples. By combining measurement methods and processing for hair, it is possible to evaluate the surface, cross-section, and depth distribution of hair from various perspectives, allowing for component comparison and permeability assessment in hair according to specific objectives.

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[Analysis Case] Imaging Analysis of Pesticide Active Ingredients in Formulations

You can visualize the distribution of pesticide active ingredients and inorganic components in the formulation.

TOF-SIMS can identify components from the mass of molecular ions, allowing for imaging analysis without the need for labels such as fluorescent substances. Additionally, by measuring not only organic components but also inorganic components, it is possible to image not only the active ingredients of pesticides but also the minerals mixed into the formulations. In this study, we visualized the active ingredients of pesticides and inorganic components in two types of formulations with different mixing ratios. In formulation A (high mixing ratio), the active ingredient was widely distributed throughout the formulation, whereas in formulation B (low mixing ratio), the active ingredient was localized.

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[Analysis Case] Evaluation of Organic Component Desorption in a Vacuum

The temperature dependence evaluation of the desorption of specific organic components is possible through composite analysis.

TDS (Thermal Desorption Gas Analysis) is a method that allows for the confirmation of desorbed components and desorption temperatures while heating a sample in a vacuum (1E-7 Pa). Furthermore, by combining the results of TDS with GC/MS (Gas Chromatography-Mass Spectrometry), which can identify organic substances, it is possible to evaluate the desorption temperatures of specific desorbed components in a vacuum. Below, we present an example of a combined analysis of TDS and GC/MS conducted on graphene.

  • Contract Analysis
  • Secondary Cells/Batteries
  • LCD display
  • Analytical Equipment

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[Analysis Case] Degradation Analysis of Liquid Crystal Displays

We will comprehensively evaluate liquid crystals, alignment films, sealing materials, TFTs, and more.

Understanding the degradation mechanism of liquid crystal display panels is an essential theme for extending the lifespan of the panels. Among the degradation symptoms, a decrease in brightness can be attributed to various factors, including liquid crystals, alignment films, sealing materials, and TFTs. A comprehensive analysis will be conducted, incorporating surface, structure, composition, and computational science. By capturing the slight differences between good and defective products and conducting a comprehensive evaluation, we can elucidate the degradation mechanism of liquid crystal displays.

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[Analysis Case] Component Analysis of Water Repellent Areas

TOF-SIMS enables wide-area imaging evaluation of multiple components.

To investigate the causes of defects such as poor adhesion, it is important to gain insights into the surfaces of wafers and devices. In this instance, hydrophobic areas were observed on a silicon wafer, prompting wide-area imaging using TOF-SIMS. As a result, components estimated to be silicone oil, CF-based grease, and paraffin oil were identified from the hydrophobic areas. TOF-SIMS typically has a measurement field of view up to 500μm square, but by moving the stage during measurement, it is possible to evaluate wide-area distributions. Measurement method: TOF-SIMS Product fields: Devices, Displays, Electronic Components, Manufacturing Equipment Analysis objectives: Qualitative, Imaging, Composition Distribution Evaluation For more details, please download the materials or contact us.

  • Contract Analysis
  • Contract measurement
  • Analytical Equipment

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[Case Study] Quality Control through Surface Analysis

The surface adhesion components (such as polydimethylsiloxane) can be evaluated using TOF-SIMS.

TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is a method that can sensitively evaluate organic and inorganic substances on the very surface, and it can be used as an analytical tool for various quality control processes of products. For example, it can be used for regular checks of surface contaminants during product storage, investigating the causes when defects such as peeling or discoloration occur in products, and analyzing changes in key components before and after altering manufacturing conditions. This document presents an example of comparing the surfaces of silicon wafers stored under different environments, focusing on the representative contaminant polydimethylsiloxane (PDMS). Measurement method: TOF-SIMS Product fields: Electronic components, manufacturing equipment, parts, and others (general electronics) Analysis purposes: Surface analysis, evaluation of chemical bonding states, failure analysis, defect analysis, and others (contamination assessment, quality control) For more details, please download the document or contact us.

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  • Contract Analysis
  • Contract measurement
  • Analytical Equipment

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Mass array method: A gene analysis method using mass spectrometry.

Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.

In this method, the differences in the mass of bases are analyzed using MALDI-TOF-MS to determine the DNA base sequence. This allows for the detection of SNPs (single nucleotide polymorphisms), INDELs (insertions/deletions), CNVs (copy number variations), and more. It is characterized by the ability to analyze a large number of samples and detect a wide range of genes at once. - Multiplex PCR and MALDI-TOF-MS enable simultaneous analysis of up to 40 mutation sites. - Mass spectrometry specialized for the detection of bases (A/T/G/C) is possible. - A variety of analytical tools are available that have been pre-designed to detect target genes based on specific purposes. - Custom designs for analytical tools are also possible.

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  • Contract Analysis
  • Contract measurement
  • Analytical Equipment

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MST [Chitose Sales Office] OPEN!

We aim to further improve our services for customers in the Hokkaido area, based at the Chitose Sales Office.

We will open the Chitose Sales Office, the first in the Hokkaido area as MST. Based in the Chitose Sales Office, we aim to further improve our services for customers in the Hokkaido area. We will also achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (lab). Please look forward to it! Opening date: Thursday, April 11, 2024 Address: Room 160, Chitose Arcadia Plaza, 1-3-1 Kashiwadai Minami, Chitose City, Hokkaido *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-4001-1578 (Contact: Yanagimachi)

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[Analysis Case] Impurity Analysis of FeCoNi Alloy

It is possible to simultaneously analyze 77 elements using GDMS.

When impurities are mixed into metallic materials, depending on the combination of elements, it can affect the reduction of toughness and corrosion resistance. Therefore, it is important to understand the amount of impurities in metallic materials for quality control. GDMS can simultaneously analyze 77 elements without standard samples, making it effective for impurity analysis of samples with unknown contained elements, regardless of the matrix. This document presents a case study of impurity analysis of FeCoNi alloys using GDMS. Measurement method: GDMS Product field: Manufacturing equipment and parts Analysis purpose: Trace concentration evaluation For more details, please download the document or contact us.

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[FIB-MS] Focused Ion Beam Mass Spectrometry

This is a method that allows simultaneous shape observation and elemental imaging of small areas using a FIB and a TOF mass spectrometer mounted on an SEM device.

? Surface analysis of solid materials is possible ? Light elements such as Li, which are difficult to evaluate with EDX, can be assessed ? By using Ga ions as primary ions, evaluation can be performed with high surface resolution (on the order of tens of nm) ? The detection limit is as low as a few ppm (depending on the element), making it suitable for trace impurity element analysis compared to EDX ? Measurements can be conducted without atmospheric exposure by using a dedicated holder ? Since it is mounted on a SEM device, morphological observation and elemental analysis can be performed within the same chamber

  • Contract measurement
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SSDP-SIM

SSDP: Substrate Side Depth Profile

In secondary ion mass spectrometry (SIMS), due to phenomena such as surface roughness, the knock-on effect where atoms present on the surface are pushed inward by ion irradiation, and crater bottom roughness, it may not be possible to obtain sharp elemental distributions. To address this issue, the SSDP method (Back-Side SIMS) involves performing SIMS analysis from the substrate side (the back side) after thinning the sample. This technique allows for a more accurate evaluation of elemental distribution without being affected by the sample shape or measurement conditions.

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  • Contract Analysis
  • Contract measurement
  • Analytical Equipment

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Selection of Ionization Methods for TG-DTA-MS: EI Method and PI Method

TG-DTA-MS Thermogravimetric Differential Thermal Mass Spectrometry

EI method: It is capable of detecting both inorganic and organic compounds, making it suitable for initial qualitative analysis. PI method: It allows detection while maintaining the molecular structure through soft ionization.

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  • Contract Analysis
  • Contract measurement
  • Analytical Equipment

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[Analysis Case] Evaluation of Component Distribution in Skin Cross-Section

It is possible to visualize molecular information of organic and inorganic substances.

We created skin tissue samples and evaluated the distribution of biogenic components in freeze-dried samples using TOF-SIMS. Since TOF-SIMS identifies components based on the mass of molecular ions, it does not require labels such as fluorescent substances, allowing for the evaluation of distribution without the influence of labeled materials. The mapping results confirmed that arginine, a natural moisturizing factor (NMF), and cholesterol, which retains moisture as an intercellular lipid, are localized in the stratum corneum. This method is also effective for assessing the permeation state during drug application.

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  • Contract measurement
  • Analytical Equipment

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[Analysis Case] Evaluation of the Component 18-MEA on Hair Surface

It is possible to evaluate 18-MEA, a component of the hair surface, using TOF-SIMS.

The surface of the hair cuticle is covered with a lipid called 18-MEA (18-methyl eicosanoic acid). 18-MEA is said to be the source of hair shine and smoothness, and when it decreases due to UV rays or hair coloring, the cuticle becomes more susceptible to damage. In this case, we will present the results of evaluating the differences in 18-MEA on the surfaces of healthy hair (hair near the root that has not been treated with hair color) and damaged hair (hair that has been treated with hair color) using TOF-SIMS.

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  • Contract Analysis
  • Contract measurement
  • Analytical Equipment

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[Analysis Case] Analysis of α-Alumina (α-Al2O3) by TDS

Thermal desorption gas analysis of ceramics

Thermally stable α-alumina is used in a wide range of applications, including heat-resistant materials, semiconductor packages, and components of semiconductor manufacturing equipment. Among these, dense α-alumina is also used as a material for vacuum devices. However, the gases generated when such materials are heated can adversely affect products and equipment, making it important to understand the outgassing from these materials. In this report, we present a case study comparing the outgassing amounts of porous and dense α-alumina using TDS analysis (temperature-programmed desorption gas analysis).

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[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.

The inner walls of metal pipes, such as SUS, used in various fields can discolor and corrode due to reactions with incoming gases and liquids, leading to a decline in equipment functionality. Understanding the locations prone to discoloration and corrosion, as well as their causes, is an important issue in equipment maintenance. At MST, we provide a comprehensive evaluation from sample cutting to analysis. This document presents a case study of XPS analysis conducted on the inner walls of SUS pipes used in vacuum equipment, highlighting both normal and discolored areas.

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  • Contract Analysis
  • Contract measurement
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[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

Impurities from components of the film formation device, target materials, and plating solutions can contaminate the device and have adverse effects, making the qualitative assessment of impurities on surfaces, within films, and at interfaces important. TOF-SIMS can sensitively evaluate unknown elements present on surfaces, within films, and at interfaces in a single measurement due to the following three characteristics: 1. For metallic elements, ions from m/z 1 to 800 can be detected simultaneously in one measurement. 2. Detection sensitivity of a few ppm can be achieved (varies depending on materials and ions). 3. The use of a sputter gun allows for the evaluation of depth distribution.

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  • Wafer
  • Contract measurement
  • Other semiconductors
  • Analytical Equipment

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[Analysis Case] Qualitative Analysis of Fluorinated Gases

Qualitative analysis of specific freons (CFC/HCFC) and alternative freons (HFC) is possible.

Freon gases are utilized in various applications such as refrigerants, foaming agents, semiconductors, and cleaning agents for precision parts due to their chemically stable nature and minimal impact on human health. On the other hand, they are substances that contribute to ozone layer depletion and global warming, which is why they are regulated by law. In this case, Freon gases were analyzed using GC/MS, and the separation analysis of CF4, which has low polarity and is difficult to separate among PFCs, was conducted. By using GC/MS, it is possible to qualitatively analyze specific Freons such as CFCs, HCFCs, and alternative Freons like HFCs and PFCs.

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  • Contract measurement
  • Environmental Analysis
  • Analytical Equipment

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[Analysis Case] Metal Contamination Analysis of Si Wafer Surface (B0233)

It is possible to obtain a large amount of metal element information at once through qualitative and semi-quantitative analysis!

We offer metal contamination analysis of Si wafers (B0233). The purpose of metal contamination analysis of Si wafer surfaces using ICP-MS includes not only the contamination assessment of the Si wafer itself but also the evaluation of contamination within semiconductor devices and the assessment of the working environment due to Si wafer exposure. Therefore, the analysis of Si wafer surfaces is conducted for various purposes. ICP-MS analysis allows for the highly sensitive measurement of metal contamination on Si wafer surfaces, and it is also possible to specify the evaluation area according to the purpose. [Measurement Method] ■ [ICP-MS] Inductively Coupled Plasma Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Oil Analysis (GC/MS Edition)

When oil contamination is suspected, it is possible to distinguish between types of oil and estimate the source!

Our organization is capable of identifying the composition of petroleum products, evaluating molecular weight distribution, and distinguishing types of oils. Petroleum products such as oils and greases are mixtures of hydrocarbons with various compositions, and GC/MS methods are effective for their qualitative analysis. Here, we present a case study where commercially available oils with different molecular weight distributions were measured using soft ionization methods. Compared to hard ionization methods (EI), soft ionization methods (FI and FD) allow for the detection of molecular ions, making them effective for evaluating the composition of oil components. In particular, the FD method can also be applied to evaluate oils containing high molecular weight components that are difficult to volatilize. [Measurement Method / Processing Method] ■ [GC/MS] Gas Chromatography Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] NMR Chemical Shift Simulation of Organic Molecules

It is possible to identify structural isomers through analysis that combines measurement and calculation!

Our organization conducts NMR chemical shift simulations of organic molecules using quantum chemical calculations. Determining the isomeric structures of organic molecules is a very important issue in fields such as natural product chemistry and drug discovery. Combining the results of nuclear magnetic resonance (NMR) measurements with NMR chemical shift simulation results from quantum chemical calculations is believed to be useful for elucidating the structures and evaluating the properties of novel compounds that lack model compounds for structure-chemical shift correlation. This document presents a case study on the identification of structural isomers of biologically active quinoxaline derivatives. [Measurement Methods and Processing Methods] ■ [NMR] Nuclear Magnetic Resonance Analysis ■ Computational Science, AI, Data Analysis ■ Others *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Investigation of Foreign Object Occurrence: Analysis of the Tube

It is possible to estimate the cause of wafer contamination!

TOF-SIMS is a very effective method for investigating the causes of contamination due to foreign substances, deposits, dirt, discoloration, and other factors related to the process. By comparing the mass spectral information obtained from contamination such as foreign substances with the mass spectral information of candidate contamination source components, it is possible to infer the sources of that contamination. In this document, we prepared four types of resin tubes used in the wafer manufacturing process and foreign substances on Si wafers, and by comparing their mass spectral information, we evaluated which components used in the process the contamination from the foreign substances was attributed to.

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  • Contract measurement
  • Contract Inspection
  • Time-of-flight mass spectrometer
  • Analytical Equipment

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Supercritical fluid chromatography-mass spectrometry method

Supercritical fluid chromatography is a method that uses supercritical CO2 as the mobile phase to separate components contained in a sample and detect them with a mass detector.

■What is Supercritical Fluid? A supercritical fluid is a state that exists under conditions of temperature and pressure above the critical point, possessing properties that are intermediate between those of a liquid and a gas (see Figure 1). Supercritical CO2 can be used as a mobile phase in chromatography due to its ease of handling at conditions (7.4 MPa, 31°C). ■Extraction Using Supercritical CO2 In the SFC/MS setup, SFE (Supercritical Fluid Extraction) is connected in the preceding stage, and extraction of components contained in the sample is performed using supercritical CO2. Since the extraction, separation, and detection can be carried out automatically, it is effective for the analysis of components that are sensitive to light, water, and oxygen.

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  • Contract Analysis
  • Contract measurement
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2ch Small FFT Analyzer SA-78 Rental

If you input the measurement data into the computer, you can perform spreadsheet calculations and display graphs.

It is a handheld 2-channel FFT analyzer.

  • Other environmental analysis equipment
  • Analytical Equipment

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Utilization of ALPHA and OPUS/QuickCompare

[Free Technical Data Giveaway] Smart Quality Control of Raw Materials.

In the manufacturing field of products, quality control can be considered one of the important issues. Its purpose is to prevent troubles in the manufacturing process in advance and to consistently guarantee a certain level of quality for the final product. In response to such needs, infrared spectroscopy can be said to be one of the suitable analytical methods in terms of speed, operability, and reliability. This document introduces the identification analysis of raw materials using our compact FT-IR "ALPHA" and the QuickCompare function included in the accompanying "OPUS/QuickCompare" software. [Contents] ■ Introduction ■ Infrared Spectrum and Quality Control ■ Quality Control with ALPHA ■ Identification Analysis Using the QuickCompare Function ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
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High-performance process gas analysis FT-IR MATRIX-MG5

Low-capacity, high-speed replacement gas cell! Measurement is possible without calibration and without background measurement.

The "MATRIX-MG5" is a product with a wide measurement concentration range equipped with a RockSolid interferometer. Calibration is not required, and it features a compact and robust housing. Measurements can be taken without background measurement. Additionally, the software "OPUS GA" of this product is equipped with a user interface optimized for process monitoring, allowing for instant grasp of process gas measurement results on a trend chart screen, and analysis of the correlation between measurement results and absorption spectra on the spectrum screen. 【Features】 ■ Equipped with RockSolid interferometer ■ No calibration required ■ Measurements possible without background measurement ■ Easy operation and maintenance ■ Wide measurement concentration range ■ Compact and robust housing ■ Low volume, high-speed replacement gas cell *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
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