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Measurement System Product List and Ranking from 40 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

Measurement System Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

  1. ピーテック Osaka//Medical Devices
  2. マーポス Tokyo//Testing, Analysis and Measurement
  3. 日東精工アナリテック Kanagawa//Industrial Machinery
  4. 4 ユニテクノロジー Aichi//Trading company/Wholesale
  5. 5 日本音響エンジニアリング Tokyo//Testing, Analysis and Measurement
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Measurement System Product ranking

Last Updated： Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

  1. Vascular Age Measurement System "Medical Analyzer" ピーテック
  2. CCD camera-equipped non-contact tool measurement system 'VTS SF-45' マーポス
  3. Non-contact film thickness measurement system for powder coating ユニテクノロジー
  4. 4 Powder Resistance Measurement System 日東精工アナリテック
  5. 5 A film weight measurement system using ultrasound without radiation. マーポス

Measurement System Product List

61～75 item / All 401 items

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Polarization Characteristic Measurement System 'PP8'

Polarization Characteristic Measurement System 'PP8'

Automatic evaluation of polarized spectra! A polarimetric measurement system capable of real-time display.

The "PP8" is a polarization characteristic measurement system that can automatically evaluate polarization degree, polarization spectrum, transmittance, color characteristics, and more, with real-time display capabilities. It supports various options and custom specifications, including fixtures tailored to samples and UV measurements for UV-A and UV-B. With comprehensive software, it supports the development and evaluation of LED modules, devices, and more. 【Features】 ■ Automatically evaluates polarization spectrum and color characteristics ■ Real-time display capability ■ Supports various options and custom specifications ■ Assists in the development and evaluation of LED modules, devices, etc. *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices

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Lighting distribution measurement system 'RR8-LED-2000/12000'

Lighting distribution measurement system 'RR8-LED-2000/12000'

Calibration using the customer's standard light source is also possible! Measurement system compliant with JIS C8105-5 photometric measurement method.

The "RR8-LED-2000/12000" can automatically evaluate the light distribution characteristics, total luminous flux, chromaticity characteristics, and electrical characteristics of LED lighting, various light sources, planar light emission, and spotlights. The Topcon spectroradiometer is JCSS calibrated, and the calculations comply with JIS standards. Additionally, by removing the illuminance adapter, it is possible to measure brightness over a wide dynamic range (0.0005 to 5,000,000 cd/m²). 【Features】 ■ Real-time display capability ■ Calibration using the customer's standard light source is also possible ■ Complies with JIS C8105-5 light distribution measurement methods ■ Capable of outputting IES light distribution data compatible with lighting design software ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Multispectral Imaging Measurement System 'OD4-8'

Multispectral Imaging Measurement System 'OD4-8'

For evaluating dry test chips! It is possible to measure the reaction distribution within the cell.

The "OD4-8" is a measurement system capable of obtaining fundamental data necessary for analysis methods under uneven reactions and the development of algorithms to eliminate the effects of entrained bubbles and debris. The software can determine the time-dependent changes in absorbance at each wavelength from five-wavelength image information. Additionally, since all data is saved as images, you can change the measurement range after the measurement and analyze freely. 【Features】 ■ For evaluating dry inspection chips ■ Capable of measuring the reaction distribution within the cell ■ Can cancel external light and noise due to the chopper method ■ Can calculate optical density from the transmittance of the sample relative to the reference ■ Continuous measurement can be performed at arbitrary intervals *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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"Custom specifications available" Non-contact film thickness gauge 'FF8'

"Custom specifications available" Non-contact film thickness gauge 'FF8'

The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveform) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to create continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments

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Comprehensive Catalog of Civil Engineering and Construction Instruments and Measurement Systems

Comprehensive Catalog of Civil Engineering and Construction Instruments and Measurement Systems

ELMES Measurement Equipment Comprehensive Catalog. Featuring instruments and measurement systems for civil engineering and construction.

The "Civil Engineering and Construction Instruments and Measurement Systems Comprehensive Catalog" features a variety of civil engineering and construction instruments and measurement devices, including "strain gauge type instruments" that can measure dynamic phenomena with good responsiveness. In addition to instruments and systems, the catalog also includes application examples categorized by measurement targets, such as NATM measurement and retaining wall measurement. 【Featured Products】 ○ Strain gauge type instruments ○ Differential transformer type instruments ○ Potentiometer type instruments ○ Capacitance type instruments ○ Receiving devices (indicators, recorders, etc.), and more For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments
  • Thermometer

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Biogas measurement system [TRI1zer] mBA-3000

Biogas measurement system [TRI1zer] mBA-3000

Dedicated simple gas chromatography for biogas (H2/CH4/CO)

The TriRizer mBA-3000 measures three components: H2/CH4/CO within minutes after injecting just 1ml of sample gas. It adopts a simple calibration method: - After gas collection, just inject it into the device. No complicated pretreatment is necessary. - Results are available within minutes after injection, with no operations required during this time. This system is suitable for biochemical research on pathological conditions using trace gas components from biological gases (exhaled air, intestinal gases, and gases produced by microorganisms, etc.) in the fields of basic medicine and physiological biology, which have become increasingly active in recent years. In particular, it has achieved results in gas biology research concerning endogenous CO (HO-1 research) during oxidative stress and the relationship between reactive oxygen species and hydrogen. Of course, it can also be applied in environmental fields (such as exhaled methane from ruminants and global warming). [Features] ◆ Compact, simple, rapid, non-invasive, compatible with all biological and environmental gases ◆ High resolution of 0.1ppm for all three components ◆ Dedicated software allows for flexible processing of calibration history and analysis results.

  • Other measurement, recording and measuring instruments
  • Other environmental analysis equipment
  • Other environmental equipment

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Hall effect measurement PDL system

Hall effect measurement PDL system

The Semilab PDL Hall effect measurement system is a standalone device that measures sheet resistance, carrier concentration, and mobility.

Hall effect measurement plays a very important role in the evaluation of electronic materials and electronic devices. However, in the measurement of low mobility materials, high resistance and thin film materials, or low resistance materials, the fact remains that small signals can be buried in noise, making evaluation difficult. By performing lock-in detection in an AC magnetic field, the PDL system (Parallel Dipole Line system) becomes an innovative magnetic trap system that realizes a unique camelback field confinement effect. Due to the diamagnetic levitation effect, diamagnetic materials such as graphite are trapped at the center. The Hall effect measurement system PDL-1000 can measure sheet resistance, carrier concentration, and mobility with wide range and high sensitivity in research and development applications. The PDL (Parallel Dipole Line) technology used in the PDL-1000 from Semilab is a patented technology developed by IBM.

  • Other inspection equipment and devices

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LaserQC

LaserQC

A system developed for prototype product inspection! Also incorporates reverse engineering capabilities!

"LaserQC" utilizes the characteristics of laser measurement to inspect products with over 500 measurement data points per second, quickly and accurately. It can be set up in a short time and is ready for immediate use with simple operation training. The operation is easy, and anyone can operate it like a veteran after just a few hours. The system can perform two-dimensional measurements with an accuracy of ±0.05(mm) and conducts self-calibration, making it effective even in processing environments with significant changes. 【Features】 ■ Solutions for 2D product inspection ■ Maximizes production efficiency ■ Developed for prototype product inspection ■ Compatible with quality management methods such as (SPC, ISO, LEAN) ■ Equipped with reverse engineering capabilities *For more details, please refer to the PDF materials or feel free to contact us.

  • Company：VES
  • Price：Other
  • Other inspection equipment and devices
  • Other measurement, recording and measuring instruments

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Mercury Prober CV/IV Measurement System

Mercury Prober CV/IV Measurement System

Mercury Prober CV/IV Measurement System

This is a CV/IV measurement system using a mercury probe method developed by Four Dimensions, Inc. in the United States, which excels in reproducibility and safety. It can measure the characteristics of various wafers such as Si, compounds, SOI, and bulk. 【Features】 ◆ No need for electrode fabrication. Since mercury itself serves as the electrode, the costly and time-consuming patterning process is unnecessary. Measurements can be taken in a bulk state or with an insulating film formed. ◆ Automatic system. It allows for automatic mapping measurements of up to 49 designated measurement sites, including C-V, I-V characteristics, TDDB, Vdb, Qbd for oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, etc. ◆ High measurement reproducibility. Excellent measurement reproducibility is achieved through a uniquely designed mercury probe area and the use of fresh mercury for each measurement. ◆ Compact structure. Integrates CV and IV meters, transport platform, and probe section. ◆ Compatible with various wafers and chips. Capable of measuring 1 to 12-inch wafers and chip-sized samples.

  • Semiconductor inspection/test equipment

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Manual Operation Type CV92M

Manual Operation Type CV92M

Quickly inspect the areas you want to check manually!

This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety.

  • Other environmental analysis equipment

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Carbon Neutral Solution

Carbon Neutral Solution

Solutions for achieving a carbon-neutral and decarbonized society: A group of solutions responding to the structural changes in the rapidly transforming automotive industry.

Solutions for Achieving a Carbon Neutral and Decarbonized Society - Secondary Batteries: LiB, All-Solid-State Battery Development Charge and Discharge Current Intensity Visualization System (WM7000-BT) - Inverter Development (EV, Solar Power Generation, Wind Power Generation, Hybrid Power Conditioner, Converter, Power Semiconductors) Transient Noise Visualization and Time Domain Measurement (WM7000-TD) - EV Stator Coil Development Partial Discharge Occurrence Visualization System (WM7700) - Smart City (Smart Factories, Smart Agriculture, Local 5G) Compact OTA Testing Environment, Antenna Coupler, Interconnectivity Testing System

  • Environmental Test Equipment

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High-speed SAR measurement system ART-MAN

High-speed SAR measurement system ART-MAN

SAR measurement in a few seconds.

High-speed SAR (Specific Absorption Rate) measurement using a vector probe array method. *For more details, please refer to the PDF document or feel free to contact us.*

  • EMC Testing

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Laser distance meter multi-point simultaneous displacement measurement system (multiple units remote control simultaneously)

Laser distance meter multi-point simultaneous displacement measurement system (multiple units remote control simultaneously)

Using the Bluetooth function of the Leica DISTO laser distance meter, remotely control multiple laser distance meters from a PC from a distance.

The continuous measurement function allows for the measurement of the distance change (displacement) to the target object while keeping the laser distance meter fixed. Data measured through remote control from a PC can be automatically imported into the PC. The measurement data imported into the PC can be output as an external file in CSV format, making it possible to use it for graphing or in other applications such as Excel, Word, and CAD.

  • Other measurement, recording and measuring instruments

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