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Measuring Instrument(ol) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
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Measuring Instrument Product List

151～165 item / All 219 items

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EddyCus(R)TF lab 2020 series

EddyCus(R)TF lab 2020 series

Manual mapping measurements of sheet resistance are possible using user-friendly software.

The "EddyCus(R)TF lab 2020 series" is a non-contact sheet resistance measurement device. It accurately measures the sheet resistance of conductive films at a single point. Additionally, it can measure the thickness of metal film layers and monitor the thickness of thin films and substrates. Upon request, we evaluate the characteristics of multi-layer systems. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Accurate single-point measurement of sheet resistance of conductive films (Ohm/sq) ■ Thickness measurement of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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PET Bottle & Preform Combined Mouth Dimension Measuring Device MTY-7000

PET Bottle & Preform Combined Mouth Dimension Measuring Device MTY-7000

Measurement time within 4 seconds! A semi-automatic measuring device that is easy to operate and allows for simple measurements.

The "MTY-7000" is a measuring device that measures the mouth dimensions compatible with both PET bottles and PET preforms. It measures the inner diameter (2 points), outer diameter, thread diameter, bead height, and neck support height of PCO1716, 1810, and 1881 type PETROL bottles using a linear gauge and a special measuring head. The set condition of the work (PET bottle & preform) can be confirmed with a small CCD camera. 【Features】 ■ Measurement time within 4 seconds ■ Measurement accuracy within 5μm ■ Repeatability within 4μm ■ Dedicated for mouth (inner diameter and outer diameter) *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments

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Simple LED Full Beam Measurement Stage MAS-LF 0802

Simple LED Full Beam Measurement Stage MAS-LF 0802

The total luminous flux, spectrum, and chromaticity of the LED can be measured in a short time.

Simple LED total luminous flux measurement stage compatible with the "Solid Lambda CCD LED monitor PLUS" high-resolution multi-spectral device for LED measurement.

  • Other FA equipment

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Simple LED Luminance Measurement Stage MAS-L 0702

Simple LED Luminance Measurement Stage MAS-L 0702

It is possible to measure the brightness, spectrum, and colorimetry of LEDs in a short time without worrying about the position of the sample.

A simple LED luminance measurement stage that can be connected to the high-resolution multi-spectral device "Solid Lambda CCD LED monitor PLUS" for LED measurement.

  • Analytical Equipment and Devices

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RLC Series Reflective Off-Center Measurement Device

RLC Series Reflective Off-Center Measurement Device

Ensure sufficient resolution and enable measurement. Eccentricity can be automatically measured at up to 20 measurement points.

The "RLC Series" is a reflection eccentricity measurement device that uses a Laser Auto Collimator. It is a reflection eccentricity measurement designed to improve the eccentricity accuracy during lens unit assembly, ensuring sufficient resolution for the required accuracy and enabling measurements. We provide support to adjust it suitably to the customer's assembly conditions. Additionally, we offer a measurement device for the eccentricity of individual aspheric lenses, which consists of a high-precision rotating spindle and a light source and detection optical system for observing reflected light. 【Features】 ■ Measurement lens diameter: φ1 to 40mm ■ Automatic measurement of eccentricity at up to 20 measurement points ■ Monitoring of Z stage movement on the measurement software ■ Automatic measurement of actual values of eccentricity (X-axis, Y-axis) ■ Automatic adjustment of shutter speed to ensure the spot peak value reaches the target brightness value *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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NDC Non-contact Near Infrared Thickness Gauge and Moisture Meter

NDC Non-contact Near Infrared Thickness Gauge and Moisture Meter

Contributes to the standardization of product quality and reduction of paint with WET measurement and DRY measurement support.

NDC Technologies' online near-infrared multi-component analyzer "Series 9" is a high-precision measuring instrument that enables non-contact measurement of moisture, oil/fat content, and protein simultaneously. It caters to diverse needs and measurement objects, such as the moisture content of coffee beans, the components of milk powder, and the moisture and oil content of potato chips. By thoroughly implementing quality control using the Series 9, it contributes to the stable production of high-quality products that meet manufacturing standards. With IP67 compliance for peace of mind in food factories, simultaneous measurement of moisture, oil/fat content, and protein: - Measurement contents: Simultaneous measurement of moisture, oil/fat content, protein, etc. - Safe for food manufacturing processes with SUS316L and IP67 compliance. - Immediate confirmation of measurement results enhances operational efficiency and increases production. - High-precision measurement of moisture and components improves product quality and reduces waste. - Long-term stability with very infrequent calibration frequency.

  • Coating thickness gauge

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Mercury Probe CV/IV Measurement Device "MCV Series"

Mercury Probe CV/IV Measurement Device "MCV Series"

No need for electrode formation with mercury probes! Provides reduced development time and lower costs in R&D.

The "MCV-530/530L/2200/2500" is a device that enables the evaluation of electrical characteristics of semiconductor silicon wafers and the characteristics of MOS device oxide films, among others. Traditionally, gate electrodes such as Poly-Si or Al were deposited on the wafer, and after forming MOS structures or Schottky structures, CV/IV characteristic evaluations were conducted. This product has its own gate electrode, allowing for the acquisition of electrical characteristics of oxide films and wafers without the need to create a metal gate. It provides quick feedback through process monitoring, reduces development time in R&D, and lowers costs. 【Features】 ■ No need for electrode formation due to the mercury probe ■ Excellent reproducibility ・Schottky: 0.3% (1σ) / MOS: 0.1% (1σ) ■ Mapping of the wafer surface is possible ■ Safe and easy mercury exchange enabled by a newly developed mercury exchange mechanism *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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[Demo unit available for loan] Digital line width measurement device

[Demo unit available for loan] Digital line width measurement device

Demo units available for loan! A new tool for measuring conductor width and insulation spacing of printed circuit boards!

The "AccuLine II" is a digital line width measurement device that can measure the conductor width (top and bottom) and insulation spacing of printed circuit boards. It can automatically measure conductor widths (maximum 900μm, minimum 30μm) in a standalone mode. Manual measurement of TH diameter (maximum 700μm) is also possible. Additionally, the operability, alignment with measurement targets, and memory functions have been significantly improved. There are three types available: "Advanced Type," "Basic Type," and "Manual Type," allowing customers to choose according to their needs. 【Features】 ■ Standalone ■ Capable of automatic and manual measurement ■ Simultaneous measurement of bottom and top widths of conductors ■ Equipped with a 3.5-inch color LCD ■ Pass/fail judgment display possible based on settings *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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3D measurement contracting and on-site measurement services

3D measurement contracting and on-site measurement services

We provide on-site measurements for large parts and equipment using a high-precision portable measuring instrument!

Our company's laser tracker can perform high-precision three-dimensional measurements of large structures that are difficult to measure with conventional contact-type three-dimensional measuring machines. It can be utilized in various scenarios such as machine installation, alignment, dimensional measurement, parts accuracy inspection, and reverse engineering. 【Main Features of the Laser Tracker】 - Capable of high-precision measurements of equipment leveling and alignment - Can measure the dimensional accuracy of parts and compare it with 3D CAD data - Supports 3D data creation for machinery and structures without drawings *For more details, please refer to the PDF data available via the download button.

  • Contract measurement
  • 3D measuring device

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Positron annihilation lifetime measurement / Doppler broadening measurement device

Positron annihilation lifetime measurement / Doppler broadening measurement device

High-efficiency digital measurement. Lifespan spectrum and waveform file storage are possible!

Integration of measurement and power supply equipment necessary for positron annihilation method measurements that can analyze molecular-level nanoscale spatial structures. Settings and data reading for each module are performed via a network from a dedicated application installed on a computer. PALS captures and calculates high-speed pulse signals from two BaF2 scintillation detectors using a 3 Gsps module. CDB takes coincidences from two germanium semiconductor detectors and generates a two-dimensional histogram from each of their pulse height values. Furthermore, the combination of these devices also enables the measurement of the correlation between lifetime and momentum using AMOC.

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