Defect inspection device and defect removal device for thin film metal processing products.
Automating defect inspection and removal of defective components in thin film metal processing products. Reducing manufacturing costs and labor expenses.
★Prest Kappar (Defect Inspection Device) Utilizing semiconductor inspection technology and advanced transport technology for miniaturized products, it excels in defect detection of a wide range of thin film metal processing sheets. Its unique algorithm for comparing adjacent products makes recipe creation easy. ★Razer Kappar (Defective Material Removal Device) This is a defective material removal device that uses handler transport technology employed in semiconductor manufacturing processes, used after defect inspection with Prest Kappar. It can automatically remove defective materials even if the target workpiece has minimal waviness or deformation. *For more details, please refer to the PDF document. Feel free to contact us with any inquiries.*
- Company:CCTECH Japan CCTECH Japan(株)- 日本法人
- Price:Other