We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Spectrometer.
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Spectrometer Product List and Ranking from 40 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Spectrometer Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. オプトシリウス Tokyo//others
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 日本カンタム・デザイン Tokyo//Testing, Analysis and Measurement
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Spectrometer Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. X-ray photoelectron spectroscopy device 'Nexsa' サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. JPS-9030 Photoelectron Spectroscopy Device (XPS) アズサイエンス 松本本社
  3. High-resolution Fourier-transform infrared spectrometer nano-FTIR 日本カンタム・デザイン
  4. 4 Fully Automated X-ray Photoelectron Spectroscopy Device 'K-Alpha' サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  5. 5 [UPS] Ultraviolet Photoelectron Spectroscopy 一般財団法人材料科学技術振興財団　MST

Spectrometer Product List

46～60 item / All 230 items

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[Analysis Case] Evaluation of Composition and Bonding State of GaN Film by XPS

[Analysis Case] Evaluation of Composition and Bonding State of GaN Film by XPS

Evaluation will be conducted under measurement conditions tailored to the purpose.

This text introduces an example of evaluating the composition and bonding states of GaN films used in LEDs and power devices using XPS. Understanding how the composition and bonding states change due to film formation conditions and surface treatments is effective for process management. It is important to appropriately select the X-rays used during the evaluation according to the purpose. Measurement conditions for each focus will also be presented.

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[Analysis Case] Raman Mapping of Carbon Materials

[Analysis Case] Raman Mapping of Carbon Materials

It is possible to evaluate the distribution of the crystalline state of carbon within the sample surface.

Carbon materials, widely used in industrial components and medical devices, have different properties depending on their structure and crystallinity, making it important to evaluate their state. This document presents evaluation examples using high-sensitivity and high-spatial-resolution Raman spectroscopy. The distribution of the crystalline state of graphite, a carbon material, was visualized through mapping. It allows for a visual capture of the quantity of defects, whether high or low.

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[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy

[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy

Detailed information about the valence band, conduction band, and gap states of the material can be obtained.

Understanding the band structure, including valence bands, conduction bands, and gap states, is an extremely important evaluation criterion for controlling various properties of materials. However, there are limited analytical methods available for direct and detailed assessment of these aspects. Simultaneous measurements of X-ray absorption spectroscopy (XAS) and X-ray emission spectroscopy (XES) using synchrotron radiation allow for a comprehensive understanding of the band structure, as well as detailed information regarding the attribution of the elements and orbitals that compose it. This document presents the XAS and XES spectra of GaN substrates as an example of measurement.

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[Analysis Case] D Mapping of Organic Multilayers by Raman

[Analysis Case] D Mapping of Organic Multilayers by Raman

It is possible to confirm the distribution of components in the depth direction through surface measurements.

In Raman analysis, the component distribution in the depth direction can be confirmed through measurements from the surface. It is effective for materials that easily transmit light, allowing for non-destructive evaluation without the need for cross-section processing or ion sputter etching. This document presents an example of evaluating each layer of an organic multilayer film using Raman 3D mapping. The results indicated that the organic multilayer film is composed of four layers. Additionally, by comparing with library data, the components of each layer were identified.

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[SXES] Soft X-ray Emission Spectroscopy

[SXES] Soft X-ray Emission Spectroscopy

SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.

- It is possible to evaluate the chemical bonding states focusing on specific elements in the sample (especially light elements such as B, C, N, O). - The spectral shape reflects the partial density of states of the targeted elements in the valence band. - Evaluation of the band structure is also possible through simultaneous measurement with X-ray absorption spectroscopy (XAS). - Since information from the bulk is obtained, it is less affected by the influence of the surface region within a few nanometers. - Evaluation can be performed without being affected by charging effects, even for insulators. - The detection limit is low (<1 atomic%), allowing for the evaluation of trace components.

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[Analysis Case] Analysis of Biomolecular Interactions Using STD-NMR

[Analysis Case] Analysis of Biomolecular Interactions Using STD-NMR

Analysis of the presence and strength of interactions between low molecular weight compounds and proteins.

Saturation Transfer Difference (STD) NMR is a type of NMR analytical method used to identify low molecular weight compounds that interact with proteins, demonstrating significant power in drug screening and other applications. This document presents a case study where specific compounds that interact with a particular protein were identified from multiple compound groups using STD-NMR measurements. Measurement method: Nuclear Magnetic Resonance Spectroscopy (NMR) Product fields: Biotechnology, Pharmaceuticals, Cosmetics, Food Analysis purpose: Screening, Drug Design, Interaction Evaluation For more details, please download the document or contact us.

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Rental of the compact Raman spectroscopy system "EnSpectr R532"

Rental of the compact Raman spectroscopy system "EnSpectr R532"

Portable and compact shape, usable in various fields! Introduction of rental items.

At Rex Co., Ltd., we offer rental services for non-destructive testing equipment. The 'EnSpectr R532' is a portable high-precision Raman spectroscopy system that combines the performance of laboratory equipment. It displays the spectrum of the target object in real-time. By comparing the acquired spectrum with a database, it identifies the substance in a short time. High-precision Raman analysis is possible through an intuitive user interface. 【Features】 ■ Visualization of 3 patterns of spectral data ■ Four attachments tailored to the target object ■ Portable and space-saving design ■ Usable for various applications *For more details, please refer to the external link page or feel free to contact us.

  • Other inspection equipment and devices

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Handheld Ramen BRAVO

Handheld Ramen BRAVO

Ideal for raw material inspection, high-performance handheld Raman from Germany.

A large touchscreen equipped with outstanding performance, sophisticated design, and an intuitive graphical user interface. BRAVO is a high-performance handheld Raman device that streamlines the acceptance inspection and quality control of various raw materials.

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Confocal Microscopy Laser Raman "SENTERRA II"

Confocal Microscopy Laser Raman "SENTERRA II"

[Technical Data Presentation] Achieving high sensitivity performance and high frequency accuracy! A compact and robust distributed micro-Raman system.

The "SENTERRA II" is a high-performance system unique to Bruker, capable of handling everything from routine analyses such as quality control to cutting-edge research fields. In typical Raman microscopes, the spectrometer is mostly a separate system from the microscope, requiring a significant amount of time to maintain performance. This product is a compact and robust integrated system that combines the excitation laser, spectrometer, and microscope, achieving high performance and stability through its efficient optical design. Additionally, it supports operators smoothly and accurately to obtain results quickly. It guides users step by step through the procedures of data measurement, from visual observation of samples to confirming spectral quality and setting measurement areas. [Features] - Highly automated various functions and efficient operability - Compact & robust design - Efficiency and flexibility *For more details, please refer to the PDF document or feel free to contact us.

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Technical Data: Depth Analysis of Composites Using Confocal Microscopic Raman Spectroscopy System

Technical Data: Depth Analysis of Composites Using Confocal Microscopic Raman Spectroscopy System

Basic knowledge of micro-Raman spectroscopy is published! Free materials are being offered!

This document presents technical information on depth analysis of composite materials using the confocal micro-Raman spectroscopy system "SENTERRA II." It introduces the usefulness of depth analysis using the confocal micro-Raman spectroscopy system, starting with basic knowledge of micro-Raman spectroscopy and two application examples. 【Contents】 ■Introduction 　・Micro-Raman Spectroscopy 　・Differences in optical systems between general optical microscopes and confocal microscopes ■Confocal Optical System ■Micro-Raman Spectroscopy System SENTERRA II ■Application Examples 　・Qualitative analysis of foreign substances in gel within a syringe 　・Analysis of laminate films with multilayer structures ■Conclusion *For more details, please refer to the PDF document or feel free to contact us.

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Technical Data: High Spatial Resolution ATR Mapping Measurement (LUMOS II)

Technical Data: High Spatial Resolution ATR Mapping Measurement (LUMOS II)

[JASIS2021 Exhibition] LUMOS II - Approaching the diffraction limit of light! High spatial resolution ATR mapping measurement.

The analysis of laminated materials composed of multiple layers with micrometer-scale thickness is one of the important analytical themes, and its influence is showing significant expansion. In this theme, micro-infrared spectroscopy and micro-Raman spectroscopy, which have a mutually complementary relationship, are the most effective analytical methods. The analysis of laminated materials is applied not only to this field but also to a wide range of areas such as biomedicine, pharmaceuticals, and materials science. This document provides a clear explanation of: 　▶ The importance of spatial resolution when applying microspectroscopy to the analysis of laminated materials 　▶ Reports on ATR mapping measurements using the latest micro FT-IR systems *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibition at JASIS2021◆ For information about the exhibition, please check the basic information below.

  • Other environmental analysis equipment

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[MATRIX-MG & OMEGA 5] KickOff Campaign

[MATRIX-MG & OMEGA 5] KickOff Campaign

Until the end of December 2023! We offer three representative models of gas analysis FT-IR at affordable prices.

Introducing the "2023 KickOff Campaign" by Burkard Japan Co., Ltd. The products included in this campaign are the "MATRIX-MG5," which supports various applications; the "MATRIX-MG01," which prioritizes speed for detecting the start and end points of combustion and decomposition reactions; and the "OMEGA 5," equipped with an electronic cooling detector that supports continuous measurement "24/7." We are offering these three representative models of gas analysis FT-IR, which are increasingly in demand, at more affordable prices. The campaign is not automatic and will only apply if you request a quote using the campaign name. 【Campaign Details】 ■ Duration: Until the end of December 2023 ■ Content ・MATRIX-MG5: Standard package price ¥17,771,000 (excluding tax) → ¥12,400,000 (excluding tax) ・MATRIX-MG01: Standard package price ¥17,249,000 (excluding tax) → ¥12,000,000 (excluding tax) ・OMEGA 5: Standard package price ¥12,576,000 (excluding tax) → ¥8,800,000 (excluding tax) *For more details, please refer to the PDF document or feel free to contact us.

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Technical Data: Analysis of Particles Contained in Injectable Preparations

Technical Data: Analysis of Particles Contained in Injectable Preparations

Utilization of micro FT-IR imaging measurement method! It is possible to identify the chemical composition of samples with high precision.

FT-IR microscopy not only provides high resolution but also offers comprehensive chemical information that is useful for identifying discovered particles. This reveals the chemical composition of spatially defined areas of the sample, and USP <788> and USP <787> recognize FT-IR microspectroscopy as a suitable tool for the characterization of invisible particles in therapeutic protein injectables. This document presents two measurement examples using FT-IR microscopy and its imaging capabilities for the identification of particles in solution formulations. We encourage you to read it. [Contents (partial)] ■ Why focus on particles? ■ What are the regulations regarding particles? ■ How are particles detected? ■ Application Example 1 ■ Application Example 2 *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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TAK SYSTEM High Sensitivity Spectrometer and Special Measurement

TAK SYSTEM High Sensitivity Spectrometer and Special Measurement

Optimal for spectroscopy from 200 nm to the infrared region.

We have delivered a newly developed high-performance spectroscopic device to a certain location. There are still many development elements remaining, but we will continue to take on new challenges in spectroscopy. If you wish to proceed with mass production, we will optimize price and performance in collaboration with many companies that have formed alliances with us.

  • Laser microscope

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HAXPES-Lab (Laboratory-type Hard X-ray Photoelectron Spectroscopy Analysis System)

HAXPES-Lab (Laboratory-type Hard X-ray Photoelectron Spectroscopy Analysis System)

Hard X-ray photoelectron spectroscopy, which was only possible at synchrotron facilities, is now available for use in laboratories!

This is a next-generation XPS device that can analyze depths that conventional XPS has not been able to reach until now. It has become possible to use hard X-rays, which were previously only available at synchrotron facilities. High-resolution hard X-ray photoelectron spectroscopy has been achieved using a Ga Kα monochromatic X-ray source with 9.25 keV excitation. 【Applications】 XPS observation and measurement of samples in areas deeper than the surface. --- Below is an introduction in English. HAXPES-Lab is designed to allow hard X-ray photoelectron spectroscopy (HAXPES) measurements in standard lab environments. The instrument offers the unique possibility to investigate bulk properties of various materials, analyze buried interfaces, and access deep core levels. *For more details, please contact us.

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