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Spectrometer Product List and Ranking from 29 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Jul 09, 2025~Aug 05, 2025
This ranking is based on the number of page views on our site.

Spectrometer Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Jul 09, 2025~Aug 05, 2025
This ranking is based on the number of page views on our site.

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Spectrometer Product ranking

Last Updated: Aggregation Period:Jul 09, 2025~Aug 05, 2025
This ranking is based on the number of page views on our site.

  1. MicroNIR OnSite Portable Near-Infrared Spectrometer
  2. JPS-9030 Photoelectron Spectroscopy Device (XPS)
  3. Fully Automated X-ray Photoelectron Spectroscopy Device 'K-Alpha'
  4. 4 X-ray photoelectron spectroscopy device 'Nexsa'
  5. 4 DXR3 Flex Raman Spectrometer

Spectrometer Product List

16~30 item / All 111 items

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Environmental Control X-ray Photoelectron Spectroscopy Device EnviroESCA

Operando measurements can be performed in the laboratory under a maximum pressure of 0.1 atmospheres.

EnviroESCA measures samples in a near-atmospheric pressure environment (up to 0.1 atm), eliminating the need for the ultra-high vacuum environments traditionally required. It can start measurements just a few minutes after introducing liquid, aqueous, volatile, or highly degassing porous samples into the EnviroESCA sample chamber. Not only can it analyze samples that conventional XPS would have given up on, but it also serves as a powerful tool for pioneering new research fields by freely controlling ambient gases and temperatures. It easily enables measurements under device operating conditions, known as "operando measurements," which are rapidly gaining attention. With EnviroESCA, which does not require ultra-high vacuum conditions, quality inspections on production lines that require a large number of inspections in a short time can be efficiently conducted. It is also possible to use robots and auto-loaders to batch process samples from introduction to measurement without human intervention. EnviroESCA, which dispels the conventional notion of X-ray photoelectron spectroscopy being limited to ultra-high vacuum environments, drives novel research and development and provides entirely new applications for X-ray photoelectron spectroscopy in fields such as medicine, biology, and life sciences.

  • Spectroscopic Analysis Equipment

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NIRQuest+ Near-Infrared Mini Spectrometer

Multichannel spectrometer for near-infrared measurement using InGaAs linear array.

We offer three models tailored to the desired wavelength range. They can be applied to various applications such as food and pharmaceutical analysis.

  • Spectroscopic Analysis Equipment

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Ultra-high-speed spectral measurement device Spectrometer DTSP-150

Compact with low noise! Back-illuminated Peltier cooling FFT-CCD used.

A spectrometer is a device that separates light into a spectrum (light by wavelength) and measures the intensity of light at each wavelength. By shining light on thin films and spectrally analyzing the reflected light, the components of the thin films can be measured. Applications include thickness management of films on various discs, measurement of resist films and SiO on semiconductor wafers, management of coating thickness on optical lenses, thickness measurement of various films, inline measurement of alignment films and ITO films on glass substrates, and color measurement of LEDs. There are also established achievements in constructing multi-channel systems for inline use. For more details, please contact us.

  • Spectroscopic Analysis Equipment

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Space IR Spectrometer

IR spectrometer for CubeSats and other ultra-small satellites.

An IR spectrometer that can be used as remote sensing mission equipment for CubeSats and other ultra-small satellites. The wavelength range is from 1000nm to 1700nm with a spatial resolution of approximately 6nm. (The wavelength range can be extended up to 2400nm.) Additionally, it can also be used for UAV applications.

  • Color camera
  • others

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Cathode Luminescence Spectrometer SPARC

This is a high-sensitivity, multifunctional, high-resolution angle-resolved cathodoluminescence (CL) imaging spectrometer for research on microphotonic structures.

Capabilities of SPARC SPARC is a truly unique analytical method suitable for photonic research of nano and microstructures with deep sub-wavelength resolution. It is useful for the study of micro-nanophotonic structures and their related materials, including metallic (plasmonic, Ag, Au, etc.), dielectric (SiO2, Si3N4, TiO2, etc.), and semiconductor (Si, GaAs, CdTe, etc.) materials.

  • Spectroscopic Analysis Equipment
  • Other semiconductors
  • Analytical Equipment and Devices

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Small VUV Spectrometer "RadiMo-DP, SP"

Compact design! The wavelength range is 115-200nm, suitable for various applications.

The "RadiMo-DP, SP" is a compact vacuum ultraviolet spectrometer developed for RadiMo, which can be used independently for vacuum ultraviolet spectroscopy applications. It is 1/3 more compact in volume compared to conventional vacuum ultraviolet spectrometers with the same level of wavelength resolution. Additionally, the wavelength scanning driver, high-voltage power supply for the photomultiplier tube, and preamplifier for the photomultiplier tube are housed in a control box compatible with 19-inch racks. 【Features】 ■ Compact vacuum ultraviolet spectrometer developed for RadiMo ■ Can be used independently for vacuum ultraviolet spectroscopy applications ■ More compact than conventional vacuum ultraviolet spectrometers of the same level ■ Wavelength scanning driver and other components are stored in the control box *For more details, please refer to the PDF document or feel free to contact us.

  • Spectroscopic Analysis Equipment
  • Analytical Equipment and Devices

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Terahertz Spectroscopy Device "Tera Evaluator"

Achieving non-destructive and non-contact measurement of electrical characteristics of 4-inch and 6-inch wafers!

The "Tera Evaluator" is a new terahertz spectrometer that incorporates ellipsometry technology. Its use of a reflective optical system makes it suitable for measuring opaque materials. It comes standard with a mapping stage for measuring 4-inch and 6-inch wafers, enabling non-contact and non-destructive inspection of semiconductor wafers. By measuring the time waveform of the electric field intensity of electromagnetic wave pulses, both the electric field intensity and phase information can be measured simultaneously. By analyzing the differences in time waveforms between the reference and the sample, the frequency dependence of the sample's complex permittivity (complex refractive index) can be obtained. 【Features】 ■ Non-destructive and non-contact measurement of carrier concentration and mobility ■ Capable of measuring complex permittivity in the terahertz range ■ Liquid samples can also be measured ■ Standard software for analysis: THz Analysis ■ A system that allows external input of lasers can be constructed *For more details, please refer to the PDF document or feel free to contact us.

  • Spectroscopic Analysis Equipment

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Technical Information Magazine 202102-01 New Fluorescence Spectroscopy Device

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** A new fluorescence spectrometer has been introduced, enabling not only measurements in the ultraviolet-visible region but also emission measurements in the near-infrared region, as well as fluorescence lifetime measurements on the order of nanoseconds. This paper presents the features of the new fluorescence spectrometer and examples of its measurements. **Table of Contents** 1. Introduction 2. Features of the New Fluorescence Spectrometer 3. Examples of Near-Infrared Emission Spectrum Measurements 4. Conclusion

  • Contract Analysis
  • Contract measurement
  • Technical and Reference Books

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