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Spectrometer Product List and Ranking from 77 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

Spectrometer Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  3. オプトシリウス Tokyo//others
  4. 4 null/null
  5. 5 テックアナリシス Osaka//Testing, Analysis and Measurement
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Spectrometer Product ranking

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. Fully Automated X-ray Photoelectron Spectroscopy Device 'K-Alpha' サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. Low price! Ultra-compact near-infrared spectrometer FLAME-NIR+ オプトシリウス
  3. HORIBA Compact Raman テックアナリシス
  4. 4 Near Infrared Spectrometer STD Series 900–1700nm ナノシード 本社
  5. 5 X-ray photoelectron spectroscopy device 'Nexsa' サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.

Spectrometer Product List

31～60 item / All 236 items

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Environmental Control X-ray Photoelectron Spectroscopy Device EnviroESCA

Environmental Control X-ray Photoelectron Spectroscopy Device EnviroESCA

Operando measurements can be performed in the laboratory under a maximum pressure of 0.1 atmospheres.

EnviroESCA measures samples in a near-atmospheric pressure environment (up to 0.1 atm), eliminating the need for the ultra-high vacuum environments traditionally required. It can start measurements just a few minutes after introducing liquid, aqueous, volatile, or highly degassing porous samples into the EnviroESCA sample chamber. Not only can it analyze samples that conventional XPS would have given up on, but it also serves as a powerful tool for pioneering new research fields by freely controlling ambient gases and temperatures. It easily enables measurements under device operating conditions, known as "operando measurements," which are rapidly gaining attention. With EnviroESCA, which does not require ultra-high vacuum conditions, quality inspections on production lines that require a large number of inspections in a short time can be efficiently conducted. It is also possible to use robots and auto-loaders to batch process samples from introduction to measurement without human intervention. EnviroESCA, which dispels the conventional notion of X-ray photoelectron spectroscopy being limited to ultra-high vacuum environments, drives novel research and development and provides entirely new applications for X-ray photoelectron spectroscopy in fields such as medicine, biology, and life sciences.

  • Spectroscopic Analysis Equipment
  • Spectrometer

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Ultra-high-speed spectral measurement device Spectrometer DTSP-150

Ultra-high-speed spectral measurement device Spectrometer DTSP-150

Compact with low noise! Back-illuminated Peltier cooling FFT-CCD used.

A spectrometer is a device that separates light into a spectrum (light by wavelength) and measures the intensity of light at each wavelength. By shining light on thin films and spectrally analyzing the reflected light, the components of the thin films can be measured. Applications include thickness management of films on various discs, measurement of resist films and SiO on semiconductor wafers, management of coating thickness on optical lenses, thickness measurement of various films, inline measurement of alignment films and ITO films on glass substrates, and color measurement of LEDs. There are also established achievements in constructing multi-channel systems for inline use. For more details, please contact us.

  • Spectroscopic Analysis Equipment
  • Spectrometer

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Low-Angle X-ray Scattering (LAXS)

Low-Angle X-ray Scattering (LAXS)

It is possible to obtain information on thin film composition in real-time! A diagnostic tool for process monitoring.

"Low Angle X-ray Spectroscopy (LAXS)" is a low-angle X-ray spectroscopy method. It provides a diagnostic tool for in-situ real-time process monitoring for PLD/PED systems. It allows for real-time information on thin film composition as a complementary tool to RHEED. 【Features】 ■ It is possible to obtain real-time information on thin film composition as a complementary tool to RHEED. *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray fluorescence analyzer
  • Spectrometer

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Spectrum 3NIR/MIR/FIR FTIR

Spectrum 3NIR/MIR/FIR FTIR

Supports triple range! The beam splitter is an XR-beam splitter, FTIR system with far-infrared grid.

The "Spectrum 3NIR/MIR/FIR FTIR" is a top-class performance FTIR system that supports triple ranges. The beam splitter (B/S) is an XR-beam splitter and far-infrared grid, allowing for the simultaneous installation of two types. The highest resolution is specified at 0.4 cm-1 (mid-infrared). In addition, we offer a lineup that includes the high-performance near-infrared analysis "Spectrum 3 NIR" and the fully functional "Spectrum 3 MIR/FIR FTIR" equipped with advanced far-infrared capabilities. 【Specifications】 ■ Light Source - Downward-Looking Light Source - Near-Infrared Tungsten Halogen Light Source ■ Beam Splitter (B/S) - XR-Beam Splitter - Far-Infrared Grid *For more details, please refer to the PDF materials or feel free to contact us.

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  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
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Space IR Spectrometer

Space IR Spectrometer

IR spectrometer for CubeSats and other ultra-small satellites.

An IR spectrometer that can be used as remote sensing mission equipment for CubeSats and other ultra-small satellites. The wavelength range is from 1000nm to 1700nm with a spatial resolution of approximately 6nm. (The wavelength range can be extended up to 2400nm.) Additionally, it can also be used for UAV applications.

  • Color camera
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  • Spectrometer

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Low Energy Inverse Photoemission Spectroscopy Device "LEIPS"

Low Energy Inverse Photoemission Spectroscopy Device "LEIPS"

No damage to organic semiconductors & high resolution! LUMO level measurements can be made with precision that withstands research!

The low-energy inverse photoelectron spectroscopy device "LEIPS" is a low-energy inverse photoelectron spectroscopy apparatus that can measure LUMO levels with high precision without damaging organic semiconductors. By lowering the irradiation energy below the molecular covalent bond, it avoids damage to the sample. Additionally, it employs high-performance filters for light detection, achieving a resolution of less than 0.5 eV. Based on the conventional device "IPES," it addresses the challenges that have been encountered so far. 【Features】 ■ High sensitivity ■ High resolution of less than 0.5 eV ■ Contributes to the development and performance enhancement of organic semiconductors *For more details, please download the catalog or contact us.

  • Spectroscopic Analysis Equipment
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WITec alpha300 series

WITec alpha300 series

A modular confocal Raman microscope system that achieves uncompromising speed, sensitivity, and resolution!

The "WITec alpha300 series" is a modular confocal Raman microscope system capable of supporting FM and high-resolution Raman measurements. We offer options such as the "alpha300 R," which allows for the selection of laser wavelengths from UV to NIR, and the "alpha300 access," which features high-quality, ultra-precise optical components. Each system can be configured to meet the individual requirements of our customers, providing flexibility for future research challenges. 【Product Lineup (Partial)】 ■ alpha300 A ■ alpha300 S ■ alpha300 apyron ■ alpha300 RA ■ alpha300 RS *For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes
  • Spectrometer

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Cathode Luminescence Spectrometer SPARC

Cathode Luminescence Spectrometer SPARC

This is a high-sensitivity, multifunctional, high-resolution angle-resolved cathodoluminescence (CL) imaging spectrometer for research on microphotonic structures.

Capabilities of SPARC SPARC is a truly unique analytical method suitable for photonic research of nano and microstructures with deep sub-wavelength resolution. It is useful for the study of micro-nanophotonic structures and their related materials, including metallic (plasmonic, Ag, Au, etc.), dielectric (SiO2, Si3N4, TiO2, etc.), and semiconductor (Si, GaAs, CdTe, etc.) materials.

  • Spectroscopic Analysis Equipment
  • Other semiconductors
  • Analytical Equipment and Devices
  • Spectrometer

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Energy Dispersive X-ray Spectroscopy (EDS)

Energy Dispersive X-ray Spectroscopy (EDS)

Detecting characteristic X-rays! An effective analytical method for obtaining elemental information in micro-regions and small foreign substances.

"Energy Dispersive X-ray Spectroscopy (EDS or EDX)" is a method that detects characteristic X-rays generated by electron beam irradiation using a detector attached to an electron microscope (SEM or TEM), allowing for the acquisition of elemental information about samples or foreign substances. When characteristic X-rays generated by irradiating a material with an electron beam enter the detector, a number of electron-hole pairs equivalent to the energy of the characteristic X-rays are produced. By measuring this number (current), it is possible to determine the energy of the characteristic X-rays, and since the energy varies by element, it is possible to investigate the elemental information of the material. [Analysis by EDS (partial)] ■ Qualitative analysis of intermetallic compounds (point analysis) - By examining which elemental characteristic X-ray energy corresponds to the characteristic X-rays in the measured spectrum, the types of elements can be investigated. ■ Semi-quantitative analysis of intermetallic compounds - By examining the intensity (count number) of each characteristic X-ray, the concentration of the contained elements can be calculated. *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Contract Analysis
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[XPS] X-ray Photoelectron Spectroscopy

[XPS] X-ray Photoelectron Spectroscopy

Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).

XPS is a technique that measures the kinetic energy distribution of photoelectrons emitted by X-ray irradiation, providing insights into the types, quantities, and chemical bonding states of elements present on the sample surface (to a depth of about a few nanometers). Because it can provide information about chemical bonding states, it is also known as ESCA: Electron Spectroscopy for Chemical Analysis. - Qualitative and quantitative analysis of elements on solid surfaces (approximately 2 to 8 nm) is possible. - Chemical bonding state analysis is possible. - Non-destructive analysis is possible. - Measurement of depth distribution (using ion sputtering) is possible. - Measurement of insulators is possible. - Measurement under controlled atmospheres is possible.

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Raman spectroscopy

Raman spectroscopy

Obtain information about the molecular structure and crystal structure of the sample.

Raman spectroscopy is a technique that utilizes the phenomenon of light scattering (Raman effect), where the frequency of incident light changes as a result of interaction with molecules, to obtain information about the structure within molecules. - It is possible to obtain information about the molecular structure and crystal structure of the sample. - By using laser light, it can measure smaller areas compared to FT-IR (beam diameter approximately 1 μm).

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[UPS] Ultraviolet Photoelectron Spectroscopy

[UPS] Ultraviolet Photoelectron Spectroscopy

For qualitative and quantitative analysis of the composition of the sample surface and work function evaluation.

UPS is a method that measures the kinetic energy distribution of electrons emitted by ultraviolet light irradiation, providing insights into the valence states of the sample's surface (on the order of a few nanometers). On the other hand, it is also used to evaluate the work function of various metal materials by utilizing high energy resolution. Since it can be measured alongside XPS analysis, it is possible to investigate the qualitative and quantitative surface composition of the sample and the correlation between bonding states and work function values.

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[Analysis Case] Structural Evaluation of Carbon Films

[Analysis Case] Structural Evaluation of Carbon Films

Evaluation of structural specificity, crystallinity, and sp3 characteristics.

Substances composed of carbon include those with crystalline structures such as diamond, graphite, carbon nanotubes, and graphene, as well as those with amorphous structures like diamond-like carbon (DLC). Raman spectroscopy is effective for the structural identification, crystallinity, and sp3 character evaluation of these materials.

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[Analysis Case] Structural Analysis of Silicon Dioxide

[Analysis Case] Structural Analysis of Silicon Dioxide

Structural analysis of amorphous silicon dioxide (SiO2) using Raman scattering spectroscopy.

Silicon dioxide (SiO2) is widely used in semiconductors as an insulating film, in FPD substrate materials, optical materials, and from medical devices to jewelry; however, conducting structural analysis on glass, which is amorphous, is very challenging. Focusing on the cyclic bonding of SiO2 in glass, Raman measurements were conducted. (Figure 1) In single crystal quartz, the spectrum in the glass state is significantly different, and phonon bands due to long-range order are observed. (Figures 2, 3)

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[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)

[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)

EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional analysis.

EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis target area, allowing for elemental and compositional analysis. It is also referred to as Energy Dispersive X-ray Spectroscopy (EDS). In many cases, it is attached to a SEM or TEM, and this document introduces the EDX that accompanies the TEM. - Simultaneous analysis of the entire range of elements (from B to U) is possible (detection of Be is also possible depending on the attached device). - Measurements can be made with a fine electron beam probe of 0.1 nm in diameter or smaller. - By using drift correction functionality, sub-nanometer layered films can be identified as distribution images in surface analysis. - In surface analysis, it is possible to extract spectra from arbitrary locations and display line analysis.

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Points to consider in foreign matter analysis of AES.

Points to consider in foreign matter analysis of AES.

AES: Auger Electron Spectroscopy

In AES analysis, it is possible to evaluate the elemental composition of the surface of minute foreign substances, making it useful for foreign substance analysis in small areas. However, due to the effects of damage from electron beams and other sources, there is a possibility that the foreign substances may change or disappear. Particularly when halogen elements are involved, the impact can be significant, and caution is required. An example of a case where a foreign substance disappeared during SEM observation or AES measurement is shown, specifically regarding NaCl particles on a Si wafer, along with the results of the AES analysis.

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[Analysis Case] Evaluation of Composition and Bonding State of GaN Film by XPS

[Analysis Case] Evaluation of Composition and Bonding State of GaN Film by XPS

Evaluation will be conducted under measurement conditions tailored to the purpose.

This text introduces an example of evaluating the composition and bonding states of GaN films used in LEDs and power devices using XPS. Understanding how the composition and bonding states change due to film formation conditions and surface treatments is effective for process management. It is important to appropriately select the X-rays used during the evaluation according to the purpose. Measurement conditions for each focus will also be presented.

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[Analysis Case] Raman Mapping of Carbon Materials

[Analysis Case] Raman Mapping of Carbon Materials

It is possible to evaluate the distribution of the crystalline state of carbon within the sample surface.

Carbon materials, widely used in industrial components and medical devices, have different properties depending on their structure and crystallinity, making it important to evaluate their state. This document presents evaluation examples using high-sensitivity and high-spatial-resolution Raman spectroscopy. The distribution of the crystalline state of graphite, a carbon material, was visualized through mapping. It allows for a visual capture of the quantity of defects, whether high or low.

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[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy

[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy

Detailed information about the valence band, conduction band, and gap states of the material can be obtained.

Understanding the band structure, including valence bands, conduction bands, and gap states, is an extremely important evaluation criterion for controlling various properties of materials. However, there are limited analytical methods available for direct and detailed assessment of these aspects. Simultaneous measurements of X-ray absorption spectroscopy (XAS) and X-ray emission spectroscopy (XES) using synchrotron radiation allow for a comprehensive understanding of the band structure, as well as detailed information regarding the attribution of the elements and orbitals that compose it. This document presents the XAS and XES spectra of GaN substrates as an example of measurement.

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[Analysis Case] D Mapping of Organic Multilayers by Raman

[Analysis Case] D Mapping of Organic Multilayers by Raman

It is possible to confirm the distribution of components in the depth direction through surface measurements.

In Raman analysis, the component distribution in the depth direction can be confirmed through measurements from the surface. It is effective for materials that easily transmit light, allowing for non-destructive evaluation without the need for cross-section processing or ion sputter etching. This document presents an example of evaluating each layer of an organic multilayer film using Raman 3D mapping. The results indicated that the organic multilayer film is composed of four layers. Additionally, by comparing with library data, the components of each layer were identified.

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[SXES] Soft X-ray Emission Spectroscopy

[SXES] Soft X-ray Emission Spectroscopy

SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.

- It is possible to evaluate the chemical bonding states focusing on specific elements in the sample (especially light elements such as B, C, N, O). - The spectral shape reflects the partial density of states of the targeted elements in the valence band. - Evaluation of the band structure is also possible through simultaneous measurement with X-ray absorption spectroscopy (XAS). - Since information from the bulk is obtained, it is less affected by the influence of the surface region within a few nanometers. - Evaluation can be performed without being affected by charging effects, even for insulators. - The detection limit is low (<1 atomic%), allowing for the evaluation of trace components.

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[Analysis Case] Analysis of Biomolecular Interactions Using STD-NMR

[Analysis Case] Analysis of Biomolecular Interactions Using STD-NMR

Analysis of the presence and strength of interactions between low molecular weight compounds and proteins.

Saturation Transfer Difference (STD) NMR is a type of NMR analytical method used to identify low molecular weight compounds that interact with proteins, demonstrating significant power in drug screening and other applications. This document presents a case study where specific compounds that interact with a particular protein were identified from multiple compound groups using STD-NMR measurements. Measurement method: Nuclear Magnetic Resonance Spectroscopy (NMR) Product fields: Biotechnology, Pharmaceuticals, Cosmetics, Food Analysis purpose: Screening, Drug Design, Interaction Evaluation For more details, please download the document or contact us.

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[Analysis Case] Evaluation of Crystallinity of Carbon Materials Using Raman Mapping

[Analysis Case] Evaluation of Crystallinity of Carbon Materials Using Raman Mapping

It is possible to visualize the in-plane distribution of materials and crystallinity non-destructively!

Our organization offers evaluation of the crystallinity of carbon materials using Raman mapping. Carbon materials possess different properties depending on their structure and crystallinity, and are used in various applications such as industrial components and medical devices. Linking the characteristics of materials to their crystallinity is effective as an indicator for material development. This document presents a case study where the in-plane distribution (peak intensity) of diamond particles, a carbon material applied to the surface of components, and the crystallinity (full width at half maximum) of each diamond particle were evaluated using Raman mapping. Diamonds exhibit a sharp peak observed sensitively at 1330 cm-1, making Raman evaluation effective. [Measurement Method / Processing Method] ■ [Raman] Raman Spectroscopy *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Evaluation of Binding States in Secondary Battery Cathodes

[Analysis Case] Evaluation of Binding States in Secondary Battery Cathodes

You can evaluate the sample in its original state, from the binder and coating to the active substance.

Our organization conducts evaluations of the bonding state of cathodes in secondary batteries. X-ray photoelectron spectroscopy (XPS), which is one of the methods for analyzing surface states, is suitable for evaluating binders and conductive additives due to its shallow detection depth (approximately 10 nm). Hard X-ray photoelectron spectroscopy (HAXPES), which uses hard X-rays (Ga rays) for excitation, allows us to obtain information about active materials buried under binders without causing damage, thanks to its deeper detection depth. 【Measurement and Processing Methods】 ■ [XPS] X-ray Photoelectron Spectroscopy ■ [HAXPES] Hard X-ray Photoelectron Spectroscopy ■ Processing under controlled atmosphere *For more details, please download the PDF or feel free to contact us.

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Rental of the compact Raman spectroscopy system "EnSpectr R532"

Rental of the compact Raman spectroscopy system "EnSpectr R532"

Portable and compact shape, usable in various fields! Introduction of rental items.

At Rex Co., Ltd., we offer rental services for non-destructive testing equipment. The 'EnSpectr R532' is a portable high-precision Raman spectroscopy system that combines the performance of laboratory equipment. It displays the spectrum of the target object in real-time. By comparing the acquired spectrum with a database, it identifies the substance in a short time. High-precision Raman analysis is possible through an intuitive user interface. 【Features】 ■ Visualization of 3 patterns of spectral data ■ Four attachments tailored to the target object ■ Portable and space-saving design ■ Usable for various applications *For more details, please refer to the external link page or feel free to contact us.

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Handheld Ramen BRAVO

Handheld Ramen BRAVO

Ideal for raw material inspection, high-performance handheld Raman from Germany.

A large touchscreen equipped with outstanding performance, sophisticated design, and an intuitive graphical user interface. BRAVO is a high-performance handheld Raman device that streamlines the acceptance inspection and quality control of various raw materials.

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Confocal Microscopy Laser Raman "SENTERRA II"

Confocal Microscopy Laser Raman "SENTERRA II"

[Technical Data Presentation] Achieving high sensitivity performance and high frequency accuracy! A compact and robust distributed micro-Raman system.

The "SENTERRA II" is a high-performance system unique to Bruker, capable of handling everything from routine analyses such as quality control to cutting-edge research fields. In typical Raman microscopes, the spectrometer is mostly a separate system from the microscope, requiring a significant amount of time to maintain performance. This product is a compact and robust integrated system that combines the excitation laser, spectrometer, and microscope, achieving high performance and stability through its efficient optical design. Additionally, it supports operators smoothly and accurately to obtain results quickly. It guides users step by step through the procedures of data measurement, from visual observation of samples to confirming spectral quality and setting measurement areas. [Features] - Highly automated various functions and efficient operability - Compact & robust design - Efficiency and flexibility *For more details, please refer to the PDF document or feel free to contact us.

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Technical Data: Depth Analysis of Composites Using Confocal Microscopic Raman Spectroscopy System

Technical Data: Depth Analysis of Composites Using Confocal Microscopic Raman Spectroscopy System

Basic knowledge of micro-Raman spectroscopy is published! Free materials are being offered!

This document presents technical information on depth analysis of composite materials using the confocal micro-Raman spectroscopy system "SENTERRA II." It introduces the usefulness of depth analysis using the confocal micro-Raman spectroscopy system, starting with basic knowledge of micro-Raman spectroscopy and two application examples. 【Contents】 ■Introduction 　・Micro-Raman Spectroscopy 　・Differences in optical systems between general optical microscopes and confocal microscopes ■Confocal Optical System ■Micro-Raman Spectroscopy System SENTERRA II ■Application Examples 　・Qualitative analysis of foreign substances in gel within a syringe 　・Analysis of laminate films with multilayer structures ■Conclusion *For more details, please refer to the PDF document or feel free to contact us.

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Technical Data: High Spatial Resolution ATR Mapping Measurement (LUMOS II)

Technical Data: High Spatial Resolution ATR Mapping Measurement (LUMOS II)

[JASIS2021 Exhibition] LUMOS II - Approaching the diffraction limit of light! High spatial resolution ATR mapping measurement.

The analysis of laminated materials composed of multiple layers with micrometer-scale thickness is one of the important analytical themes, and its influence is showing significant expansion. In this theme, micro-infrared spectroscopy and micro-Raman spectroscopy, which have a mutually complementary relationship, are the most effective analytical methods. The analysis of laminated materials is applied not only to this field but also to a wide range of areas such as biomedicine, pharmaceuticals, and materials science. This document provides a clear explanation of: 　▶ The importance of spatial resolution when applying microspectroscopy to the analysis of laminated materials 　▶ Reports on ATR mapping measurements using the latest micro FT-IR systems *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibition at JASIS2021◆ For information about the exhibition, please check the basic information below.

  • Other environmental analysis equipment
  • Spectrometer

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