We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Spectrometer.
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Spectrometer Product List and Ranking from 40 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Spectrometer Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. オプトシリウス Tokyo//others
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 日本カンタム・デザイン Tokyo//Testing, Analysis and Measurement
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Spectrometer Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. X-ray photoelectron spectroscopy device 'Nexsa' サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. JPS-9030 Photoelectron Spectroscopy Device (XPS) アズサイエンス 松本本社
  3. High-resolution Fourier-transform infrared spectrometer nano-FTIR 日本カンタム・デザイン
  4. 4 Fully Automated X-ray Photoelectron Spectroscopy Device 'K-Alpha' サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  5. 5 [UPS] Ultraviolet Photoelectron Spectroscopy 一般財団法人材料科学技術振興財団　MST

Spectrometer Product List

31～45 item / All 230 items

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Low-Angle X-ray Scattering (LAXS)

Low-Angle X-ray Scattering (LAXS)

It is possible to obtain information on thin film composition in real-time! A diagnostic tool for process monitoring.

"Low Angle X-ray Spectroscopy (LAXS)" is a low-angle X-ray spectroscopy method. It provides a diagnostic tool for in-situ real-time process monitoring for PLD/PED systems. It allows for real-time information on thin film composition as a complementary tool to RHEED. 【Features】 ■ It is possible to obtain real-time information on thin film composition as a complementary tool to RHEED. *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray fluorescence analyzer

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Spectrum 3NIR/MIR/FIR FTIR

Spectrum 3NIR/MIR/FIR FTIR

Supports triple range! The beam splitter is an XR-beam splitter, FTIR system with far-infrared grid.

The "Spectrum 3NIR/MIR/FIR FTIR" is a top-class performance FTIR system that supports triple ranges. The beam splitter (B/S) is an XR-beam splitter and far-infrared grid, allowing for the simultaneous installation of two types. The highest resolution is specified at 0.4 cm-1 (mid-infrared). In addition, we offer a lineup that includes the high-performance near-infrared analysis "Spectrum 3 NIR" and the fully functional "Spectrum 3 MIR/FIR FTIR" equipped with advanced far-infrared capabilities. 【Specifications】 ■ Light Source - Downward-Looking Light Source - Near-Infrared Tungsten Halogen Light Source ■ Beam Splitter (B/S) - XR-Beam Splitter - Far-Infrared Grid *For more details, please refer to the PDF materials or feel free to contact us.

  • others
  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment

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Space IR Spectrometer

Space IR Spectrometer

IR spectrometer for CubeSats and other ultra-small satellites.

An IR spectrometer that can be used as remote sensing mission equipment for CubeSats and other ultra-small satellites. The wavelength range is from 1000nm to 1700nm with a spatial resolution of approximately 6nm. (The wavelength range can be extended up to 2400nm.) Additionally, it can also be used for UAV applications.

  • Color camera
  • others

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Low Energy Inverse Photoemission Spectroscopy Device "LEIPS"

Low Energy Inverse Photoemission Spectroscopy Device "LEIPS"

No damage to organic semiconductors & high resolution! LUMO level measurements can be made with precision that withstands research!

The low-energy inverse photoelectron spectroscopy device "LEIPS" is a low-energy inverse photoelectron spectroscopy apparatus that can measure LUMO levels with high precision without damaging organic semiconductors. By lowering the irradiation energy below the molecular covalent bond, it avoids damage to the sample. Additionally, it employs high-performance filters for light detection, achieving a resolution of less than 0.5 eV. Based on the conventional device "IPES," it addresses the challenges that have been encountered so far. 【Features】 ■ High sensitivity ■ High resolution of less than 0.5 eV ■ Contributes to the development and performance enhancement of organic semiconductors *For more details, please download the catalog or contact us.

  • Spectroscopic Analysis Equipment

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WITec alpha300 series

WITec alpha300 series

A modular confocal Raman microscope system that achieves uncompromising speed, sensitivity, and resolution!

The "WITec alpha300 series" is a modular confocal Raman microscope system capable of supporting FM and high-resolution Raman measurements. We offer options such as the "alpha300 R," which allows for the selection of laser wavelengths from UV to NIR, and the "alpha300 access," which features high-quality, ultra-precise optical components. Each system can be configured to meet the individual requirements of our customers, providing flexibility for future research challenges. 【Product Lineup (Partial)】 ■ alpha300 A ■ alpha300 S ■ alpha300 apyron ■ alpha300 RA ■ alpha300 RS *For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes

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Cathode Luminescence Spectrometer SPARC

Cathode Luminescence Spectrometer SPARC

This is a high-sensitivity, multifunctional, high-resolution angle-resolved cathodoluminescence (CL) imaging spectrometer for research on microphotonic structures.

Capabilities of SPARC SPARC is a truly unique analytical method suitable for photonic research of nano and microstructures with deep sub-wavelength resolution. It is useful for the study of micro-nanophotonic structures and their related materials, including metallic (plasmonic, Ag, Au, etc.), dielectric (SiO2, Si3N4, TiO2, etc.), and semiconductor (Si, GaAs, CdTe, etc.) materials.

  • Spectroscopic Analysis Equipment
  • Other semiconductors
  • Analytical Equipment and Devices

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Energy Dispersive X-ray Spectroscopy (EDS)

Energy Dispersive X-ray Spectroscopy (EDS)

Detecting characteristic X-rays! An effective analytical method for obtaining elemental information in micro-regions and small foreign substances.

"Energy Dispersive X-ray Spectroscopy (EDS or EDX)" is a method that detects characteristic X-rays generated by electron beam irradiation using a detector attached to an electron microscope (SEM or TEM), allowing for the acquisition of elemental information about samples or foreign substances. When characteristic X-rays generated by irradiating a material with an electron beam enter the detector, a number of electron-hole pairs equivalent to the energy of the characteristic X-rays are produced. By measuring this number (current), it is possible to determine the energy of the characteristic X-rays, and since the energy varies by element, it is possible to investigate the elemental information of the material. [Analysis by EDS (partial)] ■ Qualitative analysis of intermetallic compounds (point analysis) - By examining which elemental characteristic X-ray energy corresponds to the characteristic X-rays in the measured spectrum, the types of elements can be investigated. ■ Semi-quantitative analysis of intermetallic compounds - By examining the intensity (count number) of each characteristic X-ray, the concentration of the contained elements can be calculated. *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Contract Analysis

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[XPS] X-ray Photoelectron Spectroscopy

[XPS] X-ray Photoelectron Spectroscopy

Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).

XPS is a technique that measures the kinetic energy distribution of photoelectrons emitted by X-ray irradiation, providing insights into the types, quantities, and chemical bonding states of elements present on the sample surface (to a depth of about a few nanometers). Because it can provide information about chemical bonding states, it is also known as ESCA: Electron Spectroscopy for Chemical Analysis. - Qualitative and quantitative analysis of elements on solid surfaces (approximately 2 to 8 nm) is possible. - Chemical bonding state analysis is possible. - Non-destructive analysis is possible. - Measurement of depth distribution (using ion sputtering) is possible. - Measurement of insulators is possible. - Measurement under controlled atmospheres is possible.

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  • Contract Analysis
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Raman spectroscopy

Raman spectroscopy

Obtain information about the molecular structure and crystal structure of the sample.

Raman spectroscopy is a technique that utilizes the phenomenon of light scattering (Raman effect), where the frequency of incident light changes as a result of interaction with molecules, to obtain information about the structure within molecules. - It is possible to obtain information about the molecular structure and crystal structure of the sample. - By using laser light, it can measure smaller areas compared to FT-IR (beam diameter approximately 1 μm).

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  • Contract Analysis
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[UPS] Ultraviolet Photoelectron Spectroscopy

[UPS] Ultraviolet Photoelectron Spectroscopy

For qualitative and quantitative analysis of the composition of the sample surface and work function evaluation.

UPS is a method that measures the kinetic energy distribution of electrons emitted by ultraviolet light irradiation, providing insights into the valence states of the sample's surface (on the order of a few nanometers). On the other hand, it is also used to evaluate the work function of various metal materials by utilizing high energy resolution. Since it can be measured alongside XPS analysis, it is possible to investigate the qualitative and quantitative surface composition of the sample and the correlation between bonding states and work function values.

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  • Contract Analysis
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[Analysis Case] Structural Evaluation of Carbon Films

[Analysis Case] Structural Evaluation of Carbon Films

Evaluation of structural specificity, crystallinity, and sp3 characteristics.

Substances composed of carbon include those with crystalline structures such as diamond, graphite, carbon nanotubes, and graphene, as well as those with amorphous structures like diamond-like carbon (DLC). Raman spectroscopy is effective for the structural identification, crystallinity, and sp3 character evaluation of these materials.

  • Contract Analysis

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[Analysis Case] Structural Analysis of Silicon Dioxide

[Analysis Case] Structural Analysis of Silicon Dioxide

Structural analysis of amorphous silicon dioxide (SiO2) using Raman scattering spectroscopy.

Silicon dioxide (SiO2) is widely used in semiconductors as an insulating film, in FPD substrate materials, optical materials, and from medical devices to jewelry; however, conducting structural analysis on glass, which is amorphous, is very challenging. Focusing on the cyclic bonding of SiO2 in glass, Raman measurements were conducted. (Figure 1) In single crystal quartz, the spectrum in the glass state is significantly different, and phonon bands due to long-range order are observed. (Figures 2, 3)

  • Contract Analysis

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[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)

[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)

EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional analysis.

EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis target area, allowing for elemental and compositional analysis. It is also referred to as Energy Dispersive X-ray Spectroscopy (EDS). In many cases, it is attached to a SEM or TEM, and this document introduces the EDX that accompanies the TEM. - Simultaneous analysis of the entire range of elements (from B to U) is possible (detection of Be is also possible depending on the attached device). - Measurements can be made with a fine electron beam probe of 0.1 nm in diameter or smaller. - By using drift correction functionality, sub-nanometer layered films can be identified as distribution images in surface analysis. - In surface analysis, it is possible to extract spectra from arbitrary locations and display line analysis.

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Points to consider in foreign matter analysis of AES.

Points to consider in foreign matter analysis of AES.

AES: Auger Electron Spectroscopy

In AES analysis, it is possible to evaluate the elemental composition of the surface of minute foreign substances, making it useful for foreign substance analysis in small areas. However, due to the effects of damage from electron beams and other sources, there is a possibility that the foreign substances may change or disappear. Particularly when halogen elements are involved, the impact can be significant, and caution is required. An example of a case where a foreign substance disappeared during SEM observation or AES measurement is shown, specifically regarding NaCl particles on a Si wafer, along with the results of the AES analysis.

  • Contract Analysis

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