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Tester Product List and Ranking from 30 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 09, 2025～Aug 05, 2025
This ranking is based on the number of page views on our site.

Tester Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 09, 2025～Aug 05, 2025
This ranking is based on the number of page views on our site.

  1. TAKAYA Corporation Okayama//Industrial Electrical Equipment
  2. null/null
  3. null/null
  4. 4 null/null
  5. 5 ムサシインテック Saitama//Industrial Electrical Equipment
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Tester Product ranking

Last Updated： Aggregation Period:Jul 09, 2025～Aug 05, 2025
This ranking is based on the number of page views on our site.

  1. Basic Knowledge of In-Circuit Testing: What is an In-Circuit Tester? TAKAYA Corporation
  2. Leak Tester [Reducing Total Costs in Implementation]
  3. Nodson DAGE Bond Tester (Joint Strength Testing Machine) オーヨー
  4. 4 Protection Relay Tester OCR/GCR Relay Tester ORT-50SV ムサシインテック
  5. 5 Multi JumpTester2

Tester Product List

46～60 item / All 796 items

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Shutter Tester (FOCAL) "FS-3000"

Shutter Tester (FOCAL) "FS-3000"

Camera shutter accuracy measurement is possible! Supports continuous measurement at ultra-fast 1/16,000s and 20 times per second! Measures shutter movement with 9-point measurement!

The "FS-3000" is a shutter tester for cameras using a parallel light source method. It is suitable for measuring and assessing the accuracy of camera focal plane shutters. It can accommodate shutter speeds of up to 1/16,000s and supports continuous measurements at 20 times per second. It can measure the shutter movement with 9-point measurements. 【Features】 ○ Parallel light source method ○ Tester for digital camera focal plane shutters ○ Supports shutter speeds of 1/16,000s ○ Continuous measurement at 20 times/second ○ Capable of measuring shutter movement with 9-point measurements ○ Measurement accuracy: ±1μs ○ Easy operation with a touch panel ○ Measurement items: - Shutter speed - Shutter speed for each of the 9 points - Moving time for the first and second curtains - Delay time ● For more details, please contact us or refer to the catalog.

  • Other image-related equipment

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Crack Tester CT-121 / CT-3

Crack Tester CT-121 / CT-3

Easily detect metal cracks with your eyes and ears. Lightweight and compact eddy current flaw detector.

The Crack Tester CT-121/CT-3 is a revolutionary eddy current flaw detector designed to be lightweight and compact. Traditional eddy current flaw detectors require specialized knowledge and techniques such as phase difference and vector analysis, but the CT-121/CT-3 allows anyone to easily confirm cracks using just the meter's fluctuations and the sound from the headphones. In terms of performance, it achieves unprecedented high sensitivity with a newly developed sensor, making it possible to detect fine cracks that were previously difficult to identify. Additionally, measurements can be taken without removing paint, and non-contact measurements are also possible. It is compatible with all metals, from steel to stainless steel and non-ferrous metals like aluminum.

  • Other inspection equipment and devices

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Electronic Circuit Tester "Erestar" [For checking continuity of electronic circuits and wiring]

Electronic Circuit Tester "Erestar" [For checking continuity of electronic circuits and wiring]

Ideal for checking continuity in electronic circuits and wiring.

It is used for continuity checks of electronic circuits and wiring. For measuring circuits that use semiconductor devices, the open circuit voltage between the probes is specified to be 300 millivolts or less, and the short-circuit current between the probes is specified to be 400 microamperes or less. It can also be used as a continuity tester during the production of distribution boards and control panels.

  • Other electronic parts

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High Sensitivity Differential Pressure Leak Tester

High Sensitivity Differential Pressure Leak Tester

We can offer low-cost solutions for vacuum differential pressure and positive pressure differential methods from water immersion testing. Visualization is achieved through bubble checking. We also accept equipment rentals.

The vacuum differential pressure method inherits the advantages of the positive pressure differential method while suppressing variations in measurement values caused by changes in workpiece temperature, room temperature, seasonal temperature fluctuations throughout the year, changes in the atmosphere during measurement, air flow, far-infrared radiation, and direct contact with hands, thereby eliminating misjudgments due to temperature and climate changes.

  • Company：センサ
  • Price：1 million yen-5 million yen
  • Leak Testing Equipment

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Dual Side Flying Probe Tester: APT-1600FD

Dual Side Flying Probe Tester: APT-1600FD

This is a flagship model that arranges probe heads on both the top and bottom, enabling simultaneous in-circuit testing of the front and back of the substrate.

Four probes are arranged on the top side of the substrate and two on the bottom side. Each probe can move freely and at high speed, achieving an astonishing inspection speed that is world-class in its category. By using the flying probes on both the top and bottom simultaneously, a combination inspection with up to six probes allows for simultaneous contact inspection at both points on the top and bottom sides of the substrate. This significantly expands the inspection range and further accelerates inspection time. It is equipped with a wealth of features and boasts world-class standards in speed and positioning accuracy. ★ You can bring your substrate to our demo room at our Okayama headquarters for evaluation testing ★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

  • Circuit Board Inspection Equipment

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Dual Side Flying Probe Tester APT-1600FD-SL

Dual Side Flying Probe Tester APT-1600FD-SL

The probe head is arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)

The simultaneous use of upper and lower flying probes enables a combination inspection of up to 6 probes, allowing for the inspection of components that can make contact at both points on the top and bottom of the substrate. This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long substrates up to W985×D610mm. It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★Evaluation tests can be conducted by bringing your substrates to the demo room at our Okayama headquarters★ The entire process from creating inspection programs, inspecting using actual substrates, to summarizing evaluation results can be tested in a single flow. If you are interested, please apply through the 'Contact Us' section below.

  • Circuit Board Inspection Equipment

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