TY-CHECKER Type E Tester for Semiconductors
Contributing to improved yield in semiconductor manufacturing with high-speed, high-precision inspection!
In the semiconductor industry, accurate inspection of substrates is essential to ensure product quality and reliability. Especially as miniaturization progresses, issues such as connectivity failures, insulation failures, and shorts can significantly reduce yield. The TY-CHECKER Type E tester contributes to yield improvement by quickly detecting these problems through high-speed and high-precision inspection. 【Usage Scenarios】 * Inspection in the semiconductor substrate manufacturing process * Inspection of FPC (Flexible Printed Circuit Boards) * Inspection of package and module substrates 【Benefits of Implementation】 * Prevents the outflow of defective products and improves yield * Increases productivity by reducing inspection time * Capable of addressing diverse inspection needs
- Company:太洋テクノレックス 本社 和歌山
- Price:Other