Evaluation of dislocation density using EBSD/XRD
EBSD and XRD (X-Ray Diffraction) are useful analytical methods for evaluating distortion.
There are two types of dislocations: GN dislocations, which involve a change in crystal orientation, and SS dislocations, which do not involve a change in crystal orientation. EBSD can only detect GN dislocations, while XRD can detect both GN and SS dislocations.
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