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evaluation Product List and Ranking from 37 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

evaluation Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. 大同分析リサーチ Aichi//Service Industry
  4. 4 ユーロフィンFQL Kanagawa//Service Industry
  5. 5 ロンビック Mie//Resin/Plastic
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evaluation Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Eurofins FQL Co., Ltd. | Business Information ユーロフィンFQL
  2. Surface shape evaluation using a laser microscope. 一般財団法人材料科学技術振興財団　MST
  3. Lithium-ion battery contract evaluation (charging and discharging tests / safety tests / post-test analysis)
  4. Development of conductive pastes and inks, surface treatment, synthesis, and evaluation of metal nanoparticles. AndTech
  5. 4 Spectrophotometer 'spectro 2 guide Pro' evaluation of jet blackness テツタニ

evaluation Product List

46～60 item / All 333 items

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Evaluation of brightness and color uniformity of liquid crystal displays

Evaluation of brightness and color uniformity of liquid crystal displays

By using a two-dimensional color brightness meter for measurement, it is possible to evaluate unevenness and other factors!

Our company conducts evaluations of brightness and color uniformity for emitting surfaces such as OLEDs, titled "Evaluation of Brightness and Color Uniformity of LCD Displays." In brightness measurement (using a two-dimensional photometer to measure the display surface), we compare the digital camera images of the LCD display surface with the results obtained from the brightness measurements conducted with the two-dimensional photometer. While the distribution of uniformity is difficult to discern in the digital camera images, the color scale display of the brightness distribution highlights areas with brightness uniformity issues, making it easier to understand. 【Overview of Measurement Equipment】 ■ Measurement Items: Tristimulus values (X, Y, Z), chromaticity (x, y) ■ Measurement Range: 0.01 cd/m² to 1,000,000 cd/m² ■ Effective Pixel Count: 1376 × 1024 ■ Emitting Surface Size: Approximately 15 to 115 inches ■ Installation Method/Fixtures: Vertical, horizontal, etc., adaptable to shape *For more details, please refer to the PDF document or feel free to contact us.

  • Public Testing/Laboratory

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Evaluation of pore distribution in non-woven fabric sheets

Evaluation of pore distribution in non-woven fabric sheets

Important analysis items for performance evaluation and quality control of functional materials! Evaluation of pore size and pore distribution of non-woven sheets and membrane materials.

This is an example of evaluating the maximum pore diameter and pore size distribution of non-woven fabric sheets using the bubble point method. The sample is immersed in a chemical solution and air pressure is applied. The pressure is increased until it overcomes the surface tension of the chemical solution absorbed in the sheet, resulting in the appearance of bubbles; this pressure is referred to as the bubble point. The maximum pore diameter can be calculated based on the bubble point pressure and the surface tension of the chemical solution. 【Calculation Formula】 ■d = Cy/P ・d: Maximum pore diameter ・C: Constant ・y: Surface tension of the chemical solution ・P: Differential pressure *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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[Analysis Case] Composition and Thickness Evaluation of Ultra-Thin SiON Films

[Analysis Case] Composition and Thickness Evaluation of Ultra-Thin SiON Films

Estimation of film thickness using the average free path of photoelectrons.

For extremely thin films with a thickness of a few nanometers or less, such as natural oxide films on silicon wafers and silicon nitride thin films, we will measure the Si2p spectrum of the sample's surface. By performing waveform analysis on the obtained spectrum, we will determine the proportion of each bonding state and estimate the film thickness from this result and the average free path of photoelectrons (Equation 1).

  • Contract Analysis

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[Analysis Case] Evaluation of Si Anode in Lithium-Ion Secondary Batteries

[Analysis Case] Evaluation of Si Anode in Lithium-Ion Secondary Batteries

It is possible to evaluate the structure of the Si anode after charging through sample cooling.

Si is one of the candidates for high-capacity negative electrode active materials, but it is said to suffer from severe cycle degradation due to very large volume changes during charge and discharge. In this study, to confirm the state of the Si negative electrode after charging, we disassembled it under a controlled atmosphere environment and performed cooling FIB processing, followed by observing the cross-sectional shape using SEM. When observing the cross-section at room temperature, significant damage such as film contraction, roughness of the observation surface, and pore formation was observed. In contrast, by conducting the observation while cooling, we were able to suppress the alteration of the Si negative electrode and evaluate the original shape of the sample.

  • 冷却FIB加工_室温SEM観察.png
  • 充電曲線およびSi負極の形態観察.png
  • 充電後の形状観察結果_Si膜の変質_Cu箔の露出.png
  • 電池図.png
  • Contract Analysis
  • Contract measurement

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[Analysis Case] Quality Evaluation of SiC Substrates

[Analysis Case] Quality Evaluation of SiC Substrates

Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.

SiC power devices are expected to reduce power loss and handle high power in a compact form as power conversion elements. The quality evaluation of SiC substrates, which is necessary for manufacturing these devices, has become a challenge. We propose a method to evaluate and quantify the crystal orientation, in-plane defect distribution, surface roughness, and impurities of SiC substrates, as well as to visualize these factors. Measurement methods: XRD, AFM, PL, SIMS Product fields: Power devices, lighting Analysis purposes: Trace concentration evaluation, structural evaluation, shape evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

  • Contract Analysis

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[Analysis Case] Composite Evaluation of Zn-based Buffer Layer Using X-rays

[Analysis Case] Composite Evaluation of Zn-based Buffer Layer Using X-rays

Evaluation of composition, bonding state, structure, and density is possible.

In the pursuit of improving the efficiency of CIGS thin-film solar cells, various buffer layer materials have been investigated for controlling the band structure and crystallinity from the light absorption layer to the transparent electrode. This presents a case study of various evaluations conducted using X-rays on Zn-based buffer layers deposited on a flattened substrate. Comparisons can be made between different levels based on deposition conditions and various processes after deposition.

  • Contract Analysis

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Evaluation of organic substances at the metal interface causing delamination.

Evaluation of organic substances at the metal interface causing delamination.

TOF-SIMS can evaluate organic substances at metal interfaces in the depth direction.

Organic substances at metal interfaces can cause poor adhesion and delamination. For analyzing this poor adhesion, physically peeling off the layers and conducting qualitative analysis on the peeled surfaces is effective (refer to analysis case C0198). On the other hand, there are many cases where peeling cannot be performed, and in such cases, using a sputtering ion source for depth analysis is effective. This document presents a case of qualitative analysis of organic substances at metal interfaces, either in thin films or as secondary contamination, in the depth direction. As a conclusion, the presence of organic substances was confirmed by detecting C-series ions. Additionally, it is sometimes possible to identify organic substances by comparing them with known standard samples.

  • Ingredient analysis
  • Other analysis and evaluation services

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Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.

Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.

We will conduct a multifaceted investigation of heating effects on plated components using AFM scanning probe microscopy and AES Auger electron spectroscopy.

The AFM scanning probe microscope is a device that detects various physical interactions occurring between the probe and the sample surface, allowing for the observation of surface shapes in minute areas and the measurement of electrical and mechanical properties. These physical interactions include atomic forces, frictional forces, and electrostatic forces. Additionally, measurements can be conducted in various environments, including atmospheric and vacuum conditions, enabling the observation of sample surfaces regardless of whether they are conductive or insulating. The AES Auger electron spectrometer allows for elemental analysis of the extreme surface layer of materials (approximately 5nm) and investigation of concentration gradients in the depth direction. Using these two analytical devices, we conducted a study on the heating effects on the surface of plated connector contact pins. Please take a moment to read the PDF materials. Furthermore, in addition to these analytical devices, our company also conducts various surface analyses such as XPS and GD-OES. We would be happy to assist you, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Contract Analysis
  • Analysis Services
  • Plating Equipment

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Conductivity evaluation of plated contact component surfaces 【DL available/AFM】

Conductivity evaluation of plated contact component surfaces 【DL available/AFM】

AFM can capture and measure extremely small surface topographies (roughness).

The AFM scanning probe microscope is a device that "detects various physical interactions between the probe and the sample surface, allowing for the observation of surface shapes in minute areas and the measurement of electrical and mechanical properties." These physical interactions include atomic forces, frictional forces, and electrostatic forces. Additionally, measurements can be taken in various environments, including atmospheric and vacuum conditions, enabling the observation of sample surfaces regardless of conductivity or insulation. Using this analytical device, we conducted an investigation into the "surface treatment of plated connector contact parts." Please take a moment to read the PDF materials. Furthermore, in addition to this analytical device, our company also conducts various surface analyses such as XPS, AES, and GD-OES. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *We have many other achievements as well. If you request through the inquiry button, we will send them to you.

  • Plating Equipment
  • Contract Analysis
  • Electrical Instruments/Electrometers

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Evaluation of semiconductor insulating films using STEM/EDS.

Evaluation of semiconductor insulating films using STEM/EDS.

STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information regarding the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. Additionally, the following features are available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information on crystal defects (dislocations, twins, etc.) within the crystal In this case, we introduce "Evaluation of Semiconductor Insulating Films using STEM-EDS." This case yielded no issues, but abnormal detection is also possible. Please take a moment to read the PDF materials. Furthermore, in addition to this STEM, our company excels in identifying defective areas by performing 3D reconstruction on specific regions of the sample in combination with FIB. We would be happy to provide a demonstration, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Semiconductor inspection/test equipment
  • Contract Analysis
  • Other semiconductors

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Eurofins FQL Co., Ltd. | Business Information

Eurofins FQL Co., Ltd. | Business Information

Reliability evaluation, environmental testing, failure analysis, support for building and improving quality-related systems and processes, quality-related education, etc., specialists solve quality assurance challenges!

Eurofins FQL Co., Ltd. has its origins in the analysis division of Fujitsu Laboratories Ltd. and the quality assurance department of Fujitsu Ltd. It has been engaged in activities to improve product quality for a long time, not only in material analysis, reliability evaluation, safety assessment, and failure analysis, but also in supplier quality management and manufacturing plant audits. Additionally, it contributes to solving challenges faced by organizations responsible for quality through the development and educational support of personnel involved in quality, as well as the construction and improvement of quality management, product chemical substance management systems, and software development processes. ■ Reliability Evaluation and Environmental Testing Various reliability evaluations, safety verification of secondary batteries, power supplies, etc., including smoke and fire hazards. Evaluation of special environments such as weather resistance and gas corrosion. ■ Failure Analysis Failure analysis of electronic components and devices, confirmation of characteristics related to materials, and detailed analysis of defects. ■ Support for Building and Improving Quality-Related Systems and Processes To achieve QCD (Quality, Cost, Delivery) goals, we support the improvement of development processes using models such as CMMI and Automotive SPICE. ■ Quality-Related Education Customizing educational programs for needs such as "wanting to energize the organization," "wanting to cultivate a quality mindset," and "wanting to provide quality education for new employees."

  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Survey Environmental Assessment

Survey Environmental Assessment

Environmental assessment (environmental impact assessment) is an important method for maintaining a rich natural environment and a comfortable living environment.

In the world, there are various development projects, but in order to avoid development projects that ignore the natural environment and living conditions, we will predict and evaluate the impacts of development on the natural and living environments, and conduct assessments to determine whether the project plans are appropriate.

  • Other analyses

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Practical Food Safety Statistics: Quality Control and Risk Assessment Using R and Excel

Practical Food Safety Statistics: Quality Control and Risk Assessment Using R and Excel

Using R and Microsoft Excel, this explains the statistical approach to food safety and quality management methods in relation to food risk.

Knowledge of statistics is important for managing food safety and quality, and especially now, the entire food industry is required to implement quantitative management incorporating HACCP plans and risk assessments. 1: Basics of Statistics 2: Statistical methods necessary for food safety and quality management This book provides a detailed explanation of these topics. The accompanying programs (R, Excel) can be downloaded from the NTS website, allowing for verification of knowledge acquisition.

  • Technical and Reference Books
  • Other safety and hygiene products
  • Food storage equipment and facilities

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Measurement of food texture and taste evaluation

Measurement of food texture and taste evaluation

A systematic and practical explanation of food texture fundamentals, food development, cooking, and processing!

◇ "Texture," which is extremely important in determining the deliciousness of food!! ◇ A systematic and practical explanation from the basics of food development to cooking and processing! - The physical structure and rheology of food for accurately measuring texture - Sensory testing and data analysis to match psychological sensory quantities - Development of solid foods, special structures, and foods for the elderly - Cooking, processing, and new texture foods

  • Technical and Reference Books
  • Viscometer
  • Food Processing Equipment

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DJK Material Property Evaluation

DJK Material Property Evaluation

This is a testing service for evaluating the basic physical properties of polymers and other materials.

From the fundamental property evaluation of new materials developed by our customers to product quality control, various physical property evaluation tests are possible. Our main measuring instruments are regularly calibrated to ensure constant traceability, and we can accommodate a wide range of tests from standard-compliant tests (JIS, ISO, ASTM) to non-standard tests.

  • Other polymer materials

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