Macro inspection spot lighting MSPA-10WA/MSPA-10DA
[Demo unit available for loan] This lighting is suitable for inspecting transparent and translucent compound semiconductor wafers, defect inspection on non-transparent silicon wafer surfaces, and scratch inspection on optical lenses.
The combination of the stand and shaft enables flexible lighting. With the standard zoom lens, visual inspection can be performed in the irradiation area tailored to inspection conditions. ■ The efficiency of defect inspection on the mask surface of transparent and translucent compound semiconductors, wafers, and non-transparent silicon wafers, as well as scratch inspection on glass and lenses, is significantly improved. ■ The irradiation angle and height can be set arbitrarily, and a compact size has also been achieved. ■ The adoption of bulb color LEDs allows for replacement of halogen lamps. ■ Fanless design enables use in clean room environments that are sensitive to dust. ■ A variety of interchangeable lenses and filters are available. For more details, please download the catalog.
- Company：ハヤシレピック 第1事業部
- Price：Other
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