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Microscope(100) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
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Microscope Product List

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Halleation Microscope

Halleation Microscope

Observation of curved surfaces and R surfaces is also possible with unique lighting effects 'PS-100-S7Z45R100A'

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt on cylindrical objects like shafts, which are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a specular reflection image can be obtained with external lighting, it enables observation of surface protrusions and other features "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. The halation microscope "PS-100-S7Z45R100A" is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The moving image shown below is a comparative image captured using the halation microscope "PS-100-S7Z45R100A" (medium magnification) for curved surface observation, depicting a 2φ shaft illuminated with both halation lighting and incident lighting. The incident lighting image captures only the apex of the shaft, while the halation lighting image covers over 60°.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Hole observation microscope

Hole observation microscope

Observe the sides of the hole all at once with wide-angle footage! A high-definition microscope for hole observation is here!

This is a microscope that allows you to observe the bottom of a hole and the inner wall of the hole simultaneously. Since it can be checked on a monitor, it reduces fatigue and is ideal for improving work efficiency! Additionally, visual sharing on the monitor can also reduce mistakes. We have prepared two types according to your needs: PC connection type: SKM-W100B-PC3 Full HD monitor connection type: SKM-W100B-FHD2 【Specifications】 Lens image circle: φ6.6mm Observational hole size: φ5–120mm SKM-W100B-PC3: Resolution 1920x1080, 41.6fps, USB3.0 output SKM-W100B-FHD2: Resolution 1920x1080, 60fps, HDMI output

  • Microscope
  • Other microscopes

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Halleation Microscope

Halleation Microscope

Microscope using halation lighting. Detects invisible scratches and dirt with a reflected light method.

Using a halation lighting system that utilizes reflected light, we achieve exceptionally high-resolution images of cracks, scratches, and dirt that are difficult to see with conventional direct lighting. (Left side reference comparison image: dent on a motor shaft) Since a small angle reflection image can be obtained, surface protrusions are easy to observe, making tasks such as quality inspection significantly easier. We also offer an optimal model for curved surface observation, which will help resolve issues with observing R surfaces. ● Capable of observing particles down to 4 microns at 50-300x zoom and down to 2 microns at 100-600x zoom (models can be selected based on the observation target). ● Clear images with outstanding versatility. ■ For reference comparison images and detailed catalogs, please download and view.

  • Optical microscope
  • Microscope

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Haleration Microscope "PS-100-S7Z90A"

Haleration Microscope "PS-100-S7Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image taken with the high-magnification halation microscope "PS-100-S7Z90A" for planar observation, capturing the ITO and spacers of the LCD using halation lighting and incident lighting. The image captured with incident lighting does not show the ITO, while the image captured with halation lighting clearly recognizes both the ITO and the spacers.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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【Special Campaign Price】Haleration Microscope

【Special Campaign Price】Haleration Microscope

Easily, quickly, and reliably inspect for dents, scratches, and dirt on surfaces! Achieve outstanding high-definition images!

※ Free distribution of sample evaluation images ※ Using a halation lighting system that utilizes specular reflection, we achieve outstanding high-definition images of cracks, scratches, and dirt on cylindrical objects such as shafts, which are difficult to see with conventional incident lighting. (Comparison images with incident lighting are available) Since a specular reflection image is obtained through external lighting, it is now possible to observe surface protrusions and conduct quality inspections "more easily," "more reliably," and "more quickly" than before. 【Reasons to Choose Us】 ■ Images are obtained without loss due to the specular reflection from external illumination. ■ We adopt a halation lighting system that divides a semicircle (140°) into ten parts. ■ The raised condition of dents, scratches, and dirt on the shaft surface can be confirmed. 【Limited-Time Campaign Benefits】 ■ Free provision of images taken of your work! ■ Special campaign price for a limited time! ■ We can visit for a demonstration if requested. For more details, please download the catalog or contact us. 【Information on Flat Observation and New Halation Three-Eye Tube Stereo Microscope】 ⇒ For more details, please refer to the 'Special Site.'

  • Microscope

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Halation Microscope "PS-100-S6Z90A"

Halation Microscope "PS-100-S6Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left shows a comparative image of dirt on an IC chip captured using the "PS-100-S6Z90A" halation microscope for planar observation (high magnification) with halation lighting and reflected lighting. The image taken with reflected lighting does not capture the dirt, while the image taken with halation lighting clearly shows the dirt.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS..S7Z16R100-2"

Haleration Microscope "PS..S7Z16R100-2"

With its unique lighting effect, it has become possible to observe curved and R surfaces.

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt that are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a reflection image with a small angle can be obtained, it is now possible to observe surface irregularities "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. This is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The image on the left is a comparison captured by the halation microscope "PS-100-S7Z16R100-2" for curved surface observation, showing scratches and mold on the lens surface using both halation and incident lighting. The incident lighting image captures only a small part of the scratches on the lens, while the halation lighting image clearly captures both the scratches and the mold.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope with a maximum field of view of 24×18mm, designed for R illumination curved surface observation, equipped with an illumination controller.

Haleration Microscope "PS-100-S7Z16R100-2M" Wide Field Curved Surface Version, Maximum Field of View 24×18mm for R Lighting Curved Surface Observation (13x to 53x on a 15" monitor, with 11-column lighting selection controller). This is a microscope for curved surface observation that can be observed at a zoom magnification of 0.2 to 1.6 times. The R lighting features a controller that allows for selective illumination of 11 columns, cutting out unnecessary lighting and focusing on "seeing the unseen" for surface observation. It secures a field of view of 24×18mm, enabling wider field observations of scratches, dents on shafts and metal pipes, cracks, and chips in mounted components, and the effective use of lighting further enhances the capabilities of this imaging sensor tool. For more details, please download the catalog.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Compact Low-Cost Digital Camera Scope "DS-100 Series"

Compact Low-Cost Digital Camera Scope "DS-100 Series"

A digital camera-mounted microscope that achieves professional-grade high-definition imaging.

The "DS-100 Series" is a compact, low-cost digital camera scope that makes field inspection tasks and report creation easier and faster. The power source for the lens illumination is battery-operated, allowing it to be used in locations without electrical outlets. Since visual observation can be done with just the lens part, the entire process from observation to photography is smooth, contributing to increased work efficiency. It can be useful in various situations, regardless of industry or department. 【Features】 - Easy to carry portable design - Battery-operated for use in any location - Easily attaches to your existing compact digital camera - Flexible lighting options - Scale display capability *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope
  • Other microscopes

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Haleration Microscope "PS-100-S6Z45C"

Haleration Microscope "PS-100-S6Z45C"

It comes with a height reading dial, allowing for depth measurement as well, making it highly versatile.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image captured using the halation microscope "PS-100-S6Z45C" (medium magnification) for planar observation, showing the ITO of the LCD under halation lighting and incident lighting. The image under incident lighting does not show the ITO, while the image under halation lighting clearly reveals the ITO.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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New product! Halation Microscope

New product! Halation Microscope

"PS-100-S7Z45D" is an image with no loss due to specular reflection from external illumination.

The external illumination captures the specular reflection image. As a result, the color of the workpiece is lost, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The moving image shown below is a comparative image captured with the halation microscope "PS-100-S7Z45D" (medium magnification) for flat observation, using halation lighting and incident lighting on a metal painted surface. The image under incident lighting makes it difficult to capture scratches, while the image under halation lighting does not capture color but clearly reveals the scratches.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Long Arm Autofocus Microscope

Long Arm Autofocus Microscope

The observation device on the machine, of course, features a long arm autofocus microscope with a 45° angled arm, making it convenient for observing large items placed on the floor.

● Beelex series industrial cameras from Matsuden-sha ● Convenient for observing not only items on the desk but also large floor-standing items with the use of a long arm and a 45° angled arm. ● Equipped with a pan-tilt swivel head for observing directly below and to the side. ● Comfortable operation with a "smooth and constant speed" head. ● Ultra-fast autofocus. ● Full HD 2 million pixels! ● Up to 20x magnification.

  • Company：松電舎
  • Price：100,000 yen-500,000 yen
  • Microscope

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LED Microscope / Model Number M109S-SP-01S

LED Microscope / Model Number M109S-SP-01S

Pocket-sized scope that is easy to carry.

● Variable magnification, straight-type scope with LED lighting The variable focal zoom function, which extends the length of the optical tube, allows for magnification changes from 30× to 50× / 70× to 100×. ● Erect image type for easy viewing like a loupe While typical microscopes produce inverted images, this product uses a Dach prism in its optical system, allowing for observation without inversion, providing an erect image. This makes it easy to handle and operate, similar to a loupe. ● Built-in 8-light high-brightness white LED illumination The bright LEDs illuminate the specimen, and the interior of the optical tube has a special anti-reflection treatment, making it gentle on the eyes and providing a clear image.

  • Microscope

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