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Mass spectrometer Product List and Ranking from 17 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Sep 03, 2025~Sep 30, 2025
This ranking is based on the number of page views on our site.

Mass spectrometer Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Sep 03, 2025~Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団 MST Tokyo//Testing, Analysis and Measurement
  2. ブルカージャパン ダルトニクス事業部 微生物同定・菌株識別 Kanagawa//Testing, Analysis and Measurement
  3. ATONARP INC. Tokyo//Electronic Components and Semiconductors
  4. 4 LECOジャパン Tokyo//Testing, Analysis and Measurement
  5. 5 山善 Osaka//Machine elements and parts

Mass spectrometer Product ranking

Last Updated: Aggregation Period:Sep 03, 2025~Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Overview and characteristics of LDI-MS (Laser Desorption Ionization Mass Spectrometry) 一般財団法人材料科学技術振興財団 MST
  2. Rapid Microbial Identification "MALDI Biotyper" ブルカージャパン ダルトニクス事業部 微生物同定・菌株識別
  3. [Analysis Case] Qualitative Analysis of Acrylic Resin 一般財団法人材料科学技術振興財団 MST
  4. Introduction to the Technical Note of the Mass Spectrometry Device ASTON ATONARP INC.
  5. 4 [Analysis Case] TOF-SIMS Analysis of Solder Separation Cross Section 一般財団法人材料科学技術振興財団 MST

Mass spectrometer Product List

16~30 item / All 48 items

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[Information] History of MALDI Biotyper (White Paper)

From materials to microorganisms! A powerful technology that can identify down to the species level has been born.

This document explains the birth of MALDI-TOF MS, the development of the MALDI Biotyper, and the expansion of its applications. It reflects on the history of MALDI-TOF MS, the early role of scientists at Bruker in the manufacturing of commercial MALDI-TOF MS systems, and the impact of the widespread adoption of this technology. We encourage you to read it. 【Contents (partial)】 ■ Introduction ■ The birth of MALDI and the history of its early days ■ Bruker's first commercial MALDI-TOF MS system ■ Early applications of MALDI-TOF MS ■ Improvements in the usability of MALDI-TOF MS systems *For more details, please refer to the PDF document or feel free to contact us.

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[Analysis Case] Observation of Pigment and Dye Dispersion

Micron-order imaging measurement using TOF-SIMS.

We investigated the distribution of the blue pigment "Cu phthalocyanine" dispersed on the polyethylene surface. TOF-SIMS analysis allows us to capture the distribution of organic materials with a pigment size of 1μm.

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[Analysis Case] Contamination Assessment of Si Wafer Bevel Area

It is possible to evaluate both metal components and organic components simultaneously.

In semiconductor device manufacturing, from the perspective of improving yield, it is necessary to enhance the cleanliness of the backside of the wafer and to remove substances that remain on the bevel area of the wafer. In this study, we conducted TOF-SIMS analysis of the bevel inclined surface to evaluate the distribution of contamination (Figure 2). Additionally, by comparing the mass spectra of the adhered substances with those of the normal area and the contamination source, we found that the adhered substances matched the metal (Cr) and organic components of the contamination source. TOF-SIMS can capture the contamination generation process in the bevel area (edge and inclined surface).

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[Analysis Case] Heating Degradation Test of Lithium-Ion Secondary Batteries

Samples after thermal degradation can be evaluated using LC/MS/MS, TOF-SIMS, TEM+EDX, etc.

The development of lithium-ion secondary batteries faces challenges such as improving performance, extending lifespan, and enhancing reliability. To address these challenges, it is important to understand the degradation mechanisms of the batteries. In this study, we conducted a heating degradation test to evaluate the degradation mechanisms caused by temperature. After the heating degradation test, we assessed samples that showed significant capacity reduction using LC/MS/MS for the electrolyte, TOF-SIMS for the anode surface, and FIB-TEM+EDX for the cross-section of the anode.

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[Analysis Case] Evaluation of Silicon (Si) Oxide Film State

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

In depth-direction analysis of molecular information obtained by TOF-SIMS, (1) the depth resolution is good, (2) it is possible to distinguish the chemical states of inorganic materials such as oxides, nitrides, fluorides, carbides, alloys, and metals, (3) evaluation of trace states is possible, (4) monitoring of OH is possible, (5) relative comparisons between samples (film thickness, composition) are possible, and (6) image analysis allows for a visual capture of the distribution of states at the surface level of a few nanometers. We will summarize the results of natural oxide films and oxide films. Measurement method: TOF-SIMS Product field: LSI, memory Analysis purpose: evaluation of chemical bonding states, evaluation of composition distribution, thickness of corrosion layers For more details, please download the materials or contact us.

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[Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

The presence of OH and fluoride on the surface of aluminum electrodes is one of the causes of electrode corrosion, and investigating the state of the aluminum surface is essential for identifying the causes of defects. TOF-SIMS excels in depth resolution at the very surface and can measure depth distribution with high sensitivity while monitoring the state of inorganic substances. By evaluating the depth distribution along with OH, we discovered a phenomenon where OH increased without a change in the thickness of the oxide film. In this way, TOF-SIMS enables the evaluation of depth distribution of molecular information of inorganic substances that cannot be obtained through elemental analysis.

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[Analysis Case] Qualitative Analysis of Acrylic Resin

It is possible to estimate components using TOF-SIMS analysis.

Acrylic resin has superior processability, transmittance, and safety compared to silicate glass, making it widely used as organic glass for windows in aircraft and automobiles, optical instruments such as lenses and prisms, medical materials, daily necessities, and crafts. Mass spectra of representative standard acrylic reagents were obtained using TOF-SIMS. In MST, by comparing the mass spectrum of the analyte with that of the standard reagent, it is possible to estimate the acrylic resin from the detected fragment ions.

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[Analysis Case] Investigation of Contamination Causes on Silicon Wafers

Evaluation of contamination originating from gloves

In semiconductor device manufacturing, it is necessary to investigate what causes thin deposits that lead to defects in order to examine contamination processes. An analysis was conducted using TOF-SIMS on the deposits for which carbon was detected by EDX and quantified by XPS. When compared to the gloves used for standard samples in each process, similar trends were observed with gloves A and B. Furthermore, verification was performed by adhering the standard sample gloves to silicon wafers. As a result, it was found that they were similar to glove A. Adhering standard samples to silicon wafers for verification is an effective method.

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[Analysis Case] Analysis of Additive Components in Polymer Films

Surface and depth distribution evaluation of additives in the film using GCIB.

Food wrap films may use additives to ensure stability against thermal exposure during the manufacturing process and to impart plasticity. These additives are required to remain stable under cooking conditions without changing. In this case, we present the results of an investigation using TOF-SIMS to examine whether the state of one of the additives, Irgafos168, changes (bleeds out) before and after heating. *GCIB: Gas Cluster Ion Beam

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[Analysis Case] Analysis of Discoloration Components in Fibers

It is possible to evaluate the organic and inorganic components on the fiber surface.

TOF-SIMS is a highly effective method for investigating the causes of foreign substances, contamination, and discoloration in various processes, as it allows for localized analysis of specific areas and simultaneous analysis of elemental composition and molecular information of organic and inorganic substances through the obtained mass spectrum. Additionally, it enables image analysis, making the visualization of molecular information of organic substances possible. This document summarizes the analysis results of discoloration in clean suits, which are textile products. From the qualitative results obtained by TOF-SIMS, it was inferred that the discolored areas may be due to sebum.

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[Analysis Case] Qualitative and Imaging Analysis of Micro Areas Using TOF-SIMS

Qualitative and imaging analysis of foreign substances in the sub-micrometer order and micro-regions is possible.

TOF-SIMS allows for simultaneous elemental analysis and molecular information analysis of organic and inorganic substances through mass spectra obtained by locally analyzing specific areas, making it effective for evaluating foreign substances and micro-regions. This document summarizes examples of analysis in sub-micron order micro-regions. Samples that were sputter-processed with FIB on layered structures were measured using TOF-SIMS. Evaluation of sub-micron order micro-regions has been achieved.

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[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Three-Dimensional Cultured Human Skin

Visualization of the distribution of active ingredients applied to cultured skin using TOF-SIMS.

TOF-SIMS identifies components from the mass of molecular ions, eliminating the need for labels such as fluorescent substances, allowing for imaging without their influence. Additionally, cross-sectional imaging enables the evaluation of distribution in the depth direction. In this study, a gel formulation of indomethacin was applied to three-dimensional cultured human skin, visualizing the distribution of the permeated active ingredient. As a result, it was found that indomethacin is concentrated on the surface side of the stratum corneum. Furthermore, depth profile analysis observed a gradual penetration towards the cell layers.

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[Analysis Case] Evaluation of Material Structure of Organic EL (OLED)

It is possible to identify components for each layer, pixel by pixel.

To improve the reliability of organic EL, which is expected to expand in demand in the future, detailed structural analysis, state analysis, and identification of degradation causes will become increasingly important. We will introduce examples of evaluating layer structures and materials using TOF-SIMS and LC/MS. With TOF-SIMS, we were able to evaluate the layer structure and the component information of each layer. We conducted analyses of the components revealed by TOF-SIMS using LC/MS and a fluorescence detector, allowing us to assess the emission wavelength and understand the structure of the components. Thus, the combination of TOF-SIMS and LC/MS enables detailed evaluations.

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[Analysis Case] Transdermal Absorption Evaluation Using Three-Dimensional Cultured Human Skin

Distribution evaluation and quantitative analysis of the same sample are possible.

In recent years, the development of alternative methods to animal testing has progressed in the efficacy and safety testing of pharmaceuticals and cosmetics, with particular attention being paid to testing methods using three-dimensional cultured human skin. In this case study, a permeation test of indomethacin was conducted using a Franz cell, and TOF-SIMS and LC/MS/MS measurements were performed on the same skin sample. LC/MS/MS was used to quantify skin concentration and skin permeation, while TOF-SIMS was used to evaluate the component distribution within the skin. Measurement methods: TOF-SIMS, LC/MS, cryo-processing, cutting Product fields: Biotechnology, pharmaceuticals, cosmetics Analysis objectives: Composition distribution evaluation, safety testing For more details, please download the materials or contact us.

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Mass array method: A gene analysis method using mass spectrometry.

Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.

In this method, the differences in the mass of bases are analyzed using MALDI-TOF-MS to determine the DNA base sequence. This allows for the detection of SNPs (single nucleotide polymorphisms), INDELs (insertions/deletions), CNVs (copy number variations), and more. It is characterized by the ability to analyze a large number of samples and detect a wide range of genes at once. - Multiplex PCR and MALDI-TOF-MS enable simultaneous analysis of up to 40 mutation sites. - Mass spectrometry specialized for the detection of bases (A/T/G/C) is possible. - A variety of analytical tools are available that have been pre-designed to detect target genes based on specific purposes. - Custom designs for analytical tools are also possible.

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